Steve LaLumondiere
TitleCited byYear
Electrical and optical characterization of surface passivation in GaAs nanowires
CC Chang, CY Chi, M Yao, N Huang, CC Chen, J Theiss, AW Bushmaker, ...
Nano letters 12 (9), 4484-4489, 2012
1802012
Observation of single event upsets in analog microcircuits
R Koga, SD Pinkerton, SC Moss, DC Mayer, S LaLumondiere, SJ Hansel, ...
IEEE transactions on nuclear science 40 (6), 1838-1844, 1993
1411993
Observation of single event upsets in analog microcircuits
R Koga, SD Pinkerton, SC Moss, DC Mayer, S LaLumondiere, SJ Hansel, ...
IEEE transactions on nuclear science 40 (6), 1838-1844, 1993
1411993
Correlation of picosecond laser-induced latchup and energetic particle-induced latchup in CMOS test structures
SC Moss, SD LaLumondiere, JR Scarpulla, KP MacWilliams, WR Crain, ...
IEEE Transactions on Nuclear Science 42 (6), 1948-1956, 1995
961995
Single event upset (SEU) sensitivity dependence of linear integrated circuits (ICs) on bias conditions
R Koga, SH Penzin, KB Crawford, WR Crain, SC Moss, SD Pinkerton, ...
IEEE Transactions on Nuclear Science 44 (6), 2325-2332, 1997
821997
Comparison of SETs in bipolar linear circuits generated with an ion microbeam, laser light, and circuit simulation
RL Pease, AL Sternberg, Y Boulghassoul, LW Massengill, S Buchner, ...
IEEE Transactions on Nuclear Science 49 (6), 3163-3170, 2002
682002
SEU-hardened storage cell validation using a pulsed laser
R Velazco, T Calin, M Nicolaidis, SC Moss, SD LaLumondiere, VT Tran, ...
IEEE Transactions on Nuclear Science 43 (6), 2843-2848, 1996
651996
Laser-induced and heavy ion-induced single-event transient (SET) sensitivity measurements on 139-type comparators
SD LaLumondiere, R Koga, P Yu, MC Maher, SC Moss
IEEE Transactions on Nuclear Science 49 (6), 3121-3128, 2002
352002
Single event transient (SET) sensitivity of radiation hardened and COTS voltage comparators
R Koga, SH Crain, KB Crawford, SC Moss, SD LaLumondiere, ...
2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in …, 2000
352000
Narrow band gap (1 eV) InGaAsSbN solar cells grown by metalorganic vapor phase epitaxy
TW Kim, TJ Garrod, K Kim, JJ Lee, SD LaLumondiere, Y Sin, WT Lotshaw, ...
Applied Physics Letters 100 (12), 121120, 2012
312012
Catastrophic latchup in CMOS analog-to-digital converters
TF Miyahira, AH Johnston, HN Becker, SD LaLumondiere, SC Moss
IEEE Transactions on Nuclear Science 48 (6), 1833-1840, 2001
312001
A TID and SEE radiation-hardened, wideband, low-noise amplifier
B Mossawir, IR Linscott, US Inan, JL Roeder, JV Osborn, SC Witczak, ...
IEEE transactions on nuclear science 53 (6), 3439-3448, 2006
222006
LEO to ground optical communications from a small satellite platform
TS Rose, SW Janson, S LaLumondiere, N Werner, DH Hinkley, ...
Free-Space Laser Communication and Atmospheric Propagation XXVII 9354, 93540I, 2015
212015
Topology-related upset mechanisms in design hardened storage cells
T Calin, R Velazco, M Nicolaidis, S Moss, SD LaLumondiere, VT Tran, ...
RADECS 97. Fourth European Conference on Radiation and its Effects on …, 1997
201997
Single event latchup characteristics of three commercial CMOS processes
JV Osborn, DC Mayer, RC Lacoe, SC Moss, SD La Lumondiere
Proceedings of 7th NASA Symp. on VLSI design, 1998
191998
Physics of failure investigation in high-power broad-area InGaAs-AlGaAs strained quantum well lasers
Y Sin, SD LaLumondiere, N Presser, BJ Foran, NA Ives, WT Lotshaw, ...
High-Power Diode Laser Technology and Applications X 8241, 824116, 2012
182012
Catastrophic optical bulk damage (COBD) in high power multi-mode InGaAs-AlGaAs strained quantum well lasers
Y Sin, N Ives, S LaLumondiere, N Presser, SC Moss
High-Power Diode Laser Technology and Applications IX 7918, 791803, 2011
172011
Impact of thermal annealing on bulk InGaAsSbN materials grown by metalorganic vapor phase epitaxy
TW Kim, K Kim, JJ Lee, TF Kuech, LJ Mawst, NP Wells, SD LaLumondiere, ...
Applied Physics Letters 104 (5), 051915, 2014
152014
Properties of ‘bulk’GaAsSbN/GaAs for multi-junction solar cell application: Reduction of carbon background concentration
TW Kim, K Forghani, LJ Mawst, TF Kuech, SD LaLumondiere, Y Sin, ...
Journal of Crystal Growth 393, 70-74, 2014
142014
Single event transients induced by picosecond pulsed X-ray absorption in III–V heterojunction transistors
DM Cardoza, SD LaLumondiere, MA Tockstein, SC Witczak, Y Sin, ...
IEEE Transactions on Nuclear Science 59 (6), 2729-2738, 2012
142012
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Articles 1–20