Multi-patch collaborative point cloud denoising via low-rank recovery with graph constraint H Chen, M Wei, Y Sun, X Xie, J Wang IEEE transactions on visualization and computer graphics 26 (11), 3255-3270, 2019 | 59 | 2019 |
GPF: GMM-inspired feature-preserving point set filtering X Lu, S Wu, H Chen, SK Yeung, W Chen, M Zwicker IEEE transactions on visualization and computer graphics 24 (8), 2315-2326, 2017 | 59 | 2017 |
RePCD-Net: Feature-aware Recurrent Point Cloud Denoising Network H Chen, Z Wei, X Li, Y Xu, M Wei, J Wang International Journal of Computer Vision, 2021 | 34 | 2021 |
Structure-guided shape-preserving mesh texture smoothing via joint low-rank matrix recovery H Chen, J Huang, O Remil, H Xie, J Qin, Y Guo, M Wei, J Wang Computer-Aided Design 115, 122-134, 2019 | 30 | 2019 |
Geometry and learning co-supported normal estimation for unstructured point cloud H Zhou, H Chen, Y Feng, Q Wang, J Qin, H Xie, FL Wang, M Wei, J Wang Proceedings of the ieee/cvf conference on computer vision and pattern …, 2020 | 29 | 2020 |
Refine-Net: Normal Refinement Neural Network for Noisy Point Clouds H Zhou, H Chen, Y Zhang, M Wei, H Xie, J Wang, T Lu, J Qin, X Zhang IEEE Transactions on Pattern Analysis and Machine Intelligence, 2022 | 26 | 2022 |
Aircraft Skin Rivet Detection Based on 3D Point Cloud via Multiple Structures Fitting Q Xie, D Lu, K Du, J Xu, J Dai, H Chen, J Wang Computer-Aided Design 120, 102805, 2020 | 24 | 2020 |
Unsupervised articulated skeleton extraction from point set sequences captured by a single depth camera X Lu, H Chen, SK Yeung, Z Deng, W Chen Proceedings of the AAAI Conference on Artificial Intelligence 32 (1), 2018 | 22 | 2018 |
Part-in-whole point cloud registration for aircraft partial scan automated localization Q Xie, Y Zhang, X Cao, Y Xu, D Lu, HH Chen, J Wang Computer-Aided Design 137, 103042, 2021 | 18 | 2021 |
Imlovenet: Misaligned image-supported registration network for low-overlap point cloud pairs H Chen, Z Wei, Y Xu, M Wei, J Wang ACM SIGGRAPH 2022 conference proceedings, 1-9, 2022 | 16 | 2022 |
Csdn: Cross-modal shape-transfer dual-refinement network for point cloud completion Z Zhu, L Nan, H Xie, H Chen, J Wang, M Wei, J Qin IEEE Transactions on Visualization and Computer Graphics, 2023 | 14 | 2023 |
GeoDualCNN: Geometry-supporting Dual Convolutional Neural Network for Noisy Point Clouds M Wei, H Chen, Y Zhang, H Xie, Y Guo, J Wang IEEE transactions on visualization and computer graphics, 2021 | 12 | 2021 |
Non-local Low-rank Point Cloud Denoising for 3D Measurement Surfaces D Zhu, H Chen, W Wang, H Xie, G Cheng, M Wei, J Wang, FL Wang IEEE Transactions on Instrumentation & Measurement, 2021 | 11 | 2021 |
Multi-scale Feature Line Extraction from Raw Point Clouds Based on Local Surface Variation and Anisotropic Contraction H Chen, Y Huang, Q Xie, Y Liu, Y Zhang, M Wei, J Wang IEEE Transactions on Automation Science and Engineering, 2021 | 11 | 2021 |
UTOPIC: Uncertainty‐aware Overlap Prediction Network for Partial Point Cloud Registration Z Chen, H Chen, L Gong, X Yan, J Wang, Y Guo, J Qin, M Wei Computer Graphics Forum 41 (7), 87-98, 2022 | 10 | 2022 |
Selective guidance normal filter for geometric texture removal M Wei, Y Feng, H Chen IEEE Transactions on Visualization and Computer Graphics 27 (12), 4469-4482, 2020 | 8 | 2020 |
Deep learning for scene flow estimation on point clouds: a survey and prospective trends Z Li, N Xiang, H Chen, J Zhang, X Yang Computer Graphics Forum 42 (6), e14795, 2023 | 5 | 2023 |
GeoSegNet: point cloud semantic segmentation via geometric encoder–decoder modeling C Chen, Y Wang, H Chen, X Yan, D Ren, Y Guo, H Xie, FL Wang, M Wei The Visual Computer, 1-15, 2023 | 5 | 2023 |
Svdformer: Complementing point cloud via self-view augmentation and self-structure dual-generator Z Zhu, H Chen, X He, W Wang, J Qin, M Wei Proceedings of the IEEE/CVF International Conference on Computer Vision …, 2023 | 5 | 2023 |
Combined measurement based wing-fuselage assembly coordination via multiconstraint optimization Y Wang, Y Liu, H Chen, Q Xie, K Zhang, J Wang IEEE Transactions on Instrumentation and Measurement 71, 1-16, 2022 | 5 | 2022 |