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Xavier Saura
Xavier Saura
PhD in Electronics Engineering, Universitat Autonoma de Barcelona
Verified email at uab.cat
Title
Cited by
Cited by
Year
Initial leakage current related to extrinsic breakdown in HfO 2/Al 2 O 3 nanolaminate ALD dielectrics
C Martínez-Domingo, X Saura, A Conde, D Jiménez, E Miranda, JM Rafí, ...
Microelectronic Engineering 88 (7), 1380-1383, 2011
212011
Threshold switching and conductance quantization in Al/HfO2/Si (p) structures
X Saura, E Miranda, D Jimenez, S Long, M Liu, JM Rafi, F Campabadal, ...
Japanese Journal of Applied Physics 52 (4S), 04CD06, 2013
202013
Modeling the breakdown statistics of Al< inf> 2</inf> O< inf> 3</inf>/HfO< inf> 2</inf> nanolaminates grown by atomic-layer-deposition
A Conde, C Martinez, X Saura, D Jimenez, E Miranda, JM Rafi, ...
Ultimate Integration on Silicon (ULIS), 2011 12th International Conference …, 2011
19*2011
Many-particle transport in the channel of quantum wire double-gate field-effect transistors with charged atomistic impurities
G Albareda, X Saura, X Oriols, J Suné
Journal of Applied Physics 108 (4), 043706, 2010
122010
Analysis of the breakdown spot spatial distribution in Pt/HfO2/Pt capacitors using nearest neighbor statistics
X Saura, J Suñé, S Monaghan, PK Hurley, E Miranda
Journal of Applied Physics 114 (15), 154112, 2013
92013
Failure Analysis of MIM and MIS Structures Using Point-to-Event Distance and Angular Probability Distributions
X Saura, S Monaghan, PK Hurley, J Suñé, E Miranda
Device and Materials Reliability, IEEE Transactions on 14 (4), 1080-1090, 2014
52014
Field-effect control of breakdown paths in HfO2 based MIM structures
X Saura, X Lian, D Jiménez, E Miranda, X Borrisé, F Campabadal, J Suñé
Microelectronics Reliability 53 (9), 1346-1350, 2013
32013
Direct observation of the generation of breakdown spots in MIM structures under constant voltage stress
X Saura, D Moix, J Suñé, PK Hurley, E Miranda
Microelectronics Reliability 53 (9-11), 1257-1260, 2013
32013
Filamentos conductores de ruptura dieléctrica en aislantes delgados
X Saura, E Miranda, J Suñé
Universitat Autònoma de Barcelona,, 2015
12015
Study on the spatial generation of breakdown spots in MIM capacitors with different aspect ratios
X Saura, M Riccio, J Suñé, A Irace, E Miranda
Facta universitatis-series: Electronics and Energetics 28 (2), 177-192, 2015
12015
Exploring the field-effect control of breakdown paths in lateral W/HfO2/W structures
X Saura, X Lian, D Jimenez, E Miranda, X Borrisé, X Borrisé, JM Rafí, ...
2013
Threshold switching and conductance quantization in electroformed Al/HfO2/Si (p) structures
J Suñé, E Miranda, D Jiménez, C Martínez-Domingo, X Saura, S Long, ...
Japanese Journal of Applied Physics, 2012
2012
Spin polarized transport in semiconductors–Challenges for...
WDGMIN PRESENCE, G Albareda, X Saura, X Oriols, R Rurali, J Suñé
MONTE CARLO MODELLING OF ELECTRON TRANSPORT IN SI QUANTUM-WIRE DOUBLE-GATE MOSFETs IN PRESENCE OF ATOMISTIC IMPURITIES
G Albareda, X Saura, X Oriols, R Rurali, J Suñé
Threshold switching in MOS structures with HfO2
X Saura, J Suñé, E Miranda, D Jiménez, C Martínez-Domingo, S Long, ...
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