| A flexoelectric microelectromechanical system on silicon UK Bhaskar, N Banerjee, A Abdollahi, Z Wang, DG Schlom, G Rijnders, ... Nature nanotechnology 11 (3), 263-266, 2016 | 316 | 2016 |
| Flexoelectric MEMS: towards an electromechanical strain diode UK Bhaskar, N Banerjee, A Abdollahi, E Solanas, G Rijnders, G Catalan Nanoscale 8 (3), 1293-1298, 2016 | 66 | 2016 |
| On-chip tensile testing of nanoscale silicon free-standing beams U Bhaskar, V Passi, S Houri, E Escobedo-Cousin, SH Olsen, T Pardoen, ... J. Mater. Res. 27, 571, 2012 | 45 | 2012 |
| High-throughput on-chip large deformation of silicon nanoribbons and nanowires V Passi, U Bhaskar, T Pardoen, U Sodervall, B Nilsson, G Petersson, ... Journal of microelectromechanical systems 21 (4), 822-829, 2012 | 31 | 2012 |
| Proton-doped strongly correlated perovskite nickelate memory devices K Ramadoss, F Zuo, Y Sun, Z Zhang, J Lin, U Bhaskar, S Shin, MA Alam, ... IEEE Electron Device Letters 39 (10), 1500-1503, 2018 | 29 | 2018 |
| Piezoresistance of nano-scale silicon up to 2 GPa in tension U Kumar Bhaskar, T Pardoen, V Passi, JP Raskin Applied Physics Letters 102 (3), 2013 | 28 | 2013 |
| Strain in silicon nanowire beams F Ureña, SH Olsen, L Šiller, U Bhaskar, T Pardoen, JP Raskin Journal of Applied Physics 112 (11), 2012 | 27 | 2012 |
| Electrical spectroscopy of forward volume spin waves in perpendicularly magnetized materials M Sushruth, M Grassi, K Ait-Oukaci, D Stoeffler, Y Henry, D Lacour, ... Physical Review Research 2 (4), 043203, 2020 | 22 | 2020 |
| Backward volume vs Damon–Eshbach: A traveling spin wave spectroscopy comparison UK Bhaskar, G Talmelli, F Ciubotaru, C Adelmann, T Devolder Journal of Applied Physics 127 (3), 2020 | 21 | 2020 |
| Silicon acoustoelectronics with thin film lithium niobate UK Bhaskar, SA Bhave, D Weinstein Journal of Physics D: Applied Physics 52 (5), 05LT01, 2018 | 17 | 2018 |
| Surface states and conductivity of silicon nano-wires U Kumar Bhaskar, T Pardoen, V Passi, JP Raskin Journal of Applied Physics 113 (13), 2013 | 17 | 2013 |
| A versatile lab-on-chip test platform to characterize elementary deformation mechanisms and electromechanical couplings in nanoscopic objects T Pardoen, MS Colla, H Idrissi, B Amin-Ahmadi, B Wang, D Schryvers, ... Comptes Rendus. Physique 17 (3-4), 485-495, 2016 | 16 | 2016 |
| Experimental observations of surface roughness in uniaxially loaded strained Si microelectromechanical systems-based structures E Escobedo-Cousin, SH Olsen, T Pardoen, U Bhaskar, JP Raskin Applied Physics Letters 99 (24), 2011 | 10 | 2011 |
| Note: Fast and reliable fracture strain extraction technique applied to silicon at nanometer scale V Passi, U Bhaskar, T Pardoen, U Sodervall, B Nilsson, G Petersson, ... Review of Scientific Instruments 82 (11), 2011 | 10 | 2011 |
| Dynamic analysis of multi-beam MEMS structures for the extraction of the stress-strain response of thin films S Houri, U Bhaskar, B Gallacher, L Francis, T Pardoen, JP Raskin Experimental Mechanics 53, 441-453, 2013 | 8 | 2013 |
| BPZT HBARs for magnetoelastic stress generation at GHz frequencies UK Bhaskar, D Tierno, G Talmelli, F Ciubotaru, C Adelmann, T Devolder IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control 67 …, 2020 | 5 | 2020 |
| Raman analysis of strain in p-type doped silicon nanostructures F Ureña-Begara, R Vayrette, UK Bhaskar, JP Raskin Journal of Applied Physics 124 (9), 2018 | 4 | 2018 |
| On-chip tensile testing of the mechanical and electro-mechanical properties of nano-scale silicon free-standing beams U Bhaskar, V Passi, A Zulfiqar, U Södervall, B Nilsson, G Petersson, ... Advanced Materials Research 276, 117-126, 2011 | 3 | 2011 |
| Nanomechanical testing of free-standing monocrystalline silicon beams UK Bhaskar, S Houri, V Passi, T Pardoen, JP Raskin ECS Transactions 35 (5), 221, 2011 | 3 | 2011 |
| Neutron and gamma radiation effects on MEMS structures P Gkotsis, V Kilchytska, U Bhaskar, O Militaru, X Tang, C Fragkiadakis, ... Procedia Engineering 25, 172-175, 2011 | 3 | 2011 |
