| Electrothermal design procedure to observe RF circuit power and linearity characteristics with a homodyne differential temperature sensor M Onabajo, J Altet, E Aldrete-Vidrio, D Mateo, J Silva-Martinez IEEE Transactions on Circuits and Systems I: Regular Papers 58 (3), 458-469, 2010 | 43 | 2010 |
| A versatile CMOS transistor array IC for the statistical characterization of time-zero variability, RTN, BTI, and HCI J Diaz-Fortuny, J Martin-Martinez, R Rodriguez, R Castro-Lopez, E Roca, ... IEEE Journal of Solid-State Circuits 54 (2), 476-488, 2018 | 38 | 2018 |
| Strategies for built-in characterization testing and performance monitoring of analog RF circuits with temperature measurements E Aldrete-Vidrio, D Mateo, J Altet, MA Salhi, S Grauby, S Dilhaire, ... Measurement Science and Technology 21 (7), 075104, 2010 | 34 | 2010 |
| A built-in quiescent current monitor for CMOS VLSI circuits A Rubio, E Janssens, H Casier, J Figueras, D Mateo, P De Pauw, ... Proceedings the European Design and Test Conference. ED&TC 1995, 581-585, 1995 | 34 | 1995 |
| Differential Temperature Sensors Fully Compatible With a 0.35-m CMOS Process E Aldrete-Vidrio, D Mateo, J Altet IEEE Transactions on Components and Packaging Technologies 30 (4), 618-626, 2007 | 31 | 2007 |
| Design and implementation of a 5/spl times/5 trits multiplier in a quasi-adiabatic ternary CMOS logic D Mateo, A Rubio IEEE Journal of Solid-State Circuits 33 (7), 1111-1116, 1998 | 30 | 1998 |
| Built-in dynamic current sensor circuit for digital VLSI CMOS testing J Segura, M Roca, D Mateo, A Rubio electronics Letters 30 (20), 1668-1669, 1994 | 30 | 1994 |
| Modelling and evaluation of substrate noise induced by interconnects F Martorell, D Mateo, X Aragonès IEE Proceedings-Computers and Digital Techniques 150 (5), 338-345, 2003 | 28 | 2003 |
| Low noise amplifiers for low-power impulse radio ultra-wideband receivers JLG Jimenez, DM Pena, EB Ojeda, I Cairo, M Ikeda US Patent 7,679,436, 2010 | 26 | 2010 |
| An approach to dynamic power consumption current testing of CMOS ICs JA Segura, M Roca, D Mateo, A Rubio Proceedings 13th IEEE VLSI Test Symposium, 95-100, 1995 | 26 | 1995 |
| Efficiency determination of RF linear power amplifiers by steady-state temperature monitoring using built-in sensors J Altet, D Gomez, X Perpinyà, D Mateo, JL González, M Vellvehi, X Jordà Sensors and Actuators A: Physical 192, 49-57, 2013 | 23 | 2013 |
| A heterodyne method for the thermal observation of the electrical behavior of high-frequency integrated circuits J Altet, E Aldrete-Vidrio, D Mateo, X Perpiñà, X Jordà, M Vellvehi, J Millán, ... Measurement Science and Technology 19 (11), 115704, 2008 | 22 | 2008 |
| Phase noise degradation of LC-tank VCOs due to substrate noise and package coupling MA Méndez, D Mateo, X Aragonès, JL González Proceedings of the 31st European Solid-State Circuits Conference, 2005 …, 2005 | 21 | 2005 |
| MOSFET degradation dependence on input signal power in a RF power amplifier A Crespo-Yepes, E Barajas, J Martin-Martinez, D Mateo, X Aragones, ... Microelectronic Engineering 178, 289-292, 2017 | 20 | 2017 |
| Analytical and experimental verification of substrate noise spectrum for mixed-signal ICs MA Mendez, D Mateo, A Rubio, JL González IEEE Transactions on Circuits and Systems I: Regular Papers 53 (8), 1803-1815, 2006 | 20 | 2006 |
| Quasi-adiabatic ternary CMOS logic D Mateo, A Rubio Electronics Letters 32 (2), 99-101, 1996 | 20 | 1996 |
| DC temperature measurements for power gain monitoring in RF power amplifiers J Altet, D Mateo, D Gómez, X Perpiñà, M Vellvehi, X Jordà 2012 IEEE International Test Conference, 1-8, 2012 | 18 | 2012 |
| Electro-thermal coupling analysis methodology for RF circuits D Gómez, C Dufis, J Altet, D Mateo, JL González Microelectronics Journal 43 (9), 633-641, 2012 | 18 | 2012 |
| Survey of robustness enhancement techniques for wireless systems-on-a-chip and study of temperature as observable for process variations M Onabajo, D Gómez, E Aldrete-Vidrio, J Altet, D Mateo, J Silva-Martinez Journal of Electronic Testing 27, 225-240, 2011 | 17 | 2011 |
| Temperature sensors to measure the central frequency and 3 dB bandwidth in mmW power amplifiers J Altet, D Mateo, D Gómez, JLG Jiménez, B Martineau, A Siligaris, ... IEEE microwave and wireless components letters 24 (4), 272-274, 2014 | 15 | 2014 |
