Efficient selection of signatures for analog/RF alternate test MJ Barragan, G Leger 2013 18th IEEE European Test Symposium (ETS), 1-6, 2013 | 48 | 2013 |
IC testing methods and apparatus A Zjajo, MJB Asian, JJP De Gyvez US Patent 8,310,265, 2012 | 45 | 2012 |
Alternate test of LNAs through ensemble learning of on-chip digital envelope signatures MJ Barragán, R Fiorelli, G Leger, A Rueda, JL Huertas Journal of Electronic Testing 27, 277-288, 2011 | 44 | 2011 |
A procedure for alternate test feature design and selection MJ Barragan, G Leger IEEE Design & Test 32 (1), 18-25, 2014 | 38 | 2014 |
BIST method for die-level process parameter variation monitoring in analog/mixed-signal integrated circuits A Zjajo, MJB Asian, JP de Gyvez 2007 Design, Automation & Test in Europe Conference & Exhibition, 1-6, 2007 | 38 | 2007 |
On-chip sinusoidal signal generation with harmonic cancelation for analog and mixed-signal BIST applications MJ Barragan, G Leger, D Vazquez, A Rueda Analog Integrated Circuits and Signal Processing 82, 67-79, 2015 | 36 | 2015 |
A Fully-Digital BIST Wrapper Based on Ternary Test Stimuli for the Dynamic Test of a 40 nm CMOS 18-bit Stereo Audio ADC MJ Barragan, R Alhakim, HG Stratigopoulos, M Dubois, S Mir, H Le Gall, ... IEEE Transactions on Circuits and Systems I: Regular Papers 63 (11), 1876-1888, 2016 | 28 | 2016 |
Design of a 77-GHz LC-VCO With a Slow-Wave Coplanar Stripline-Based Inductor E Sharma, AA Saadi, M Margalef-Rovira, E Pistono, MJ Barragan, ... IEEE Transactions on Circuits and Systems I: Regular Papers 67 (2), 378-388, 2019 | 24 | 2019 |
A 65nm CMOS ramp generator design and its application towards a BIST implementation of the reduced-code static linearity test technique for pipeline ADCs G Renaud, MJ Barragan, A Laraba, HG Stratigopoulos, S Mir, H Le-Gall, ... Journal of Electronic Testing 32, 407-421, 2016 | 23 | 2016 |
Practical simulation flow for evaluating analog/mixed-signal test techniques MJ Barragan, HG Stratigopoulos, S Mir, H Le-Gall, N Bhargava, A Bal IEEE Design & Test 33 (6), 46-54, 2016 | 23 | 2016 |
Improving the accuracy of RF alternate test using multi-VDD conditions: application to envelope-based test of LNAs MJ Barragan, R Fiorelli, G Leger, A Rueda, JL Huertas 2011 Asian Test Symposium, 359-364, 2011 | 23 | 2011 |
Brownian distance correlation-directed search: A fast feature selection technique for alternate test G Leger, MJ Barragan Integration 55, 401-414, 2016 | 22 | 2016 |
Design trade-offs for on-chip driving of high-speed high-performance ADCs in static BIST applications AJ Gines, E Peralias, G Leger, A Rueda, G Renaud, MJ Barragan, S Mir 2016 IEEE 21st International Mixed-Signal Testing Workshop (IMSTW), 1-6, 2016 | 21 | 2016 |
On-chip analog sinewave generator with reduced circuitry resources MJ Barragan, D Vazquez, A Rueda, JL Huertas 2006 49th IEEE International Midwest Symposium on Circuits and Systems 2 …, 2006 | 21 | 2006 |
Analog sinewave signal generators for mixed-signal built-in test applications MJ Barragán, D Vázquez, A Rueda Journal of Electronic Testing 27, 305-320, 2011 | 20 | 2011 |
On-chip characterisation of RF systems based on envelope response analysis MJ Barragán, R Fiorelli, D Vázquez, A Rueda, JL Huertas Electronics Letters 46 (1), 36-38, 2010 | 20 | 2010 |
Design of mm-wave slow-wave-coupled coplanar waveguides M Margalef-Rovira, J Lugo-Alvarez, A Bautista, L Vincent, S Lepilliet, ... IEEE Transactions on Microwave Theory and Techniques 68 (12), 5014-5028, 2020 | 18 | 2020 |
Fully differential 4-V output range 14.5-ENOB stepwise ramp stimulus generator for on-chip static linearity test of ADCs G Renaud, M Diallo, MJ Barragan, S Mir IEEE Transactions on Very Large Scale Integration (VLSI) Systems 27 (2), 281-293, 2018 | 18 | 2018 |
Mostly-digital design of sinusoidal signal generators for mixed-signal BIST applications using harmonic cancellation H Malloug, MJ Barragan, S Mir, E Simeu, H Le-Gall 2016 IEEE 21st International Mixed-Signal Testing Workshop (IMSTW), 1-6, 2016 | 17 | 2016 |
Sine-wave signal characterization using square-wave and ΣΔ-modulation: application to mixed-signal BIST D Vázquez, G Huertas, Á Luque, MJ Barragán, G Leger, A Rueda, ... Journal of Electronic Testing 21, 221-232, 2005 | 17 | 2005 |