| Stereo-digital image correlation (DIC) measurements with a single camera using a biprism K Genovese, L Casaletto, JA Rayas, V Flores, A Martinez Optics and Lasers in Engineering 51 (3), 278-285, 2013 | 130 | 2013 |
| Self-healing property of a caustic optical beam M Anguiano-Morales, A Martínez, MD Iturbe-Castillo, S Chávez-Cerda, ... Applied optics 46 (34), 8284-8290, 2007 | 90 | 2007 |
| Three-dimensional deformation measurement from the combination of in-plane and out-of-plane electronic speckle pattern interferometers A Martínez, JA Rayas, R Rodríguez-Vera, HJ Puga Applied optics 43 (24), 4652-4658, 2004 | 68 | 2004 |
| Correction masks for thickness uniformity in large-area thin films F Villa, A Martinez, LE Regalado Applied optics 39 (10), 1602-1610, 2000 | 64 | 2000 |
| Uncertainty analysis of temporal phase-stepping algorithms for interferometry RR Cordero, J Molimard, A Martínez, F Labbe Optics Communications 275 (1), 144-155, 2007 | 48 | 2007 |
| Medición del módulo de Young en el hule látex usando ESPI JA Rayas, R Rodríguez-Vera, A Martínez Revista mexicana de física 49 (6), 555-564, 2003 | 45 | 2003 |
| The condensation of furfural with urea A Martínez-García, M Ortiz, R Martínez, P Ortiz, E Reguera Industrial Crops and Products 19 (2), 99-106, 2004 | 41 | 2004 |
| Different field distributions obtained with an axicon and an amplitude mask M Anguiano-Morales, A Martínez, MD Iturbe-Castillo, S Chávez-Cerda Optics Communications 281 (3), 401-407, 2008 | 40 | 2008 |
| 4D profile of phase objects through the use of a simultaneous phase shifting quasi-common path interferometer NI Toto-Arellano, DI Serrano-García, AM García, GR Zurita, ... Journal of Optics 13 (11), 115502, 2011 | 39 | 2011 |
| Iterative estimation of the topography measurement by fringe-projection method with divergent illumination by considering the pitch variation along the x and z directions A Martínez, JA Rayas, HJ Puga, K Genovese Optics and lasers in engineering 48 (9), 877-881, 2010 | 39 | 2010 |
| Slope measurement of a phase object using a polarizing phase-shifting high-frequency Ronchi grating interferometer NI Toto-Arellano, A Martínez-García, G Rodríguez-Zurita, ... Applied optics 49 (33), 6402-6408, 2010 | 37 | 2010 |
| Fracture detection by grating moiré and in-plane ESPI techniques A Martı́nez, R Rodrı́guez-Vera, JA Rayas, HJ Puga Optics and Lasers in Engineering 39 (5-6), 525-536, 2003 | 37 | 2003 |
| Low energy theorem and photodisintegration of light nuclei J Govaerts, JL Lucio, A Martinez, J Pestieau Nuclear Physics A 368 (3), 409-428, 1981 | 34 | 1981 |
| Measurement of mean thickness of transparent samples using simultaneous phase shifting interferometry with four interferograms VHF Muñoz, NIT Arellano, DIS García, AM García, GR Zurita, LG Lechuga Applied Optics 55 (15), 4047-4051, 2016 | 33 | 2016 |
| Coherent scattering by one-dimensional randomly rough metallic surfaces EI Chaikina, AG Navarrete, ER Méndez, A Martínez, AA Maradudin Applied optics 37 (6), 1110-1121, 1998 | 32 | 1998 |
| Parallel two-step phase shifting interferometry using a double cyclic shear interferometer NI Toto-Arellano, DI Serrano-García, A Martínez-García Optics express 21 (26), 31983-31989, 2013 | 30 | 2013 |
| General model to predict and correct errors in phase map interpretation and measurement for out-of-plane ESPI interferometers HJ Puga, R Rodrıguez-Vera, A Martınez Optics & Laser Technology 34 (1), 81-92, 2002 | 30 | 2002 |
| Measuring displacement derivatives by electronic speckle pattern shearing interferometry (ESPSI) F Labbe, RR Cordero, A Martínez, R Rodríguez-Vera Measurement Science and Technology 16 (8), 1677, 2005 | 28 | 2005 |
| Uncertainty evaluation of displacements measured by electronic speckle-pattern interferometry RR Cordero, A Martı́nez, R Rodrı́guez-Vera, P Roth Optics Communications 241 (4-6), 279-292, 2004 | 27 | 2004 |
| Full-surface deformation measurement of anisotropic tissues under indentation K Genovese, A Montes, A Martinez, SL Evans Medical engineering & physics 37 (5), 484-493, 2015 | 26 | 2015 |
Juan Antonio RayasCentro de Investigaciones en ÓpticaVerified email at cio.mx
