A comprehensive study of short-circuit ruggedness of silicon carbide power MOSFETs G Romano, A Fayyaz, M Riccio, L Maresca, G Breglio, A Castellazzi, ...
IEEE Journal of Emerging and Selected Topics in Power Electronics 4 (3), 978-987, 2016
241 2016 Short-circuit failure mechanism of SiC power MOSFETs G Romano, L Maresca, M Riccio, V d'Alessandro, G Breglio, A Irace, ...
2015 IEEE 27th International Symposium on Power Semiconductor Devices & IC's …, 2015
95 2015 A temperature-dependent SPICE model of SiC power MOSFETs for within and out-of-SOA simulations M Riccio, V d'Alessandro, G Romano, L Maresca, G Breglio, A Irace
IEEE Transactions on power electronics 33 (9), 8020-8029, 2017
67 2017 Statistical analysis of the electrothermal imbalances of mismatched parallel SiC power MOSFETs A Borghese, M Riccio, A Fayyaz, A Castellazzi, L Maresca, G Breglio, ...
IEEE Journal of Emerging and Selected Topics in Power Electronics 7 (3 …, 2019
43 2019 Influence of design parameters on the short-circuit ruggedness of SiC power MOSFETs G Romano, M Riccio, L Maresca, G Breglio, A Irace, A Fayyaz, ...
2016 28th International Symposium on Power Semiconductor Devices and ICs …, 2016
32 2016 Influence of the SiC/SiO2 SiC MOSFET Interface Traps Distribution on C –V Measurements Evaluated by TCAD Simulations L Maresca, I Matacena, M Riccio, A Irace, G Breglio, S Daliento
IEEE Journal of Emerging and Selected Topics in Power Electronics 9 (2 …, 2019
29 2019 Investigation on the short-circuit oscillation of cascode GaN HEMTs P Xue, L Maresca, M Riccio, G Breglio, A Irace
IEEE Transactions on Power Electronics 35 (6), 6292-6300, 2019
28 2019 Effect of the collector design on the IGBT avalanche ruggedness: A comparative analysis between punch-through and field-stop devices P Spirito, L Maresca, M Riccio, G Breglio, A Irace, E Napoli
IEEE Transactions on Electron Devices 62 (8), 2535-2541, 2015
24 2015 Kinetic model of SiGe selective epitaxial growth using RPCVD technique M Kolahdouz, L Maresca, R Ghandi, A Khatibi, HH Radamson
Journal of The Electrochemical Society 158 (4), H457, 2011
24 2011 New method to calibrate the pattern dependency of selective epitaxy of SiGe layers M Kolahdouz, L Maresca, M Ostling, D Riley, R Wise, HH Radamson
Solid-state electronics 53 (8), 858-861, 2009
23 2009 Short circuit robustness analysis of new generation Enhancement-mode p-GaN power HEMTs M Riccio, G Romano, L Maresca, G Breglio, A Irace, G Longobardi
2018 IEEE 30th International Symposium on Power Semiconductor Devices and …, 2018
22 2018 Accurate SPICE modeling of reverse-conducting IGBTs including self-heating effects M Riccio, G De Falco, P Mirone, L Maresca, M Tedesco, G Breglio, A Irace
IEEE Transactions on Power Electronics 32 (4), 3088-3098, 2016
22 2016 An ultrafast IR thermography system for transient temperature detection on electronic devices G Romano, M Riccio, G De Falco, L Maresca, A Irace, G Breglio
2014 Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM …, 2014
22 2014 3D electro-thermal simulations of wide area power devices operating in avalanche condition M Riccio, G De Falco, L Maresca, G Breglio, E Napoli, A Irace, Y Iwahashi, ...
Microelectronics Reliability 52 (9-10), 2385-2390, 2012
22 2012 Physics of the Negative Resistance in the Avalanche Curve of Field Stop IGBTs: Collector Design Rules for Improved Ruggedness P Spirito, G Breglio, A Irace, L Maresca, E Napoli, M Riccio
IEEE Transactions on Electron Devices 61 (5), 1457-1463, 2014
21 2014 Experimental study on the short-circuit instability of cascode GaN HEMTs P Xue, L Maresca, M Riccio, G Breglio, A Irace
IEEE Transactions on Electron Devices 67 (4), 1686-1692, 2020
20 2020 Analysis on the self-sustained oscillation of SiC MOSFET body diode P Xue, L Maresca, M Riccio, G Breglio, A Irace
IEEE Transactions on Electron Devices 66 (10), 4287-4295, 2019
17 2019 A robust electro-thermal IGBT SPICE model: Application to short-circuit protection circuit design D Cavaiuolo, M Riccio, L Maresca, A Irace, G Breglio, D Daprà, ...
Microelectronics Reliability 55 (9-10), 1971-1975, 2015
17 2015 A comprehensive investigation on short-circuit oscillation of p-GaN HEMTs P Xue, L Maresca, M Riccio, G Breglio, A Irace
IEEE Transactions on Electron Devices 67 (11), 4849-4857, 2020
16 2020 Impact of gate drive voltage on avalanche robustness of trench IGBTs M Riccio, L Maresca, A Irace, G Breglio, Y Iwahashi
Microelectronics Reliability 54 (9-10), 1828-1832, 2014
16 2014