| Robust estimators and test statistics for one-shot device testing under the exponential distribution N Balakrishnan, E Castilla, N Martín, L Pardo IEEE Transactions on Information Theory 65 (5), 3080-3096, 2019 | 35 | 2019 |
| Robust inference for one-shot device testing data under Weibull lifetime model N Balakrishnan, E Castilla, N Martín, L Pardo IEEE transactions on Reliability 69 (3), 937-953, 2019 | 26 | 2019 |
| Robust estimators for one-shot device testing data under gamma lifetime model with an application to a tumor toxicological data N Balakrishnan, E Castilla, N Martín, L Pardo Metrika 82 (8), 991-1019, 2019 | 26 | 2019 |
| New robust statistical procedures for the polytomous logistic regression models E Castilla, A Ghosh, N Martin, L Pardo Biometrics 74 (4), 1282-1291, 2018 | 25 | 2018 |
| Robust inference for one‐shot device testing data under exponential lifetime model with multiple stresses N Balakrishnan, E Castilla, N Martín, L Pardo Quality and Reliability Engineering International 36 (6), 1916-1930, 2020 | 17 | 2020 |
| Robust Wald-type tests based on minimum Rényi pseudodistance estimators for the multiple linear regression model E Castilla, N Martín, S Muñoz, L Pardo Journal of Statistical Computation and Simulation 90 (14), 2655-2680, 2020 | 15 | 2020 |
| Estimation and testing on independent not identically distributed observations based on Rényi’s pseudodistances E Castilla, M Jaenada, L Pardo IEEE Transactions on Information Theory 68 (7), 4588-4609, 2022 | 14 | 2022 |
| Optimal designs of constant‐stress accelerated life‐tests for one‐shot devices with model misspecification analysis N Balakrishnan, E Castilla, MH Ling Quality and Reliability Engineering International 38 (2), 989-1012, 2022 | 14 | 2022 |
| Minimum phi-divergence estimators for multinomial logistic regression with complex sample design E Castilla, N Martín, L Pardo AStA Advances in Statistical Analysis 102, 381-411, 2018 | 14* | 2018 |
| Robust semiparametric inference for polytomous logistic regression with complex survey design E Castilla, A Ghosh, N Martin, L Pardo Advances in Data Analysis and Classification 15 (3), 701-734, 2021 | 12 | 2021 |
| On regularization methods based on R\'enyi's pseudodistances for sparse high-dimensional linear regression models E Castilla, A Ghosh, M Jaenada, L Pardo arXiv preprint arXiv:2007.15929, 2020 | 11 | 2020 |
| Robust inference for nondestructive one‐shot device testing under step‐stress model with exponential lifetimes N Balakrishnan, E Castilla, M Jaenada, L Pardo Quality and Reliability Engineering International 39 (4), 1192-1222, 2023 | 10 | 2023 |
| A new robust approach for multinomial logistic regression with complex design model E Castilla, PJ Chocano IEEE Transactions on Information Theory 68 (11), 7379-7395, 2022 | 10 | 2022 |
| EM‐based likelihood inference for one‐shot device test data under log‐normal lifetimes and the optimal design of a CSALT plan N Balakrishnan, E Castilla Quality and Reliability Engineering International 38 (2), 780-799, 2022 | 10 | 2022 |
| Robust approach for comparing two dependent normal populations through Wald-type tests based on Rényi’s pseudodistance estimators E Castilla, M Jaenada, N Martín, L Pardo Statistics and Computing 32 (6), 100, 2022 | 9 | 2022 |
| Composite likelihood methods: Rao-type tests based on composite minimum density power divergence estimator E Castilla, N Martín, L Pardo, K Zografos Statistical Papers 62 (2), 1003-1041, 2021 | 9 | 2021 |
| Divergence-based robust inference under proportional hazards model for one-shot device life-test N Balakrishnan, E Castilla, N Martín, L Pardo IEEE Transactions on Reliability 70 (4), 1355-1367, 2021 | 9 | 2021 |
| Composite likelihood methods based on minimum density power divergence estimator E Castilla, N Martín, L Pardo, K Zografos Entropy 20 (1), 18, 2017 | 9 | 2017 |
| On the choice of the optimal tuning parameter in robust one-shot device testing analysis E Castilla, PJ Chocano Trends in Mathematical, Information and Data Sciences: A Tribute to Leandro …, 2022 | 7 | 2022 |
| Power divergence approach for one-shot device testing under competing risks N Balakrishnan, E Castilla, N Martin, L Pardo Journal of Computational and Applied Mathematics 419, 114676, 2023 | 6 | 2023 |
N BalakrishnanMcMaster UniversityVerified email at mcmaster.ca
