| Mechanical properties and strain monitoring of glass-epoxy composites with graphene-coated fibers H Mahmood, L Vanzetti, M Bersani, A Pegoretti Composites Part A: Applied Science and Manufacturing 107, 112-123, 2018 | 125 | 2018 |
| Transient enhanced diffusion of arsenic in silicon S Solmi, M Ferri, M Bersani, D Giubertoni, V Soncini Journal of applied physics 94 (8), 4950-4955, 2003 | 96 | 2003 |
| Pollen discrimination and classification by Fourier transform infrared (FT-IR) microspectroscopy and machine learning R Dell’Anna, P Lazzeri, M Frisanco, F Monti, F Malvezzi Campeggi, ... Analytical and bioanalytical chemistry 394, 1443-1452, 2009 | 94 | 2009 |
| P implantation into preamorphized germanium and subsequent annealing: Solid phase epitaxial regrowth, P diffusion, and activation M Posselt, B Schmidt, W Anwand, R Grötzschel, V Heera, A Mücklich, ... Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2008 | 68 | 2008 |
| Investigation on indium diffusion in silicon S Solmi, A Parisini, M Bersani, D Giubertoni, V Soncini, G Carnevale, ... Journal of Applied Physics 92 (3), 1361-1366, 2002 | 58 | 2002 |
| Arsenic uphill diffusion during shallow junction formation M Ferri, S Solmi, A Parisini, M Bersani, D Giubertoni, M Barozzi Journal of Applied Physics 99 (11), 2006 | 57 | 2006 |
| Deactivation of ultrashallow boron implants in preamorphized silicon after nonmelt laser annealing with multiple scans JA Sharp, NEB Cowern, RP Webb, KJ Kirkby, D Giubertoni, S Gennaro, ... Applied physics letters 89 (19), 2006 | 50 | 2006 |
| Al–Sn thin films deposited by pulsed laser ablation A Perrone, A Zocco, H De Rosa, R Zimmermann, M Bersani Materials Science and Engineering: C 22 (2), 465-468, 2002 | 42 | 2002 |
| Real-time observation and optimization of tungsten atomic layer deposition process cycle W Lei, L Henn-Lecordier, M Anderle, GW Rubloff, M Barozzi, M Bersani Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2006 | 39 | 2006 |
| Boron-interstitial silicon clusters and their effects on transient enhanced diffusion of boron in silicon S Solmi, M Bersani, M Sbetti, JL Hansen, AN Larsen Journal of Applied Physics 88 (8), 4547-4552, 2000 | 39 | 2000 |
| Vacancy-engineering implants for high boron activation in silicon on insulator AJ Smith, NEB Cowern, R Gwilliam, BJ Sealy, B Colombeau, EJH Collart, ... Applied physics letters 88 (8), 2006 | 37 | 2006 |
| Copper–titanium thin film interaction L Castoldi, G Visalli, S Morin, P Ferrari, S Alberici, G Ottaviani, F Corni, ... Microelectronic engineering 76 (1-4), 153-159, 2004 | 36 | 2004 |
| Polyethylene wax/EPDM blends as shape-stabilized phase change materials for thermal energy storage A Dorigato, MV Ciampolillo, A Cataldi, M Bersani, A Pegoretti Rubber Chemistry and Technology 90 (3), 575-584, 2017 | 35 | 2017 |
| Hydrogen diffusion in R Trotta, D Giubertoni, A Polimeni, M Bersani, M Capizzi, F Martelli, ... Physical Review B 80 (19), 195206, 2009 | 35 | 2009 |
| Effect of graphene nanoplatelets structure on the properties of acrylonitrile–butadiene–styrene composites S Dul, L Fambri, C Merlini, GMO Barra, M Bersani, L Vanzetti, A Pegoretti Polymer Composites 40 (S1), E285-E300, 2019 | 33 | 2019 |
| Interphase exchange coupling in Fe∕ Sm–Co bilayers with gradient Fe thickness M Yu, J Hattrick-Simpers, I Takeuchi, J Li, ZL Wang, JP Liu, SE Lofland, ... Journal of applied physics 98 (6), 2005 | 33 | 2005 |
| Electrical activation of solid-phase epitaxially regrown ultra-low energy boron implants in Ge preamorphised silicon and SOI JJ Hamilton, EJH Collart, B Colombeau, C Jeynes, M Bersani, ... Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2005 | 33 | 2005 |
| Nondestructive dose determination and depth profiling of arsenic ultrashallow junctions with total reflection X-ray fluorescence analysis compared to dynamic secondary ion mass … G Pepponi, C Streli, P Wobrauschek, N Zoeger, K Luening, P Pianetta, ... Spectrochimica Acta Part B: Atomic Spectroscopy 59 (8), 1243-1249, 2004 | 32 | 2004 |
| Dynamic secondary ion mass spectrometry and X-ray photoelectron spectroscopy on artistic bronze and copper artificial patinas IZ Balta, S Pederzoli, E Iacob, M Bersani Applied Surface Science 255 (12), 6378-6385, 2009 | 31 | 2009 |
| Diffusion and electrical activation of indium in silicon S Scalese, M Italia, A La Magna, G Mannino, V Privitera, M Bersani, ... Journal of applied physics 93 (12), 9773-9782, 2003 | 30 | 2003 |
