| A dynamic control approach for energy-efficient production scheduling on a single machine under time-varying electricity pricing S Lee, B Do Chung, HW Jeon, J Chang Journal of Cleaner Production 165, 552-563, 2017 | 57 | 2017 |
| Aggregate production planning considering implementation error: A robust optimization approach using bi-level particle swarm optimization J Jang, B Do Chung Computers & industrial engineering 142, 106367, 2020 | 35 | 2020 |
| Discriminative feature learning and cluster-based defect label reconstruction for reducing uncertainty in wafer bin map labels S Park, J Jang, CO Kim Journal of Intelligent Manufacturing 32, 251-263, 2021 | 34 | 2021 |
| Support weighted ensemble model for open set recognition of wafer map defects J Jang, M Seo, CO Kim IEEE Transactions on Semiconductor Manufacturing 33 (4), 635-643, 2020 | 28 | 2020 |
| Collective decision of one-vs-rest networks for open-set recognition J Jang, CO Kim IEEE Transactions on Neural Networks and Learning Systems 35 (2), 2327-2338, 2022 | 24 | 2022 |
| Denoised residual trace analysis for monitoring semiconductor process faults J Jang, BW Min, CO Kim IEEE Transactions on Semiconductor Manufacturing 32 (3), 293-301, 2019 | 23 | 2019 |
| Siamese network-based health representation learning and robust reference-based remaining useful life prediction J Jang, CO Kim IEEE Transactions on Industrial Informatics 18 (8), 5264-5274, 2021 | 22 | 2021 |
| Adaptive weapon-to-target assignment model based on the real-time prediction of hit probability J Jang, HG Yoon, JC Kim, CO Kim IEEE Access 7, 72210-72220, 2019 | 17 | 2019 |
| Automatic inspection of salt-and-pepper defects in OLED panels using image processing and control chart techniques J Kwak, KB Lee, J Jang, KS Chang, CO Kim Journal of Intelligent Manufacturing 30, 1047-1055, 2019 | 17 | 2019 |
| One-vs-rest network-based deep probability model for open set recognition J Jang, CO Kim arXiv preprint arXiv:2004.08067, 2020 | 15 | 2020 |
| Unstructured borderline self-organizing map: Learning highly imbalanced, high-dimensional datasets for fault detection J Jang, CO Kim Expert Systems with Applications 188, 116028, 2022 | 11 | 2022 |
| A run-to-run controller for a chemical mechanical planarization process using least squares generative adversarial networks S Kim, J Jang, CO Kim Journal of Intelligent Manufacturing 32, 2267-2280, 2021 | 11 | 2021 |
| Decision fusion approach for detecting unknown wafer bin map patterns based on a deep multitask learning model J Jang, GT Lee Expert Systems with Applications 215, 119363, 2023 | 8 | 2023 |
| Teacher–Explorer–Student Learning: A Novel Learning Method for Open Set Recognition J Jang, CO Kim IEEE Transactions on Neural Networks and Learning Systems, 2023 | 3 | 2023 |
| Real-time path planning of controllable UAV by subgoals using goal-conditioned reinforcement learning GT Lee, KJ Kim, J Jang Applied Soft Computing 146, 110660, 2023 | 3 | 2023 |
| Sequential residual learning for multistep processes in semiconductor manufacturing GT Lee, HG Lim, J Jang IEEE Transactions on Semiconductor Manufacturing 36 (1), 37-44, 2022 | 3 | 2022 |
| Synthetic unknown class learning for learning unknowns J Jang Pattern Recognition 153, 110560, 2024 | 2 | 2024 |
| A two-stage semi-supervised object detection method for SAR images with missing labels based on meta pseudo-labels SR Baek, J Jang Expert Systems with Applications 236, 121405, 2024 | 2 | 2024 |
| A test vector selection method based on machine learning for efficient presilicon verification HG Lim, J Jang, BK Ju, JW Ko, CO Kim Expert Systems with Applications 224, 120056, 2023 | 1 | 2023 |
| A deep learning-based conditional system health index method to reduce the uncertainty of remaining useful life prediction J Jang Soft Computing 27 (7), 3641-3654, 2023 | 1 | 2023 |
GyeongTaek LeeRutgers UniversityVerified email at rutgers.edu
