| A novel pixel-wise defect inspection method based on stable background reconstruction C Lv, F Shen, Z Zhang, D Xu, Y He IEEE Transactions on Instrumentation and Measurement 70, 1-13, 2020 | 26 | 2020 |
| Review of image anomaly detection C Lv, F Shen, Z Zhang, F Zhang Acta Automatica Sinica 48 (6), 1402-1428, 2022 | 18 | 2022 |
| A fast surface defect detection method based on background reconstruction C Lv, Z Zhang, F Shen, F Zhang, H Su International Journal of Precision Engineering and Manufacturing 21, 363-375, 2020 | 16 | 2020 |
| Dual Branch Learning with Prior Information for Surface Anomaly Detection S Wang, C Lv, Z Zhang, X Wei IEEE Transactions on Instrumentation and Measurement, 2023 | 3 | 2023 |
| Patterned Fabric Defect Detection Based on Double-branch Parallel Improved Faster-RCNN S Wang, C Lv, SY Wang, Z Zhang, X Shang 2021 China Automation Congress (CAC), 3798-3803, 2021 | 3 | 2021 |
| Mask-guided generation method for industrial defect images with non-uniform structures J Wei, Z Zhang, F Shen, C Lv Machines 10 (12), 1239, 2022 | 2 | 2022 |
| Produce once, utilize twice for anomaly detection S Wang, Q Li, H Luo, C Lv, Z Zhang IEEE Transactions on Circuits and Systems for Video Technology, 2024 | 1 | 2024 |
| Diversified and Multi-Class Controllable Industrial Defect Synthesis for Data Augmentation and Transfer J Wei, F Shen, C Lv, Z Zhang, F Zhang, H Yang Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern …, 2023 | 1 | 2023 |
| Unsupervised automatic defect inspection based on image matching and local one-class classification C Lv, Z Zhang, F Shen, F Zhang Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern …, 2023 | 1 | 2023 |
| A Unified Anomaly Synthesis Strategy with Gradient Ascent for Industrial Anomaly Detection and Localization Q Chen, H Luo, C Lv, Z Zhang arXiv preprint arXiv:2407.09359, 2024 | | 2024 |
| The Second-place Solution for CVPR VISION 23 Challenge Track 1--Data Effificient Defect Detection X Tao, Z Qu, H Luo, J Han, Y He, D Liu, C Lv, F Shen, Z Zhang arXiv preprint arXiv:2306.14116, 2023 | | 2023 |
| A Brief Research and Lookback of the Development of Iris Recognition X Li, S Hu, C Lv, H Qin, F Zhu, F Wang 2019 IEEE International Conference on Service Operations and Logistics, and …, 2019 | | 2019 |
| POUTA-Produce once, utilize twice for anomaly detection S Wang, H Luo, Q Li, C Lv, Z Zhang | | |
