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Baris Arslan
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Year
CircularScan: a scan architecture for test cost reduction
B Arslan, A Orailoglu
Design, Automation and Test in Europe Conference and Exhibition, 2004 …, 2004
672004
Fault dictionary size reduction through test response superposition
B Arslan, A Orailoglu
Computer Design: VLSI in Computers and Processors, 2002. Proceedings. 2002 …, 2002
322002
Test cost reduction through a reconfigurable scan architecture
B Arslan, A Orailoglu
Test Conference, 2004. Proceedings. ITC 2004. International, 945-952, 2004
312004
Extracting precise diagnosis of bridging faults from stuck-at fault information
B Arslan, A Orailoglu
Test Symposium, 2003. ATS 2003. 12th Asian, 230-235, 2003
162003
Aggressive Test Cost Reductions through Continuous Test Effectiveness Assessment
B Arslan, A Orailoglu
IEEE, 2015
112015
Adaptive test optimization through real time learning of test effectiveness
B Arslan, A Orailoglu
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2011, 1-6, 2011
72011
Tracing the best test mix through multi-variate quality tracking
B Arslan, A Orailoglu
VLSI Test Symposium (VTS), 2013 IEEE 31st, 1-6, 2013
62013
Delay test quality maximization through process-aware selection of test set size
B Arslan, A Orailoglu
Computer Design (ICCD), 2010 IEEE International Conference on, 390-395, 2010
62010
Extending the applicability of parallel-serial scan designs
B Arslan, O Sinanoglu, A Orailoglu
Computer Design: VLSI in Computers and Processors, 2004. ICCD 2004 …, 2004
52004
Full exploitation of process variation space for continuous delivery of optimal delay test quality
B Arslan, A Orailoglu
Design Automation Conference (ASP-DAC), 2013 18th Asia and South Pacific …, 2013
42013
Adaptive Test Framework for Achieving Target Test Quality at Minimal Cost
B Arslan, A Orailoglu
2011 Asian Test Symposium, 323-328, 2011
32011
Delay test resource allocation and scheduling for multiple frequency domains
B Arslan, A Orailoglu
2012 IEEE 30th VLSI Test Symposium (VTS), 114-119, 2012
22012
Power-Aware Delay Test Quality Optimization for Multiple Frequency Domains
B Arslan, A Orailoglu
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2016
12016
Design space exploration for aggressive test cost reduction in CircularScan architectures
B Arslan, A Orailoglu
Proceedings of the 2004 IEEE/ACM International conference on Computer-aided …, 2004
12004
Small delay defect diagnosis through failure observation ordering
B Arslan
2016 IEEE International Conference on Automation, Quality and Testing …, 2016
2016
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