CircularScan: a scan architecture for test cost reduction B Arslan, A Orailoglu Design, Automation and Test in Europe Conference and Exhibition, 2004 …, 2004 | 67 | 2004 |
Fault dictionary size reduction through test response superposition B Arslan, A Orailoglu Computer Design: VLSI in Computers and Processors, 2002. Proceedings. 2002 …, 2002 | 32 | 2002 |
Test cost reduction through a reconfigurable scan architecture B Arslan, A Orailoglu Test Conference, 2004. Proceedings. ITC 2004. International, 945-952, 2004 | 31 | 2004 |
Extracting precise diagnosis of bridging faults from stuck-at fault information B Arslan, A Orailoglu Test Symposium, 2003. ATS 2003. 12th Asian, 230-235, 2003 | 16 | 2003 |
Aggressive Test Cost Reductions through Continuous Test Effectiveness Assessment B Arslan, A Orailoglu IEEE, 2015 | 11 | 2015 |
Adaptive test optimization through real time learning of test effectiveness B Arslan, A Orailoglu Design, Automation & Test in Europe Conference & Exhibition (DATE), 2011, 1-6, 2011 | 7 | 2011 |
Tracing the best test mix through multi-variate quality tracking B Arslan, A Orailoglu VLSI Test Symposium (VTS), 2013 IEEE 31st, 1-6, 2013 | 6 | 2013 |
Delay test quality maximization through process-aware selection of test set size B Arslan, A Orailoglu Computer Design (ICCD), 2010 IEEE International Conference on, 390-395, 2010 | 6 | 2010 |
Extending the applicability of parallel-serial scan designs B Arslan, O Sinanoglu, A Orailoglu Computer Design: VLSI in Computers and Processors, 2004. ICCD 2004 …, 2004 | 5 | 2004 |
Full exploitation of process variation space for continuous delivery of optimal delay test quality B Arslan, A Orailoglu Design Automation Conference (ASP-DAC), 2013 18th Asia and South Pacific …, 2013 | 4 | 2013 |
Adaptive Test Framework for Achieving Target Test Quality at Minimal Cost B Arslan, A Orailoglu 2011 Asian Test Symposium, 323-328, 2011 | 3 | 2011 |
Delay test resource allocation and scheduling for multiple frequency domains B Arslan, A Orailoglu 2012 IEEE 30th VLSI Test Symposium (VTS), 114-119, 2012 | 2 | 2012 |
Power-Aware Delay Test Quality Optimization for Multiple Frequency Domains B Arslan, A Orailoglu IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2016 | 1 | 2016 |
Design space exploration for aggressive test cost reduction in CircularScan architectures B Arslan, A Orailoglu Proceedings of the 2004 IEEE/ACM International conference on Computer-aided …, 2004 | 1 | 2004 |
Small delay defect diagnosis through failure observation ordering B Arslan 2016 IEEE International Conference on Automation, Quality and Testing …, 2016 | | 2016 |