| BEN: A combinatorial testing-based fault localization tool LS Ghandehari, J Chandrasekaran, Y Lei, R Kacker, DR Kuhn 2015 IEEE Eighth International Conference on Software Testing, Verification …, 2015 | 33 | 2015 |
| Applying combinatorial testing to data mining algorithms J Chandrasekaran, H Feng, Y Lei, DR Kuhn, R Kacker 2017 IEEE International Conference on Software Testing, Verification and …, 2017 | 18 | 2017 |
| A combinatorial approach to testing deep neural network-based autonomous driving systems J Chandrasekaran, Y Lei, R Kacker, DR Kuhn 2021 IEEE international conference on software testing, verification and …, 2021 | 17 | 2021 |
| A combinatorial approach to fairness testing of machine learning models AR Patel, J Chandrasekaran, Y Lei, RN Kacker, DR Kuhn 2022 IEEE international conference on software testing, verification and …, 2022 | 15 | 2022 |
| Evaluating the effectiveness of ben in localizing different types of software fault J Chandrasekaran, LS Ghandehari, Y Lei, R Kacker, DR Kuhn 2016 IEEE Ninth International Conference on Software Testing, Verification …, 2016 | 12 | 2016 |
| Effectiveness of dataset reduction in testing machine learning algorithms J Chandrasekaran, H Feng, Y Lei, R Kacker, DR Kuhn 2020 IEEE international conference on artificial intelligence testing …, 2020 | 11 | 2020 |
| A combinatorial approach to explaining image classifiers J Chandrasekaran, Y Lei, R Kacker, DR Kuhn 2021 IEEE International Conference on Software Testing, Verification and …, 2021 | 10 | 2021 |
| Synthetic Data Generation Using Combinatorial Testing and Variational Autoencoder K Khadka, J Chandrasekaran, Y Lei, RN Kacker, DR Kuhn 2023 IEEE International Conference on Software Testing, Verification and …, 2023 | 5 | 2023 |
| Deepfarm: AI-driven management of farm production using explainable causality Y Wang, J Chandrasekaran, F Haberkorn, Y Dong, M Gopinath, ... 2022 IEEE 29th Annual Software Technology Conference (STC), 27-36, 2022 | 5 | 2022 |
| A Method-level test generation framework for debugging big data applications H Feng, J Chandrasekaran, Y Lei, R Kacker, DR Kuhn 2018 IEEE International Conference on Big Data (Big Data), 221-230, 2018 | 3 | 2018 |
| Testing Artificial Intelligence-Based Software Systems J Chandrasekaran The University of Texas at Arlington, 2021 | 2 | 2021 |
| Assured Autonomy, Artificial Intelligence, and Machine Learning: A Roundtable Discussion P Laplante, JF DeFranco, R Kuhn Computer 57 (3), 14-21, 2024 | 1 | 2024 |
| Test & Evaluation Best Practices for Machine Learning-Enabled Systems J Chandrasekaran, T Cody, N McCarthy, E Lanus, L Freeman arXiv preprint arXiv:2310.06800, 2023 | 1 | 2023 |
| Evaluation of T-Way Testing of DNNs in Autonomous Driving Systems J Chandrasekaran, AR Patel, Y Lei, R Kacker, DR Kuhn 2021 IEEE International Conference on Artificial Intelligence Testing …, 2021 | 1 | 2021 |
| A Survey of Data Security: Practices from Cybersecurity and Challenges of Machine Learning P Roy, J Chadrasekaran, E Lanus, L Freeman, J Werner arXiv preprint arXiv:2310.04513, 2023 | | 2023 |
| An introduction to AI assurance FA Batarseh, J Chandrasekaran, LJ Freeman AI Assurance, 3-12, 2023 | | 2023 |
| DeltaExplainer: A Software Debugging Approach to Generating Counterfactual Explanations S Shree, J Chandrasekaran, Y Lei, RN Kacker, DR Kuhn 2022 IEEE International Conference On Artificial Intelligence Testing …, 2022 | | 2022 |
| Enabling AI Adoption through Assurance J Chandrasekaran, FA Batarseh, L Freeman, R Kacker, MS Raunak, ... The International FLAIRS Conference Proceedings 35, 2022 | | 2022 |
| 2023 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)| 979-8-3503-3335-0/23/$31.00© 2023 IEEE| DOI: 10.1109/ICSTW58534. 2023.00079 W Afzal, T Ahmad, BS Ahmed, E Alégroth, J Aranda, L Ardito, C Arguelles, ... | | |
| PC members R Alexander, S Bardin, C Berger, CJ Budnik, Y Cai, A Ceccarelli, ... | | |
D. Richard (Rick) KuhnComputer scientist, National Institute of Standards and Technology (NIST)Verified email at nist.gov
