| Online condition monitoring of power MOSFET gate oxide degradation based on miller platform voltage X Ye, C Chen, Y Wang, G Zhai, GJ Vachtsevanos IEEE Transactions on Power Electronics 32 (6), 4776-4784, 2016 | 116 | 2016 |
| An adaptive optimized TVF-EMD based on a sparsity-impact measure index for bearing incipient fault diagnosis X Ye, Y Hu, J Shen, C Chen, G Zhai IEEE Transactions on Instrumentation and Measurement 70, 1-11, 2020 | 49 | 2020 |
| PHM application of power converters using health precursor of power MOSFETs C Chen, X Ye, Y Wang, J Xu, G Zhai 2015 Prognostics and System Health Management Conference (PHM), 1-5, 2015 | 18 | 2015 |
| Optimal design of step-stress accelerated degradation test oriented by nonlinear and distributed degradation process B Zheng, C Chen, Y Lin, Y Hu, X Ye, G Zhai, E Zio Reliability Engineering & System Safety 217, 108087, 2022 | 12 | 2022 |
| A new class of multi-stress acceleration models with interaction effects and its extension to accelerated degradation modelling X Ye, Y Hu, B Zheng, C Chen, G Zhai Reliability Engineering & System Safety 228, 108815, 2022 | 11 | 2022 |
| Reliability assessment of film capacitors oriented by dependent and nonlinear degradation considering three-source uncertainties X Ye, Y Hu, B Zheng, C Chen, R Feng, S Liu, G Zhai Microelectronics Reliability 126, 114277, 2021 | 11 | 2021 |
| VDMOSFET HEF degradation modelling considering turn-around phenomenon XR Ye, C Chen, YX Wang, L Wang, GF Zhai Microelectronics Reliability 80, 37-41, 2018 | 10 | 2018 |
| A framework for model-based diagnostics and prognostics of switched-mode power supplies H Li, X Ye, C Chen, G Vachtsevanos Annual Conference of the PHM Society 6 (1), 2014 | 9 | 2014 |
| Condition-based maintenance optimization for motorized spindles integrating proportional hazard model with SPC charts X Du, J Gai, C Chen Mathematical Problems in Engineering 2020, 1-11, 2020 | 8 | 2020 |
| The threshold voltage degradation model of N Channel VDMOSFETs under PBT stress X Ye, K Zhang, C Chen, Z Li, Y Wang, G Zhai Microelectronics Reliability 91, 46-51, 2018 | 8 | 2018 |
| A joint distribution-based testability metric estimation model for unreliable tests X Ye, C Chen, M Kang, G Zhai, M Pecht IEEE Access 6, 42566-42577, 2018 | 8 | 2018 |
| Life-cycle dynamic robust design optimization for batch production of permanent magnet actuator X Ye, H Chen, C Chen, G Zhai IEEE Transactions on Industrial Electronics 68 (10), 9885-9896, 2020 | 7 | 2020 |
| Reliability estimation of complex systems based on a Wiener process with random effects and D-vine copulas B Zheng, C Chen, W Zhang, R Fu, Y Hu, Y Lin, C Wang, G Zhai Microelectronics Reliability 138, 114640, 2022 | 5 | 2022 |
| Reliability analysis based on a bivariate degradation model considering random initial state and its correlation with degradation rate B Zheng, C Chen, Y Lin, X Ye, G Zhai IEEE Transactions on Reliability 72 (1), 37-48, 2022 | 5 | 2022 |
| Life-cycle reliability design optimization of high-power DC electromagnetic devices based on time-dependent non-probabilistic convex model process X Ye, H Chen, Q Sun, C Chen, H Niu, G Zhai, W Li, R Yuan Microelectronics Reliability 114, 113795, 2020 | 5 | 2020 |
| In-situ prognostic method of power MOSFET based on miller effect C Chen, X Ye, H Wang, G Zhai, R Wan 2017 Prognostics and System Health Management Conference (PHM-Harbin), 1-5, 2017 | 5 | 2017 |
| Health-assessment methodology research for SMPS based on simulation X Ye, C Chen, Y Wang, Y Zhou, G Vachtsevanos 2015 Annual Reliability and Maintainability Symposium (RAMS), 1-7, 2015 | 5 | 2015 |
| Soft fault diagnosis using URV-LDA transformed feature dictionary C Chen, Y Yang, X Ye, G Zhai IEEE Access 9, 16019-16029, 2021 | 4 | 2021 |
| Quality and robustness optimization design method for electromagnetic devices consider manufacturing uncertainties and working point migration of permanent magnets X Ye, H Chen, C Chen, G Zhai SN Applied Sciences 2, 1-10, 2020 | 2 | 2020 |
| A HALT-Simulation Combined Fault Diagnosis and Optimization Method for Electronic Module X Ye, M Lyu, C Chen, S Yu, Z Dang, G Zhai 2018 Annual Reliability and Maintainability Symposium (RAMS), 1-7, 2018 | 1 | 2018 |
Michael G. PechtUniversity of MarylandVerified email at umd.edu
