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Jeffrey R Shallenberger
Jeffrey R Shallenberger
Verified email at psu.edu
Title
Cited by
Cited by
Year
Characterization of silicon oxynitride thin films by x-ray photoelectron spectroscopy
JR Shallenberger, DA Cole, SW Novak
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 17 (4 …, 1999
1751999
Atomically thin half-van der Waals metals enabled by confinement heteroepitaxy
N Briggs, B Bersch, Y Wang, J Jiang, RJ Koch, N Nayir, K Wang, ...
Nature materials 19 (6), 637-643, 2020
1392020
thickness determination by x-ray photoelectron spectroscopy, Auger electron spectroscopy, secondary ion mass spectrometry, Rutherford backscattering …
DA Cole, JR Shallenberger, SW Novak, RL Moore, MJ Edgell, SP Smith, ...
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2000
1182000
Determination of chemistry and microstructure in SiOx (0.1<x<0.8) films by x‐ray photoelectron spectroscopy
JR Shallenberger
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 14 (3 …, 1996
791996
Active pixel sensor matrix based on monolayer MoS2 phototransistor array
A Dodda, D Jayachandran, A Pannone, N Trainor, SP Stepanoff, ...
Nature Materials 21 (12), 1379-1387, 2022
612022
Sample handling, preparation and mounting for XPS and other surface analytical techniques
FA Stevie, R Garcia, J Shallenberger, JG Newman, CL Donley
Journal of Vacuum Science & Technology A 38 (6), 2020
512020
Oxide thickness determination by xps, aes, sims, rbs and tem
JR Shallenberger, DA Cole, SW Novak, RL Moore, MJ Edgell, SP Smith, ...
1998 International Conference on Ion Implantation Technology. Proceedings …, 1998
381998
Adsorption of polyamides and polyamide–silane mixtures at glass surfaces
JR Shallenberger, EE Metwalli, CG Pantano, FN Tuller, DF Fry
Surface and Interface Analysis: An International Journal devoted to the …, 2003
372003
Simultaneous reduction and polymerization of graphene oxide/styrene mixtures to create polymer nanocomposites with tunable dielectric constants
D Hou, JE Bostwick, JR Shallenberger, ES Zofchak, RH Colby, Q Liu, ...
ACS Applied Nano Materials 3 (2), 962-968, 2019
292019
Effects of annealing on X-ray-amorphous CVD W-Si-N barrier layer materials
OH Gokce, S Amin, NM Ravindra, DJ Szostak, RJ Paff, JG Fleming, ...
Thin Solid Films 353 (1-2), 149-156, 1999
241999
In situ exfoliated 2D molybdenum disulfide analyzed by XPS
X Wang, CR Cormier, A Khosravi, CM Smyth, JR Shallenberger, R Addou, ...
Surface Science Spectra 27 (1), 2020
232020
2D tungsten diselenide analyzed by XPS
JR Shallenberger
Surface Science Spectra 25 (1), 2018
222018
Alternating polyester/fluoroalkene copolymers: Combining high hydrophobicity with degradability
S Borkar, A Sen, JR Shallenberger
Journal of Polymer Science Part A: Polymer Chemistry 44 (3), 1225-1232, 2006
222006
Low temperature activation of inert hexagonal boron nitride for metal deposition and single atom catalysis
Y Lei, S Pakhira, K Fujisawa, H Liu, C Guerrero-Bermea, T Zhang, ...
Materials Today 51, 108-116, 2021
202021
Zinc selenide analyzed by XPS
JR Shallenberger, N Hellgren
Surface Science Spectra 27 (1), 2020
172020
Studies of Hf (Si, O) dielectrics for metal-oxide-semiconductor applications
K Chang, K Shanmugasundaram, J Shallenberger, J Ruzyllo
Thin Solid Films 515 (7-8), 3802-3805, 2007
172007
Ultrahigh purity conditions for nitride growth with low oxygen content by plasma-enhanced atomic layer deposition
GB Rayner, N O’Toole, J Shallenberger, B Johs
Journal of Vacuum Science & Technology A 38 (6), 2020
162020
Effect of etching on the oxidation of zinc selenide surfaces characterized by X-ray photoelectron spectroscopy
N Hellgren, MA Steves, J Shallenberger, SK O'Boyle, E Mellott, AR Noble
Applied Surface Science 528, 146604, 2020
142020
Surface analysis of 24% lead crystal glass articles: correlation with lead release
E Guadagnino, M Verita, F Geotti-Bianchini, J Shallenberger, CG Pantano
Glass technology 43 (2), 63-69, 2002
142002
Recent advances in XPS characterization of ultra-thin oxides
JR Shallenberger, DA Cole, DF Downey, S Falk, Z Zhao
1998 International Conference on Ion Implantation Technology. Proceedings …, 1998
121998
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