Characterization of silicon oxynitride thin films by x-ray photoelectron spectroscopy JR Shallenberger, DA Cole, SW Novak Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 17 (4 …, 1999 | 175 | 1999 |
Atomically thin half-van der Waals metals enabled by confinement heteroepitaxy N Briggs, B Bersch, Y Wang, J Jiang, RJ Koch, N Nayir, K Wang, ... Nature materials 19 (6), 637-643, 2020 | 139 | 2020 |
thickness determination by x-ray photoelectron spectroscopy, Auger electron spectroscopy, secondary ion mass spectrometry, Rutherford backscattering … DA Cole, JR Shallenberger, SW Novak, RL Moore, MJ Edgell, SP Smith, ... Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2000 | 118 | 2000 |
Determination of chemistry and microstructure in SiOx (0.1<x<0.8) films by x‐ray photoelectron spectroscopy JR Shallenberger Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 14 (3 …, 1996 | 79 | 1996 |
Active pixel sensor matrix based on monolayer MoS2 phototransistor array A Dodda, D Jayachandran, A Pannone, N Trainor, SP Stepanoff, ... Nature Materials 21 (12), 1379-1387, 2022 | 61 | 2022 |
Sample handling, preparation and mounting for XPS and other surface analytical techniques FA Stevie, R Garcia, J Shallenberger, JG Newman, CL Donley Journal of Vacuum Science & Technology A 38 (6), 2020 | 51 | 2020 |
Oxide thickness determination by xps, aes, sims, rbs and tem JR Shallenberger, DA Cole, SW Novak, RL Moore, MJ Edgell, SP Smith, ... 1998 International Conference on Ion Implantation Technology. Proceedings …, 1998 | 38 | 1998 |
Adsorption of polyamides and polyamide–silane mixtures at glass surfaces JR Shallenberger, EE Metwalli, CG Pantano, FN Tuller, DF Fry Surface and Interface Analysis: An International Journal devoted to the …, 2003 | 37 | 2003 |
Simultaneous reduction and polymerization of graphene oxide/styrene mixtures to create polymer nanocomposites with tunable dielectric constants D Hou, JE Bostwick, JR Shallenberger, ES Zofchak, RH Colby, Q Liu, ... ACS Applied Nano Materials 3 (2), 962-968, 2019 | 29 | 2019 |
Effects of annealing on X-ray-amorphous CVD W-Si-N barrier layer materials OH Gokce, S Amin, NM Ravindra, DJ Szostak, RJ Paff, JG Fleming, ... Thin Solid Films 353 (1-2), 149-156, 1999 | 24 | 1999 |
In situ exfoliated 2D molybdenum disulfide analyzed by XPS X Wang, CR Cormier, A Khosravi, CM Smyth, JR Shallenberger, R Addou, ... Surface Science Spectra 27 (1), 2020 | 23 | 2020 |
2D tungsten diselenide analyzed by XPS JR Shallenberger Surface Science Spectra 25 (1), 2018 | 22 | 2018 |
Alternating polyester/fluoroalkene copolymers: Combining high hydrophobicity with degradability S Borkar, A Sen, JR Shallenberger Journal of Polymer Science Part A: Polymer Chemistry 44 (3), 1225-1232, 2006 | 22 | 2006 |
Low temperature activation of inert hexagonal boron nitride for metal deposition and single atom catalysis Y Lei, S Pakhira, K Fujisawa, H Liu, C Guerrero-Bermea, T Zhang, ... Materials Today 51, 108-116, 2021 | 20 | 2021 |
Zinc selenide analyzed by XPS JR Shallenberger, N Hellgren Surface Science Spectra 27 (1), 2020 | 17 | 2020 |
Studies of Hf (Si, O) dielectrics for metal-oxide-semiconductor applications K Chang, K Shanmugasundaram, J Shallenberger, J Ruzyllo Thin Solid Films 515 (7-8), 3802-3805, 2007 | 17 | 2007 |
Ultrahigh purity conditions for nitride growth with low oxygen content by plasma-enhanced atomic layer deposition GB Rayner, N O’Toole, J Shallenberger, B Johs Journal of Vacuum Science & Technology A 38 (6), 2020 | 16 | 2020 |
Effect of etching on the oxidation of zinc selenide surfaces characterized by X-ray photoelectron spectroscopy N Hellgren, MA Steves, J Shallenberger, SK O'Boyle, E Mellott, AR Noble Applied Surface Science 528, 146604, 2020 | 14 | 2020 |
Surface analysis of 24% lead crystal glass articles: correlation with lead release E Guadagnino, M Verita, F Geotti-Bianchini, J Shallenberger, CG Pantano Glass technology 43 (2), 63-69, 2002 | 14 | 2002 |
Recent advances in XPS characterization of ultra-thin oxides JR Shallenberger, DA Cole, DF Downey, S Falk, Z Zhao 1998 International Conference on Ion Implantation Technology. Proceedings …, 1998 | 12 | 1998 |