Follow
Daniel Gil Tomàs
Title
Cited by
Cited by
Year
Comparison and Application of different VHDL-Based Fault Injection Techniques
J Gracia, JC Baraza, D Gil, PJ Gil
16th IEEE International Symposium on Defect and Fault Tolerance in VLSI …, 2001
1152001
Enhancement of fault injection techniques based on the modification of VHDL code
JC Baraza, J Gracia, S Blanc, D Gil Tomás, P Gil Vicente
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 16 (6), 693-706, 2008
972008
Improvement of fault injection techniques based on VHDL code modification
JC Baraza, J Gracia, D Gil, P Gil
10th IEEE International Workshop on High Level Design Validation and Test …, 2005
942005
A Prototype of a VHDL-Based Fault Injection Tool: Description and Application
JC Baraza, J Gracia, D Gil Tomás, P Gil Vicente
Journal of Systems Architecture 47 (10), 847-867, 2002
842002
Fault Emulation for Dependability Evaluation of VLSI Systems
D De Andrés, JC Ruiz, D Gil Tomás, P Gil Vicente
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 16 (4), 422-431, 2008
672008
Fault Representativeness
P Gil, J Arlat, H Madeira, Y Crouzet, T Jarboui, K Kanoun, T Marteau, ...
Deliverable ETIE2 of Dependability Benchmarking Project, IST-2000 25245, 2002
672002
Fault Representativeness
JG Pedro Gil, Jean Arlat, Henrique Madeira, Yves Crouzet, Tahar Jarboui ...
Deliverable ETIE2 of Dependability Benchmarking Project, IST-2000 25245, 2002
67*2002
Fault Representativeness
P Gil, J Arlat, H Madeira, Y Crouzet
Deliverable ETIE2 of Dependability Benchmarking Project, IST-2000-25425, 0
67*
Improving error correction codes for multiple-cell upsets in space applications
J Gracia-Moran, LJ Saiz-Adalid, D Gil-Tomas, PJ Gil-Vicente
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 26 (10 …, 2018
542018
Analysis of the influence of intermittent faults in a microcontroller
J Gracia, LJ Saiz, JC Baraza, D Gil, PJ Gil
11th IEEE International Workshop on Design and Diagnostics of Electronic …, 2008
492008
Fault injection into VHDL models: experimental validation of a fault tolerant microcomputer system
D Gil, JC Baraza, JV Busquets, PJ Gil
3rd European Dependable Computing Conference (EDCC 99), 191-208, 1999
481999
Study, comparison and application of different VHDL-based fault injection techniques for the experimental validation of a fault-tolerant system
D Gil, J Gracia, JC Baraza, PJ Gil
Microelectronics Journal 34 (1), 41-51, 2003
452003
VHDL Simulation-Based Fault Injection Techniques
D Gil, JC Baraza, J Gracia, PJ Gil
Fault injection techniques and tools for VLSI reliability evaluation, 159-176, 2003
342003
A Study of the Effects of Transient Fault Injection into the VHDL Model of a Fault-Tolerant Microcomputer System
D Gil, J Gracia, JC Baraza, PJ Gil
6th IEEE International On-Line Testing Workshop (IOLTW 2000), 73-79, 2000
342000
A Study of the Effects of Transient Fault Injection into the VHDL Model of a Fault-Tolerant Microcomputer System
D Gil, JC Baraza, J Gracia, P Gil
6th IEEE International On-Line Testing Workshop (IOLTW 2000), 73-79, 0
34*
A Prototype of a VHDL-Based Fault Injection Tool
JC Baraza, J Gracia, D Gil, PJ Gil
15th IEEE International Symposium on Defect and Fault Tolerance in VLSI …, 2000
322000
Effects of intermittent faults on the reliability of a reduced instruction set computing (RISC) microprocessor
J Gracia-Morán, JC Baraza-Calvo, D Gil-Tomás, LJ Saiz-Adalid, ...
IEEE Transactions on Reliability 63 (1), 144-153, 2014
282014
Studying the effects of intermittent faults on a microcontroller
D Gil-Tomás, J Gracia-Morán, JC Baraza-Calvo, LJ Saiz-Adalid, ...
Microelectronics Reliability 52 (11), 2837-2846, 2012
272012
Flexible unequal error control codes with selectable error detection and correction levels
LJ Saiz-Adalid, PJ Gil-Vicente, JC Ruiz-García, D Gil-Tomás, JC Baraza, ...
Computer Safety, Reliability, and Security: 32nd International Conference …, 2013
262013
Analyzing the impact of intermittent faults on microprocessors applying fault injection
D Gil-Tomás, J Gracia-Moran, JC Baraza-Calvo, LJ Saiz-Adalid, ...
IEEE Design & Test of Computers 29 (6), 66-73, 2012
222012
The system can't perform the operation now. Try again later.
Articles 1–20