| Calibration method for carrying out multiport measurements on semiconductor wafers H Heuermann US Patent 7,130,756, 2006 | 102 | 2006 |
| Robust algorithms for Txx network analyzer self-calibration procedures H Heuermann, B Schiek IEEE transactions on instrumentation and measurement 43 (1), 18-23, 1994 | 79 | 1994 |
| Matching network H Heuermann, A Sadeghfam US Patent 7,831,219, 2010 | 68 | 2010 |
| Hochfrequenztechnik: Komponenten für High-Speed-und Hochfrequenzschaltungen H Heuermann Springer-Verlag, 2018 | 55* | 2018 |
| GSOLT: The calibration procedure for all multi-port vector network analyzers H Heuermann IEEE MTT-S International Microwave Symposium Digest, 2003 3, 1815-1818, 2003 | 51 | 2003 |
| Line network network (LNN): An alternative in-fixture calibration procedure H Heuermann, B Schiek IEEE transactions on microwave theory and techniques 45 (3), 408-413, 1997 | 48 | 1997 |
| Hochfrequenztechnik H Heuermann Vieweg+ Teubner Verlag, 2005 | 32 | 2005 |
| 15-term self-calibration methods for the error-correction of on-wafer measurements H Heuermann, B Schiek IEEE transactions on instrumentation and measurement 46 (5), 1105-1110, 1997 | 29 | 1997 |
| Results of network analyzer measurements with leakage errors corrected with the TMS-15-term procedure H Heuermann, B Schiek 1994 IEEE MTT-S International Microwave Symposium Digest (Cat. No. 94CH3389 …, 1994 | 27 | 1994 |
| Calibration of a network analyzer without a thru connection for nonlinear and multiport measurements H Heuermann IEEE transactions on microwave theory and techniques 56 (11), 2505-2510, 2008 | 25 | 2008 |
| Blocking structures for mixed-mode systems H Erkens, H Heuermann 34th European Microwave Conference, 2004. 1, 297-300, 2004 | 25 | 2004 |
| Mixed-mode chain scattering parameters: Theory and verification H Erkens, H Heuermann IEEE transactions on microwave theory and techniques 55 (8), 1704-1708, 2007 | 21 | 2007 |
| Compensation circuit for an rfid-reader unit and rfid reader device A Sadeghfam, H Heuermann US Patent App. 12/400,311, 2009 | 20 | 2009 |
| Results of network analyzer measurements with leakage errors-corrected with direct calibration techniques H Heuermann, B Schiek IEEE transactions on instrumentation and measurement 46 (5), 1120-1127, 1997 | 20 | 1997 |
| Method for calibrating a network analyzer B Schiek, H Heuermann US Patent 5,442,296, 1995 | 19 | 1995 |
| A SFCW harmonic radar system for maritime search and rescue using passive and active tags T Harzheim, M Mühmel, H Heuermann International Journal of Microwave and Wireless Technologies 13 (7), 691-707, 2021 | 18 | 2021 |
| Advanced on-wafer multiport calibration methods for mono-and mixed-mode device characterization H Heuermann, A Rumiantsev, S Schott On-Wafer Calibration Techniques Enabling Accurate Characterization of High …, 2022 | 17 | 2022 |
| Various applications and background of 10–200W 2.45 GHz Microplasmas H Heuermann, S Holtrup, A Sadeghfam, M Schmidt, R Perkuhn, T Finger 2012 IEEE/MTT-S International Microwave Symposium Digest, 1-3, 2012 | 17 | 2012 |
| Novel algorithms for FMCW range finding with microwaves R Stolle, H Heuermann, B Schiek IEEE NTC, Conference Proceedings Microwave Systems Conference, 129-132, 1995 | 17 | 1995 |
| Procedures for the determination of the scattering parameters for network analyzer calibration H Heuermann, B Schiek IEEE transactions on instrumentation and measurement 42 (2), 528-531, 1993 | 17 | 1993 |
Peter AwakowiczProfessor für Elektrotechnik und Plasmatechnik, Ruhr-Universität BochumVerified email at aept.rub.de
