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Salvador Bosch
Salvador Bosch
Catedratic d'Optica, Universitat de Barcelona
Verified email at ub.edu
Title
Cited by
Cited by
Year
Vectorial structure of nonparaxial electromagnetic beams
R Martnez-Herrero, PM Mejas, S Bosch, A Carnicer
JOSA A 18 (7), 1678-1680, 2001
1332001
Dark modes and Fano resonances in plasmonic clusters excited by cylindrical vector beams
J Sancho-Parramon, S Bosch
ACS nano 6 (9), 8415-8423, 2012
1262012
Ultraviolet optical and microstructural properties of MgF2 and LaF3 coatings deposited by ion-beam sputtering and boat and electron-beam evaporation
D Ristau, S Günster, S Bosch, A Duparre, E Masetti, J Ferre-Borrull, ...
Applied optics 41 (16), 3196-3204, 2002
1262002
Effective dielectric function of mixtures of three or more materials: a numerical procedure for computations
S Bosch, J Ferre-Borrull, N Leinfellner, A Canillas
Surface science 453 (1-3), 9-17, 2000
1132000
Relation between 2D/3D chirality and the appearance of chiroptical effects in real nanostructures
O Arteaga, J Sancho-Parramon, S Nichols, BM Maoz, A Canillas, S Bosch, ...
Optics express 24 (3), 2242-2252, 2016
912016
Diffraction theory of Fresnel lenses encoded in low-resolution devices
E Carcolé, J Campos, S Bosch
Applied optics 33 (2), 162-174, 1994
831994
A general-purpose software for optical characterization of thin films: specific features for microelectronic applications
S Bosch, J Ferré-Borrull, J Sancho-Parramon
Solid-State Electronics 45 (5), 703-709, 2001
622001
Optical characterization of HfO2 by spectroscopic ellipsometry: Dispersion models and direct data inversion
J Sancho-Parramon, M Modreanu, S Bosch, M Stchakovsky
Thin Solid Films 516 (22), 7990-7995, 2008
512008
Plasmonic layers based on Au-nanoparticle-doped TiO2 for optoelectronics: structural and optical properties
E Pedrueza, J Sancho-Parramon, S Bosch, JL Valdes, JP Martinez-Pastor
Nanotechnology 24 (6), 065202, 2013
442013
Spectroscopic ellipsometric study of tetrahedral amorphous carbon films: optical properties and modelling
A Canillas, MC Polo, JL Andujar, J Sancho, S Bosch, J Robertson, ...
Diamond and related materials 10 (3-7), 1132-1136, 2001
382001
Phase mask selection in wavefront coding systems: A design approach
G Carles, A Carnicer, S Bosch
Optics and Lasers in Engineering 48 (7-8), 779-785, 2010
312010
Use of a spatial light modulator as an adaptable phase mask for wavefront coding
G Carles, G Muyo, S Bosch, AR Harvey
Journal of Modern Optics 57 (10), 893-900, 2010
272010
Ellipsometric methods for absorbing layers: a modified downhill simplex algorithm
S Bosch, F Monzonis, E Masetti
Thin Solid Films 289 (1-2), 54-58, 1996
271996
Design of surface forces apparatus for tribology studies combined with nonlinear optical spectroscopy
P Frantz, F Wolf, X Xiao, Y Chen, S Bosch, M Salmeron
Review of scientific instruments 68 (6), 2499-2504, 1997
241997
Effective medium models for metal-dielectric composites: an analysis based on the spectral density theory
J Sancho-Parramon, S Bosch, A Abdolvand, A Podlipensky, G Seifert, ...
Advances in Optical Thin Films II 5963, 556-566, 2005
232005
UV-optical and microstructural properties of MgF2-coatings deposited by IBS and PVD processes
D Ristau, W Arens, S Bosch, A Duparre, E Masetti, D Jacob, G Kiriakidis, ...
Advances in Optical Interference Coatings 3738, 436-445, 1999
231999
Spectroscopic ellipsometric characterization of transparent thin film amorphous electronic materials: integrated analysis
KV Popov, AV Tikhonravov, J Campmany, E Bertran, S Bosch, A Canillas
Thin Solid Films 313, 379-383, 1998
231998
General inversion method for single-wavelength ellipsometry of samples with an arbitrary number of layers
S Bosch, F Monzonis
JOSA A 12 (6), 1375-1379, 1995
221995
Use of information on the manufacture of samples for the optical characterization of multilayers through a global optimization
J Sancho-Parramon, J Ferre-Borrull, S Bosch, MC Ferrara
Applied optics 42 (7), 1325-1329, 2003
202003
On the vectorial structure of non-paraxial radially polarized light fields
R Martínez-Herrero, PM Mejías, S Bosch
Optics communications 281 (11), 3046-3050, 2008
182008
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