James Alexander Liddle - Google Scholar Citations

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	All	Since 2014
Citations	8060	2638
h-index	45	26
i10-index	154	63

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Co-authors

Reginald C. FarrowNew Jersey Institute of TechnologyVerified email at njit.edu
Jeffrey Bokor Professor of electrical engineering and computer sciences, University of California, BerkeleyVerified email at eecs.berkeley.edu
Patrick NaulleauLawrence Berkeley National LabVerified email at lbl.gov
Carmen S. MenoniUniversity Distinguished Professor, Electrical & Computer Engineering, Colorado State UniversityVerified email at colostate.edu
Arun PersaudLawrence Berkeley National LaboratoryVerified email at lbl.gov
Thomas SchenkelLawrence Berkley National LaboratoryVerified email at lbl.gov
Chris GrovenorProfessor of Materials, Oxford UniversityVerified email at materials.ox.ac.uk
Kenneth A. GoldbergOptical Physicist, Lawrence Berkeley National Laboratory; Advanced Light Source (ALS) & ALS-UVerified email at lbl.gov
Samuel M. StavisNational Institute of Standards and Technology (NIST)Verified email at nist.gov
Christian J. LongNational Institute of Standards and TechnologyVerified email at nist.gov
Thomas F. LamPhysical Scientist, Smithsonian Museum Conservation InstituteVerified email at si.edu
Ivo Rangelow Prof. Dr.Technische Universität IlmenauVerified email at tu-ilmenau.de
Miguel LarotondaQuantum Optics Laboratory CEILAP (CITEDEF CONICET)Verified email at citedef.gob.ar
Sunghoon KwonSeoul National University, Department of Electrical and Computer EngineeringVerified email at snu.ac.kr
R. Stanley WilliamsTexas A & M University ECE DepartmentVerified email at rstanleywilliams.com
Shih-Yuan (SY) WangWWSensDevices, Inc., HP Labs, UC Berkeley, Agilent, GazillionbitsVerified email at ieee.org
Jabez McclellandNISTVerified email at nist.gov
Greg DenbeauxSUNY Polytechnic Institute, College of Nanoscale Science and EngineeringVerified email at sunypoly.edu
Seong-Ju ParkGwangju Institute of Science and Technology, KoreaVerified email at gist.ac.kr
Nathan OrloffNational Institute of Standards and Technology, BoulderVerified email at nist.gov

James Alexander Liddle

Scientific Director, Microsystems and Nanotechnology Division, NIST

Verified email at nist.gov

Nanofabrication self-assembly directed self-assembly nanomanufacturing


Title	Cited by	Year
Soft X-ray microscopy at a spatial resolution better than 15 nm W Chao, BD Harteneck, JA Liddle, EH Anderson, DT Attwood Nature 435 (7046), 1210, 2005	970	2005
Integration of colloidal nanocrystals into lithographically patterned devices Y Cui, MT Björk, JA Liddle, C Sönnichsen, B Boussert, AP Alivisatos Nano Letters 4 (6), 1093-1098, 2004	605	2004
Vacuum compatible fluid sampler JA Liddle, SM Stavis, GE Holland US Patent 10,265,699, 2019	196	2019
Low-cost, low-loss microlens arrays fabricated by soft-lithography replication process MV Kunnavakkam, FM Houlihan, M Schlax, JA Liddle, P Kolodner, ... Applied physics letters 82 (8), 1152-1154, 2003	178	2003
One-kilobit cross-bar molecular memory circuits at 30-nm half-pitch fabricated by nanoimprint lithography W Wu, GY Jung, DL Olynick, J Straznicky, Z Li, X Li, DAA Ohlberg, Y Chen, ... Applied Physics A 80 (6), 1173-1178, 2005	167	2005
Absorption and luminescence studies of free-standing porous silicon films YH Xie, MS Hybertsen, WL Wilson, SA Ipri, GE Carver, WL Brown, E Dons, ... Physical Review B 49 (8), 5386, 1994	149	1994
Vacuum ultraviolet rare gas excimer light source J Wieser, DE Murnick, A Ulrich, HA Huggins, A Liddle, WL Brown Review of Scientific Instruments 68 (3), 1360-1364, 1997	147	1997
Sub-38 nm resolution tabletop microscopy with 13 nm wavelength laser light G Vaschenko, C Brewer, F Brizuela, Y Wang, MA Larotonda, BM Luther, ... Optics Letters 31 (9), 1214-1216, 2006	138	2006
Projection electron‐beam lithography: A new approach SD Berger, JM Gibson, RM Camarda, RC Farrow, HA Huggins, JS Kraus, ... Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 1991	124	1991
Solid state quantum computer development in silicon with single ion implantation T Schenkel, A Persaud, SJ Park, J Nilsson, J Bokor, JA Liddle, R Keller, ... Journal of Applied Physics 94 (11), 7017-7024, 2003	122	2003
Soft X-ray microscopy of nanomagnetism P Fischer, DH Kim, W Chao, JA Liddle, EH Anderson, DT Attwood Materials Today 9 (1-2), 26-33, 2006	117	2006
Lithographically directed self-assembly of nanostructures JA Liddle, Y Cui, P Alivisatos Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2004	116	2004
Status of EUV micro-exposure capabilities at the ALS using the 0.3-NA MET optic P Naulleau, KA Goldberg, EH Anderson, K Bradley, R Delano, P Denham, ... Emerging Lithographic Technologies VIII 5374, 881-891, 2004	108	2004
FinFET SONOS flash memory for embedded applications P Xuan, M She, B Harteneck, A Liddle, J Bokor, TJ King IEEE International Electron Devices Meeting 2003, 26.4. 1-26.4. 4, 2003	102	2003
Electrical activation and electron spin coherence of ultralow dose antimony implants in silicon T Schenkel, JA Liddle, A Persaud, AM Tyryshkin, SA Lyon, R De Sousa, ... Applied Physics Letters 88 (11), 112101, 2006	96	2006
Magneto-optical observation of picosecond dynamics of single nanomagnets A Barman, S Wang, JD Maas, AR Hawkins, S Kwon, A Liddle, J Bokor, ... Nano letters 6 (12), 2939-2944, 2006	94	2006
Tuning magnetic domain structure in nanoscale La0. 7Sr0. 3MnO3 islands Y Takamura, RV Chopdekar, A Scholl, A Doran, JA Liddle, B Harteneck, ... Nano letters 6 (6), 1287-1291, 2006	92	2006
Nanoimaging with a compact extreme-ultraviolet laser G Vaschenko, F Brizuela, C Brewer, M Grisham, H Mancini, CS Menoni, ... Optics letters 30 (16), 2095-2097, 2005	91	2005
Methods to assess the impact of UV irradiation on the surface chemistry and structure of multiwall carbon nanotube epoxy nanocomposites EJ Petersen, T Lam, JM Gorham, KC Scott, CJ Long, D Stanley, R Sharma, ... Carbon 69, 194-205, 2014	87	2014
Implementation of an imprint damascene process for interconnect fabrication GM Schmid, MD Stewart, J Wetzel, F Palmieri, J Hao, Y Nishimura, K Jen, ... Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2006	85	2006

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