Machine vision based condition monitoring and fault diagnosis of machine tools using information from machined surface texture: A review Y Liu, L Guo, H Gao, Z You, Y Ye, B Zhang Mechanical Systems and Signal Processing 164, 108068, 2022 | 104 | 2022 |
YOLO-SLAM: A semantic SLAM system towards dynamic environment with geometric constraint W Wu, L Guo, H Gao, Z You, Y Liu, Z Chen Neural Computing and Applications, 1-16, 2022 | 83 | 2022 |
On-line milling cutter wear monitoring in a wide field-of-view camera Z You, H Gao, L Guo, Y Liu, J Li Wear 460, 203479, 2020 | 42 | 2020 |
A data-flow oriented deep ensemble learning method for real-time surface defect inspection Y Liu, H Gao, L Guo, A Qin, C Cai, Z You IEEE Transactions on Instrumentation and Measurement 69 (7), 4681-4691, 2019 | 32 | 2019 |
A fault pulse extraction and feature enhancement method for bearing fault diagnosis Z Chen, L Guo, H Gao, Y Yu, W Wu, Z You, X Dong Measurement 182, 109718, 2021 | 30 | 2021 |
FedCAE: a new federated learning framework for edge-cloud collaboration based machine fault diagnosis Y Yu, L Guo, H Gao, Y He, Z You, A Duan IEEE Transactions on Industrial Electronics, 2023 | 28 | 2023 |
Machine vision based adaptive online condition monitoring for milling cutter under spindle rotation Z You, H Gao, L Guo, Y Liu, J Li, C Li Mechanical Systems and Signal Processing 171, 108904, 2022 | 28 | 2022 |
Research on tool wear morphology and mechanism during turning nickel-based alloy GH4169 with PVD-TiAlN coated carbide tool J Liang, H Gao, S Xiang, L Chen, Z You, Y Lei Wear 508, 204468, 2022 | 24 | 2022 |
Research on automatic monitoring method of face milling cutter wear based on dynamic image sequence A Qin, L Guo, Z You, H Gao, X Wu, S Xiang The International Journal of Advanced Manufacturing Technology 110, 3365-3376, 2020 | 21 | 2020 |
Multiple Activation Functions and Data Augmentation-Based Lightweight Network for In Situ Tool Condition Monitoring Z You, H Gao, S Li, L Guo, Y Liu, J Li IEEE Transactions on Industrial Electronics 69 (12), 13656-13664, 2022 | 17 | 2022 |
Force measurement and support integrated device in hypersonic wind tunnel S Li, Z You, H Gao, Q Wang, G Wu, G Ma IEEE Transactions on Instrumentation and Measurement 71, 1-9, 2021 | 16 | 2021 |
Gcforest-based fault diagnosis method for rolling bearing Q Liu, H Gao, Z You, H Song, L Zhang 2018 Prognostics and System Health Management Conference (PHM-Chongqing …, 2018 | 14 | 2018 |
Adaptive detection of tool-workpiece contact for nanoscale tool setting based on multi-scale decomposition of force signal Z You, Y Meng, D Li, Z Zhang, M Ren, X Zhang, LM Zhu Mechanical Systems and Signal Processing 208, 111000, 2024 | 3 | 2024 |
Vision-based defect measurement of drilled CFRP composites using double-light imaging C Li, Y Lei, Z You, L Guo, E Zio, H Gao IEEE Transactions on Instrumentation and Measurement, 2023 | 3 | 2023 |
A novel evaluation metric based on dispersion of wear distance for in situ tool condition monitoring Z You, S Li, C Li, H Gao, L Guo, Y Liu IEEE Transactions on Instrumentation and Measurement 72, 1-10, 2022 | 3 | 2022 |
A Transfer Learning Based Method for Incipient Fault Detection C Li, L Guo, H Gao, J Yang, X Dong, Z You 2021 4th IEEE International Conference on Industrial Cyber-Physical Systems …, 2021 | 3 | 2021 |
Normalized Variational Auto-Encoder With the Adaptive Activation Function for Tool Setting in Ultraprecision Turning Z You, Y Meng, Z Zhang, M Ren, X Zhang, L Zhu IEEE Transactions on Industrial Informatics, 2023 | 2 | 2023 |
An improved UNet model based on adaptive activation function and squeeze-and-excitation module for milling tool wear segmentation C Cai, Z You, C Li, Y Sun, S Li, H Gao 2023 Prognostics and Health Management Conference (PHM), 272-277, 2023 | 1 | 2023 |
Tool Wear Prediction Based on Residual Connection and Temporal Networks Z Li, X Lei, Z You, T Huang, K Guo, D Li, H Liu Machines 12 (5), 306, 2024 | | 2024 |
SE-U-Lite: Milling Tool Wear Segmentation based on Lightweight U-Net Model with Squeeze-and-Excitation Module P Zhao, Z Li, Z You, Z Chen, T Huang, K Guo, D Li IEEE Transactions on Instrumentation and Measurement, 2024 | | 2024 |