| Estimating single-event logic cross sections in advanced technologies RC Harrington, JS Kauppila, KM Warren, YP Chen, JA Maharrey, ... IEEE Transactions on Nuclear Science 64 (8), 2115-2121, 2017 | 38 | 2017 |
| Effects of total-ionizing-dose irradiation on SEU-and SET-induced soft errors in bulk 40-nm sequential circuits RM Chen, ZJ Diggins, NN Mahatme, L Wang, EX Zhang, YP Chen, YN Liu, ... IEEE Transactions on Nuclear Science 64 (1), 471-476, 2016 | 25 | 2016 |
| Single-event transient induced harmonic errors in digitally controlled ring oscillators YP Chen, TD Loveless, P Maillard, NJ Gaspard, S Jagannathan, ... IEEE Transactions on Nuclear Science 61 (6), 3163-3170, 2014 | 21 | 2014 |
| Effects of temperature and supply voltage on SEU-and SET-induced errors in bulk 40-nm sequential circuits RM Chen, ZJ Diggins, NN Mahatme, L Wang, EX Zhang, YP Chen, ... IEEE Transactions on Nuclear Science 64 (8), 2122-2128, 2017 | 17 | 2017 |
| Test Methodology & Neutron Characterization of Xilinx 16nm Zynq® UltraScale+™ Multi-Processor System-on-Chip (MPSoC) P Maillard, J Arver, C Smith, O Ballan, MJ Hart, YP Chen 2018 IEEE Radiation Effects Data Workshop (REDW), 1-4, 2018 | 15 | 2018 |
| Persistent laser-induced leakage in a 20 nm charge-pump phase-locked loop (PLL) YP Chen, TD Loveless, AL Sternberg, EX Zhang, JS Kauppila, BL Bhuva, ... IEEE Transactions on Nuclear Science 64 (1), 512-518, 2016 | 11 | 2016 |
| Efficient mitigation of SET induced harmonic errors in ring oscillators J Agustin, ML Lopez-Vallejo, CG Soriano, P Cholbi, LW Massengill, ... IEEE transactions on nuclear science 62 (6), 3049-3056, 2015 | 11 | 2015 |
| Single-Event Evaluation of Xilinx 16nm UltraScale+™ Single Event Mitigation IP P Maillard, MJ Hart, P Chang, YP Chen, M Welter, R Le, R Ismail, J Barton, ... 2018 IEEE Radiation Effects Data Workshop (REDW), 1-5, 2018 | 10 | 2018 |
| Impact of temporal masking of flip-flop upsets on soft error rates of sequential circuits RM Chen, NN Mahatme, ZJ Diggins, L Wang, EX Zhang, YP Chen, YN Liu, ... IEEE Transactions on Nuclear Science 64 (8), 2098-2106, 2017 | 10 | 2017 |
| Single event latchup (sel) and single event upset (seu) evaluation of xilinx 7nm versal™ acap programmable logic (pl) P Maillard, YP Chen, J Barton, ML Voogel 2021 IEEE Radiation Effects Data Workshop (REDW), 1-6, 2021 | 9 | 2021 |
| Total Ionizing Dose and Single-Events characterization of Xilinx 20nm Kintex UltraScale™ P Maillard, J Barton, MJ Hart, YP Chen, ML Voogel 2019 19th European Conference on Radiation and Its Effects on Components and …, 2019 | 9 | 2019 |
| Time-domain modeling of all-digital PLLs to single-event upset perturbations YP Chen, LW Massengill, AL Sternberg, EX Zhang, JS Kauppila, M Yao, ... IEEE Transactions on Nuclear Science 65 (1), 311-317, 2017 | 9 | 2017 |
| Single-event characterization of bang-bang all-digital phase-locked loops (ADPLLs) YP Chen, LW Massengill, BL Bhuva, WT Holman, TD Loveless, ... IEEE Transactions on Nuclear Science 62 (6), 2650-2656, 2015 | 8 | 2015 |
| Radiation-Tolerant Deep Learning Processor Unit (DPU)-Based Platform Using Xilinx 20-nm Kintex UltraScale FPGA P Maillard, YP Chen, J Vidmar, N Fraser, G Gambardella, M Sawant, ... IEEE Transactions on Nuclear Science 70 (4), 714-721, 2022 | 6 | 2022 |
| Analysis of temporal masking effect on single-event upset rates for sequential circuits RM Chen, ZJ Diggins, NN Mahatme, L Wang, EX Zhang, YP Chen, YN Liu, ... 2016 16th European Conference on Radiation and Its Effects on Components and …, 2016 | 6 | 2016 |
| Probability of latching an SET in advanced technologies RC Quinn, JS Kauppila, KM Warren, YP Chen, BL Bhuva, M Bounasser, ... 2016 16th European Conference on Radiation and Its Effects on Components and …, 2016 | 5 | 2016 |
| Single-Event Upset Characterization of Common First-and Second-Order All-Digital Phase-Locked Loops YP Chen, LW Massengill, JS Kauppila, BL Bhuva, WT Holman, ... IEEE Transactions on Nuclear Science 64 (8), 2144-2151, 2017 | 4 | 2017 |
| Single-Event Upset Characterization of Common First-and Second-Order All-Digital Phase-Locked Loops YP Chen, LW Massengill, JS Kauppila, BL Bhuva, WT Holman, ... IEEE Transactions on Nuclear Science 64 (8), 2144-2151, 2017 | 4 | 2017 |
| 64MeV Proton single-event evaluation of Xilinx Single Event Mitigation (XilSEM) firmware on 7nm Versal™ ACAP devices YP Chen, P Maillard, RD Veggalam, SR Madem, E Crabill, J Barton, ... 2022 IEEE Radiation Effects Data Workshop (REDW)(in conjunction with 2022 …, 2022 | 3 | 2022 |
| 64 MeV proton single-event upset characterization of customer memory interface design on Xilinx XCKU040 FPGA YP Chen, P Maillard, M Hart, J Barton, J Schmitz, P Kyu 2017 IEEE Radiation Effects Data Workshop (REDW), 1-4, 2017 | 3 | 2017 |
