| Engineering Ferroelectric Hf0.5Zr0.5O2 Thin Films by Epitaxial Stress S Estandia, N Dix, J Gazquez, I Fina, J Lyu, MF Chisholm, J Fontcuberta, ... ACS Applied Electronic Materials 1 (8), 1449-1457, 2019 | 126 | 2019 |
| Growth Window of Ferroelectric Epitaxial Hf0.5Zr0.5O2 Thin Films J Lyu, I Fina, R Solanas, J Fontcuberta, F Sánchez ACS Applied Electronic Materials 1 (2), 220-228, 2019 | 99 | 2019 |
| Robust ferroelectricity in epitaxial Hf1/2Zr1/2O2 thin films J Lyu, I Fina, R Solanas, J Fontcuberta, F Sánchez Applied Physics Letters 113 (8), 2018 | 99 | 2018 |
| High polarization, endurance and retention in sub-5 nm Hf 0.5 Zr 0.5 O 2 films J Lyu, T Song, I Fina, F Sánchez Nanoscale 12 (20), 11280-11287, 2020 | 86 | 2020 |
| Enhanced ferroelectricity in epitaxial Hf0. 5Zr0. 5O2 thin films integrated with Si (001) using SrTiO3 templates J Lyu, I Fina, R Bachelet, G Saint-Girons, S Estandía, J Gázquez, ... Applied Physics Letters 114 (22), 2019 | 72 | 2019 |
| Epitaxial Integration on Si(001) of Ferroelectric Hf0.5Zr0.5O2 Capacitors with High Retention and Endurance J Lyu, I Fina, J Fontcuberta, F Sanchez ACS Applied Materials & Interfaces 11 (6), 6224-6229, 2019 | 59 | 2019 |
| Unraveling Ferroelectric Polarization and Ionic Contributions to Electroresistance in Epitaxial Hf0.5Zr0.5O2 Tunnel Junctions MC Sulzbach, S Estandía, X Long, J Lyu, N Dix, J Gàzquez, MF Chisholm, ... Advanced Electronic Materials 6 (1), 1900852, 2020 | 54 | 2020 |
| Tailoring Lattice Strain and Ferroelectric Polarization of Epitaxial BaTiO 3 Thin Films on Si (001) J Lyu, I Fina, R Solanas, J Fontcuberta, F Sánchez Scientific reports 8 (1), 495, 2018 | 54 | 2018 |
| Fatigue and retention in the growth window of ferroelectric Hf0. 5Zr0. 5O2 thin films J Lyu, I Fina, F Sánchez Applied Physics Letters 117 (7), 2020 | 28 | 2020 |
| Stabilization of the Ferroelectric Phase in Epitaxial Hf1–xZrxO2 Enabling Coexistence of Ferroelectric and Enhanced Piezoelectric Properties T Song, H Tan, N Dix, R Moalla, J Lyu, G Saint-Girons, R Bachelet, ... ACS Applied Electronic Materials 3 (5), 2106-2113, 2021 | 26 | 2021 |
| Control of Polar Orientation and Lattice Strain in Epitaxial BaTiO3 Films on Silicon J Lyu, S Estandía, J Gazquez, MF Chisholm, I Fina, N Dix, J Fontcuberta, ... ACS applied materials & interfaces 10 (30), 25529-25535, 2018 | 21 | 2018 |
| High-current pulsed electron treatment of hypoeutectic Al–10Si alloy L Diankun, G Bo, Z Guanglin, L Jike, H Liang High Temperature Materials and Processes 36 (1), 97-100, 2017 | 19 | 2017 |
| Optimization of microwave roasting for dechlorination of CuCl residue from zinc hydrometallurgy S Lu, S Sun, J Lv, G Tu, C Srinivasakannan, S Ju, J Peng Journal of Microwave Power and Electromagnetic Energy 48 (1), 61-70, 2014 | 9 | 2014 |
| ACS Appl. Electron. Mater. 1, 1449 (2019) S Estandía, N Dix, J Gazquez, I Fina, J Lyu, MF Chisholm, J Fontcuberta, ... | 9 | |
| Catalyst aggregate size effect on the mass transport properties of non-noble metal catalyst layers for PEMFC cathodes S Ünsal, M Bozzetti, YC Chen, R Girod, A Berger, JS Diercks, ... Journal of The Electrochemical Society 170 (7), 074502, 2023 | 8 | 2023 |
| Control of up-to-down/down-to-up light-induced ferroelectric polarization reversal H Tan, G Castro, J Lyu, P Loza-Alvarez, F Sánchez, J Fontcuberta, I Fina Materials horizons 9 (9), 2345-2352, 2022 | 7 | 2022 |
| Halo evolution of hypereutectic Al-17.5 Si alloy treated with high-current pulsed electron beam L Hu, B Gao, JK Lv, SC Sun, Y Hao, GF Tu Journal of Nanomaterials 16 (1), 247-247, 2015 | 7 | 2015 |
| A transversal approach to predict surface charge compensation in piezoelectric force microscopy H Tan, J Lyu, Y Sheng, P Machado, T Song, A Bhatnagar, M Coll, ... Applied Surface Science 607, 154991, 2023 | 6 | 2023 |
| ACS Appl. Electron. Mater. 1, 220 (2019) J Lyu, I Fina, R Solanas, J Fontcuberta, F Sánchez | 6 | |
| Weak ferromagnetism linked to the high-temperature spiral phase of J Lyu, M Morin, T Shang, MT Fernandez-Diaz, M Medarde Physical Review Research 4 (2), 023008, 2022 | 5 | 2022 |
Ignasi Fina MartínezICMAB-CSIC - Institut de Ciència de Materials de Barcelona, Campus UAB, Bellaterra 08193, BarcelonaVerified email at icmab.es
