‪Abdullahi Usman‬ - ‪Google Scholar‬

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Abdullahi Usman

Abdullahi Usman

King Mongkut's University of Technology Thonburi

Verified email at mail.kmutt.ac.th - Homepage

Optical Metrology Interferometric sensor and thin- film measurement


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Real-time double-layer thin film thickness measurements using modified Sagnac interferometer with polarization phase shifting approach A Usman, A Bhatranand, Y Jiraraksopakun, R Kaewon, C Pawong Photonics 8 (12), 529, 2021	8	2021
The comparison of multi-stepping algorithms for real-time thickness measurement of transparent thin films using polarization settings CPAB Abdullahi Usman, Yuttapong Jiraraksopakun, Rapeepan Kaewon Laser Physics 32 (12), 125401, 2022	3	2022
Thickness measurement of double layer transparent material using triangular path cyclic interferometer A Usman, A Bhatranand, Y Jiraraksopakun, R Kaewon, C Pawong 2021 9th International Electrical Engineering Congress (iEECON), 233-236, 2021	3	2021
Refractive Index Finding using Multiple Light Reflections with Modified Sagnac Interferometer C Usman, A., Bhatranand, A., Jiraraksopakun, Y., Kaewon, R. and Pawong The 2022 International Electrical Engineering Congress (iEECON2022), March 9 …, 2022		2022

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