| An effective method of probe calibration in phase-resolved near-field scanning for EMI application J Zhang, KW Kam, J Min, VV Khilkevich, D Pommerenke, J Fan IEEE transactions on instrumentation and measurement 62 (3), 648-658, 2012 | 122 | 2012 |
| Estimating radio-frequency interference to an antenna due to near-field coupling using decomposition method based on reciprocity H Wang, V Khilkevich, YJ Zhang, J Fan IEEE Transactions on Electromagnetic Compatibility 55 (6), 1125-1131, 2013 | 83 | 2013 |
| Radiated EMI estimation from DC–DC converters with attached cables based on terminal equivalent circuit modeling S Shinde, K Masuda, G Shen, A Patnaik, T Makharashvili, D Pommerenke, ... IEEE Transactions on Electromagnetic Compatibility 60 (6), 1769-1776, 2017 | 59 | 2017 |
| Emission source microscopy technique for EMI source localization P Maheshwari, H Kajbaf, VV Khilkevich, D Pommerenke IEEE Transactions on Electromagnetic Compatibility 58 (3), 729-737, 2016 | 55 | 2016 |
| Maximum radiated emissions evaluation for the heatsink/IC structure using the measured near electrical field G Shen, S Yang, J Sun, S Xu, DJ Pommerenke, VV Khilkevich IEEE Transactions on Electromagnetic Compatibility 59 (5), 1408-1414, 2017 | 45 | 2017 |
| Transfer function method for predicting the emissions in a CISPR-25 test-setup A Radchenko, VV Khilkevich, N Bondarenko, D Pommerenke, M Gonser, ... IEEE Transactions on Electromagnetic Compatibility 56 (4), 894-902, 2014 | 39 | 2014 |
| Measurement-based modeling and worst-case estimation of crosstalk inside an aircraft cable connector G Li, G Hess, R Hoeckele, S Davidson, P Jalbert, VV Khilkevich, ... IEEE Transactions on Electromagnetic Compatibility 57 (4), 827-835, 2014 | 30 | 2014 |
| Modeling absorbing materials for EMI mitigation Q Liu, X Jiao, J Li, V Khilkevich, J Drewniak, P Dixon, Y Arien 2015 IEEE International Symposium on Electromagnetic Compatibility (EMC …, 2015 | 28 | 2015 |
| Dielectric loss tangent extraction using modal measurements and 2-D cross-sectional analysis for multilayer PCBs S Yong, V Khilkevich, Y Liu, H Gao, S Hinaga, S De, D Padilla, ... IEEE Transactions on Electromagnetic Compatibility 62 (4), 1278-1292, 2020 | 27 | 2020 |
| Sparse emission source microscopy for rapid emission source imaging L Zhang, VV Khilkevich, X Jiao, X Li, S Toor, AU Bhobe, K Koo, ... IEEE Transactions on Electromagnetic Compatibility 59 (2), 729-738, 2017 | 27 | 2017 |
| Modeling strategy for EMI filters R He, Y Xu, S Walunj, S Yong, V Khilkevich, D Pommerenke, HL Aichele, ... IEEE Transactions on Electromagnetic Compatibility 62 (4), 1572-1581, 2020 | 26 | 2020 |
| Reduction of EMI due to common-mode currents using a surface-mount EBG-based filter Q Liu, S Connor, C Olivieri, F De Paulis, A Orlandi, MA Cracraft, ... IEEE Transactions on Electromagnetic Compatibility 58 (5), 1440-1447, 2016 | 26 | 2016 |
| Common-mode filters with interdigital fingers for harmonics suppression and lossy materials for broadband suppression Q Liu, G Li, V Khilkevich, D Pommerenke IEEE Transactions on Electromagnetic Compatibility 57 (6), 1740-1743, 2015 | 26 | 2015 |
| Mechanical magnetic field generator for communication in the ULF range H Rezaei, V Khilkevich, S Yong, DS Stutts, D Pommerenke IEEE Transactions on Antennas and Propagation 68 (3), 2332-2339, 2019 | 24 | 2019 |
| Phase-resolved near-field scan over random fields T Li, V Khilkevich, D Pommerenke IEEE Transactions on Electromagnetic Compatibility 58 (2), 506-511, 2016 | 24 | 2016 |
| Attenuation in extended structures coated with thin magneto-dielectric absorber layer M Koledintseva, AG Razmadze, AY Gafarov, VV Khilkevich, J Drewniak, ... Progress In Electromagnetics Research 118, 441-459, 2011 | 24 | 2011 |
| Passive intermodulation source localization based on emission source microscopy S Yong, S Yang, L Zhang, X Chen, DJ Pommerenke, V Khilkevich IEEE Transactions on Electromagnetic Compatibility 62 (1), 266-271, 2019 | 22 | 2019 |
| Comprehensive and practical way to look at far-end crosstalk for transmission lines with lossy conductor and dielectric S Yong, V Khilkevich, XD Cai, C Sui, B Sen, J Fan IEEE Transactions on Electromagnetic Compatibility 62 (2), 510-520, 2019 | 22 | 2019 |
| Application of emission source microscopy technique to EMI source localization above 5 GHz P Maheshwari, V Khilkevich, D Pommerenke, H Kajbaf, J Min 2014 IEEE International Symposium on Electromagnetic Compatibility (EMC), 7-11, 2014 | 22 | 2014 |
| Identification and visualization of coupling paths—Part I: Energy parcel and its trajectory H Li, VV Khilkevich, D Pommerenke IEEE transactions on electromagnetic compatibility 56 (3), 622-629, 2014 | 21 | 2014 |
