Restructured class of estimators for population mean using an auxiliary variable under simple random sampling scheme S Baghel, SK Yadav Journal of Applied Mathematics, Statistics and Informatics 16 (1), 61-75, 2020 | 9 | 2020 |
Upgraded family of estimators of population mean using known parameters of auxiliary and study variables SK Yadav, DK Sharma, S Baghel International Journal of Mathematical Modelling and Numerical Optimisation …, 2021 | 4 | 2021 |
Analysis of one-shot device testing data under logistic-exponential lifetime distribution with an application to SEER gallbladder cancer data S Baghel, S Mondal Applied Mathematical Modelling 126, 159-184, 2024 | 2 | 2024 |
Robust estimation of dependent competing risk model under interval monitoring and determining optimal inspection intervals S Mondal, S Baghel arXiv preprint arXiv:2210.05911, 2022 | 1 | 2022 |
A redefined class of ratio estimators using auxiliary information for the estimation of population mean under simple random sampling scheme SK Yadav, S Baghel Invest. Oper. 42, 279-293, 2021 | 1 | 2021 |
Robust estimation of dependent competing risk model under interval monitoring and determining optimal inspection intervals S Baghel, S Mondal Applied Stochastic Models in Business and Industry, 2024 | | 2024 |
Robust Inference of One-Shot Device testing data with Competing Risk under Lindley Lifetime Distribution with an application to SEER Pancreas Cancer Data S Baghel, S Mondal arXiv preprint arXiv:2307.12557, 2023 | | 2023 |
A remedy for enhanced estimation of population mean using exponential ratio-cum-product type estimator under non-response SK Yadav, DK Sharma, K Brown, S Baghel International Journal of Operational Research 46 (4), 550-570, 2023 | | 2023 |
One-Shot Device Testing Data Analysis under Logistic-Exponential Lifetimes with an Application to Murine model with Melioidosis Data S Baghela, S Mondalb arXiv preprint arXiv:2211.00315, 2022 | | 2022 |
Estimation of Average Paddy Production of Pira Nagar Village at Barabanki District in India SK Yadav, S Baghel, S Saxena, AK Singh Journal of Reliability and Statistical Studies, 127–148-127–148, 2020 | | 2020 |