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Teow Wee Teo
Teow Wee Teo
TT Vision, Universiti Sains Malaysia
Verified email at ttvision-tech.com
Title
Cited by
Cited by
Year
Solar cell micro-crack detection using localised texture analysis
TW Teo, MZ Abdullah
Journal of Image and Graphics 6 (1), 54-58, 2018
392018
In-line photoluminescence imaging of crystalline silicon solar cells for micro-crack detection
TW Teo, MZ Abdullah
2016 IEEE International Conference on Imaging Systems and Techniques (IST …, 2016
82016
Design of an imaging system for characterizing microcracks in crystalline silicon solar cells using light transflection
TW Teo, Z Mahdavipour, MZ Abdullah
IEEE Journal of Photovoltaics 9 (4), 1097-1104, 2019
72019
High-speed micro-crack detection of solar wafers with variable thickness
TW Teo, Z Mahdavipour, MZ Abdullah
2014 IEEE International Conference on Imaging Systems and Techniques (IST …, 2014
52014
Recent advancements in micro-crack inspection of crystalline silicon wafers and solar cells
TW Teo, Z Mahdavipour, MZ Abdullah
Measurement Science and Technology 31 (8), 081001, 2020
42020
In-line optical micro-crack detection system for solar wafers
Z Mahdavipour, TW Teo, MZ Abdullah
Transactions of the Institute of Measurement and Control 39 (5), 728-737, 2017
42017
Detection of oxygen precipitate dark rings in solar cell luminescence using gray level co-occurrence matrix
TW Teo, MZ Abdullah
9th International Conference on Robotic, Vision, Signal Processing and Power …, 2017
32017
Detection of microcracks and dark spots in monocrystalline PERC cells using photoluminescene imaging and YOLO-based CNN with spatial pyramid pooling
A Binomairah, A Abdullah, BE Khoo, Z Mahdavipour, TW Teo, NSM Noor, ...
EPJ Photovoltaics 13, 27, 2022
12022
Optical Setup for Solar Wafer Edge Chip Inspection
TL Lim, TW Teo, MZ Abdullah
9th International Conference on Robotic, Vision, Signal Processing and Power …, 2017
12017
Characterising micro-cracks in crystalline silicon solar cells using transelection imaging
TW Teo
2020
Tri-Surface Solar Wafer Edge Chipping Inspection
TL Lim, TW Teo, MZ Abdullah
Proceedings of the International Conference on Imaging, Signal Processing …, 2017
2017
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Articles 1–11