| Effect of surface treatments on ALD Al2O3/4H-SiC metal–oxide–semiconductor field-effect transistors IU Jayawardhena, RP Ramamurthy, D Morisette, AC Ahyi, R Thorpe, ... Journal of Applied Physics 129 (7), 2021 | 10 | 2021 |
| Effect of wafer orientation on near-interface oxide traps in 4H-SiC metal-oxide-semiconductor capacitors IU Jayawardhena, A Jayawardena, T Isaacs-smith, S Dhar Electrochemical Society Meeting Abstracts 233, 1441-1441, 2018 | 1 | 2018 |
| Silicon Carbide/Aluminum Oxide Field-Effect Transistors IU Jayawardhena Auburn University, 2020 | | 2020 |
| Characterization of Near-Interface Traps at Dielectric/SiC Interfaces Using CCDLTS I Jayawardhena, A Jayawardena, CK Jiao, D Morisette, S Dhar Materials Science Forum 963, 217-221, 2019 | | 2019 |
| Trap Characterization of ALD Al2O3/4H-SiC Metal-Oxide-Semiconductor Interfaces IU Jayawardhena, A Ahyi, T Isaacs-smith, RP Ramamurthy, D Morisette, ... Electrochemical Society Meeting Abstracts 236, 887-887, 2019 | | 2019 |
| Near-interface trap detection by CCDLTS I Jayawardhena | | |
