| Multiply charged thorium crystals for nuclear laser spectroscopy CJ Campbell, AV Steele, LR Churchill, MV DePalatis, DE Naylor, ... Physical review letters 102 (23), 233004, 2009 | 95 | 2009 |
| Cold atomic beam ion source for focused ion beam applications B Knuffman, AV Steele, JJ McClelland Journal of Applied Physics 114 (4), 2013 | 89 | 2013 |
| Bright focused ion beam sources based on laser-cooled atoms JJ McClelland, AV Steele, B Knuffman, KA Twedt, A Schwarzkopf, ... Applied physics reviews 3 (1), 2016 | 76 | 2016 |
| Photoionization and photoelectric loading of barium ion traps AV Steele, LR Churchill, PF Griffin, MS Chapman Physical Review A 75 (5), 053404, 2007 | 62 | 2007 |
| Nanoscale focused ion beam from laser-cooled lithium atoms B Knuffman, AV Steele, J Orloff, JJ McClelland New Journal of Physics 13 (10), 103035, 2011 | 54 | 2011 |
| Advances in source technology for focused ion beam instruments NS Smith, JA Notte, AV Steele MRS Bulletin 39 (4), 329-335, 2014 | 49 | 2014 |
| High-brightness Cs focused ion beam from a cold-atomic-beam ion source AV Steele, A Schwarzkopf, JJ McClelland, B Knuffman Nano futures 1 (1), 015005, 2017 | 31 | 2017 |
| Focused chromium ion beam AV Steele, B Knuffman, JJ McClelland, J Orloff Journal of Vacuum Science & Technology B 28 (6), C6F1-C6F5, 2010 | 28 | 2010 |
| Inter-ion coulomb interactions in a magneto-optical trap ion source AV Steele, B Knuffman, JJ McClelland Journal of Applied Physics 109 (10), 2011 | 21 | 2011 |
| Barium ion cavity QED and triply ionized thorium ion trapping AV Steele Georgia Institute of Technology, 2008 | 9 | 2008 |
| Integrated optical element and Faraday cup BJ Knuffman, AV Steele, JJ McClelland US Patent 8,350,556, 2013 | 5 | 2013 |
| Charged particle source from a photoionized cold atom beam AV Steele, BJ Knuffman, JJ McClelland US Patent 8,530,853, 2013 | 4 | 2013 |
| MOTIS: A Focused Ion Beam Source Based On Laser‐Cooled Atoms B Knuffman, AV Steele, J Orloff, M Maazouz, JJ McClelland AIP Conference Proceedings 1395 (1), 85-89, 2011 | 3 | 2011 |
| New Ion Source for High Precision FIB Nanomachining and Circuit Edit AV Steele, B Knuffman, JJ McClelland ISTFA 2014, 284-288, 2014 | 1 | 2014 |
| Alignment of an atom beam with an electric field in the production of a charged particle source JJ McClelland, BJ Knuffman, AV Steele US Patent 8,680,482, 2014 | 1 | 2014 |
| Direct deposit and removal of nanoscale conductors AV Steele, BJ Knuffman, JJ McClelland US Patent App. 13/252,613, 2012 | 1 | 2012 |
| Applications of the Cesium Low Temperature Ion Source A Steele, A Schwarzkopf, B Knuffman Microscopy and Microanalysis 27 (S1), 24-25, 2021 | | 2021 |
| Low-temperature ionization of metastable atoms emitted by an inductively coupled plasma ion source BJ Knuffman, AV Steele US Patent App. 16/764,968, 2020 | | 2020 |
| Resonant enhancement of photoionization of gaseous atoms BJ Knuffman, AV Steele US Patent 10,020,156, 2018 | | 2018 |
| Cold-Atom Ion Sources for Focused Ion Beam Applications JJ McClelland, WR McGehee, VP Oleshko, CL Soles, S Takeuchi, ... Microscopy and Microanalysis 23 (S1), 276-277, 2017 | | 2017 |
Jabez McclellandNISTVerified email at nist.gov
