Follow
Ana Gomes Silva
Ana Gomes Silva
Prof Dr. MSc. Eng. Physics. Universidade Nova de Lisboa
Verified email at fct.unl.pt - Homepage
Title
Cited by
Cited by
Year
Recent developments in surface science and engineering, thin films, nanoscience, biomaterials, plasma science, and vacuum technology
M Mozetič, A Vesel, G Primc, C Eisenmenger-Sittner, J Bauer, A Eder, ...
Thin solid films 660, 120-160, 2018
482018
Front passivation of Cu (In, Ga) Se2 solar cells using Al2O3: Culprits and benefits
MA Curado, JP Teixeira, M Monteiro, EFM Ribeiro, RC Vilão, HV Alberto, ...
Applied Materials Today 21, 100867, 2020
382020
Rear optical reflection and passivation using a nanopatterned metal/dielectric structure in thin-film solar cells
TS Lopes, JMV Cunha, S Bose, JRS Barbosa, J Borme, ...
IEEE Journal of Photovoltaics 9 (5), 1421-1427, 2019
332019
High‐Performance and Industrially Viable Nanostructured SiOx Layers for Interface Passivation in Thin Film Solar Cells
JMV Cunha, K Oliveira, J Lontchi, TS Lopes, MA Curado, JRS Barbosa, ...
Solar RRL 5 (3), 2000534, 2021
232021
Adsorption dynamics of water on the surface of TiO2 (110)
N Bundaleski, AG Silva, U Schröder, AMC Moutinho, O Teodoro
Journal of Physics: Conference Series 257 (1), 012008, 2010
232010
Engineering strain and conductivity of MoO3 by ion implantation
DR Pereira, C Díaz-Guerra, M Peres, S Magalhães, JG Correia, ...
Acta Materialia 169, 15-27, 2019
212019
Stability of photo-excited C60 chemisorbed on Ni (111)
C Kusch, B Winter, R Mitzner, AG Silva, EEB Campbell, IV Hertel
Chemical physics letters 275 (5-6), 469-476, 1997
201997
Influence of the patch field on work function measurements based on the secondary electron emission
N Bundaleski, J Trigueiro, AG Silva, AMC Moutinho, O Teodoro
Journal of Applied Physics 113 (18), 183720, 2013
192013
Encapsulation of nanostructures in a dielectric matrix providing optical enhancement in ultrathin solar cells
AJN Oliveira, J de Wild, K Oliveira, BA Valenca, JP Teixeira, ...
Solar RRL 4 (11), 2000310, 2020
172020
Novel approach to the semi‐empirical universal theory for secondary electron yield
N Bundaleski, BJ Shaw, AG Silva, AMC Moutinho, O Teodoro
Scanning 33 (4), 266-269, 2011
142011
Comparing artificial neural network algorithms for prediction of higher heating value for different types of biomass
O Jakšić, Z Jakšić, K Guha, AG Silva, NM Laskar
Soft Computing, 1-18, 2022
132022
Increase of secondary electron yield of amorphous carbon coatings under high vacuum conditions
A Santos, N Bundaleski, BJ Shaw, AG Silva, OMND Teodoro
Vacuum 98, 37-40, 2013
122013
Dynamics of water adsorption on TiO2 monitored by work function spectroscopy
AG Silva, N Bundaleski, AMC Moutinho, OMND Teodoro
Applied surface science 258 (6), 2006-2009, 2012
102012
Ordered Au (111) layers on Si (111)
A Silva, K Pedersen, L Diekhöner, P Morgen, Z Li
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 25 (4 …, 2007
92007
In Situ Characterization and Modification of β‐Ga2O3 Flakes Using an Ion Micro‐Probe
M Peres, LC Alves, F Rocha, N Catarino, C Cruz, E Alves, AG Silva, ...
physica status solidi (a) 215 (19), 1800190, 2018
82018
In Situ Characterization and Modification of β‐Ga2O3 Flakes Using an Ion Micro‐Probe
M Peres, LC Alves, F Rocha, N Catarino, C Cruz, E Alves, AG Silva, ...
physica status solidi (a) 215 (19), 1800190, 2018
82018
Oxidation of the surface of a thin amorphous silicon film
AG Silva, K Pedersen, ZS Li, P Morgen
Thin solid films 520 (2), 697-699, 2011
82011
Influence of the patch field on work function study using the onset method
J Trigueiro, N Bundaleski, AG Silva, OMND Teodoro
Vacuum 98, 41-44, 2013
72013
Adesão às medidas para prevenção da infecção da corrente sanguínea relacionada ao cateter venoso central. Enferm Foco [Internet]. 2017 [cited 2019 Mar 15]; 8 (2): 36-41
AG Silva, AC Oliveira
7
Electrical characterization of molybdenum oxide lamellar crystals irradiated with UV light and proton beams
DR Pereira, M Peres, LC Alves, JG Correia, C Díaz-Guerra, AG Silva, ...
Surface and Coatings Technology 355, 50-54, 2018
62018
The system can't perform the operation now. Try again later.
Articles 1–20