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Amit Kumar
Amit Kumar
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Title
Cited by
Cited by
Year
On the generation of compact deterministic test sets for BIST ready designs
A Kumar, J Rajski, SM Reddy, T Rinderknecht
2013 22nd Asian Test Symposium, 201-206, 2013
292013
Isometric test data compression
A Kumar, M Kassab, E Moghaddam, N Mukherjee, J Rajski, SM Reddy, ...
IEEE transactions on computer-aided design of integrated circuits and …, 2015
252015
Hyper-graph based partitioning to reduce DFT cost for pre-bond 3D-IC testing
A Kumar, SM Reddy, I Pomeranz, B Becker
2011 Design, Automation & Test in Europe, 1-6, 2011
142011
Isometric test compression with low toggling activity
A Kumar, M Kassab, E Moghaddam, N Mukherjee, J Rajski, SM Reddy, ...
2014 International Test Conference, 1-7, 2014
82014
On the generation of compact test sets
A Kumar, J Rajski, SM Reddy, C Wang
2013 IEEE International Test Conference (ITC), 1-10, 2013
52013
Isometric test compression with low toggling activity
J Rajski, A Kumar, MA Kassab, E Moghaddam, N Mukherjee, J Tyszer, ...
US Patent 9,651,622, 2017
42017
Performance aware partitioning for 3D-SOCs
A Kumar, SM Reddy, B Becker, I Pomeranz
2012 International SoC Design Conference (ISOCC), 163-166, 2012
42012
TSV and DFT cost aware circuit partitioning for 3D-SOCs
A Kumar, SM Reddy, I Pomeranz, B Becker
Thirteenth International Symposium on Quality Electronic Design (ISQED), 21-26, 2012
32012
An ECO technique for removing crosstalk violations in clock networks
A Kumar, K Chakrabarty, CR Mohan
20th International Conference on VLSI Design held jointly with 6th …, 2007
32007
Adaptive weight generation
H Jurgensen, A Kumar
Canadian Conference on Electrical and Computer Engineering, 2005., 1726-1730, 2005
22005
Compact Test Generation for Transition Faults
A Kumar
2020/6, International Journal of Advanced Research in Electrical …, 2020
2020
Generation of compact test sets and a design for the generation of tests with low switching activity
A Kumar
The University of Iowa, 2014
2014
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