On the generation of compact deterministic test sets for BIST ready designs A Kumar, J Rajski, SM Reddy, T Rinderknecht 2013 22nd Asian Test Symposium, 201-206, 2013 | 29 | 2013 |
Isometric test data compression A Kumar, M Kassab, E Moghaddam, N Mukherjee, J Rajski, SM Reddy, ... IEEE transactions on computer-aided design of integrated circuits and …, 2015 | 25 | 2015 |
Hyper-graph based partitioning to reduce DFT cost for pre-bond 3D-IC testing A Kumar, SM Reddy, I Pomeranz, B Becker 2011 Design, Automation & Test in Europe, 1-6, 2011 | 14 | 2011 |
Isometric test compression with low toggling activity A Kumar, M Kassab, E Moghaddam, N Mukherjee, J Rajski, SM Reddy, ... 2014 International Test Conference, 1-7, 2014 | 8 | 2014 |
On the generation of compact test sets A Kumar, J Rajski, SM Reddy, C Wang 2013 IEEE International Test Conference (ITC), 1-10, 2013 | 5 | 2013 |
Isometric test compression with low toggling activity J Rajski, A Kumar, MA Kassab, E Moghaddam, N Mukherjee, J Tyszer, ... US Patent 9,651,622, 2017 | 4 | 2017 |
Performance aware partitioning for 3D-SOCs A Kumar, SM Reddy, B Becker, I Pomeranz 2012 International SoC Design Conference (ISOCC), 163-166, 2012 | 4 | 2012 |
TSV and DFT cost aware circuit partitioning for 3D-SOCs A Kumar, SM Reddy, I Pomeranz, B Becker Thirteenth International Symposium on Quality Electronic Design (ISQED), 21-26, 2012 | 3 | 2012 |
An ECO technique for removing crosstalk violations in clock networks A Kumar, K Chakrabarty, CR Mohan 20th International Conference on VLSI Design held jointly with 6th …, 2007 | 3 | 2007 |
Adaptive weight generation H Jurgensen, A Kumar Canadian Conference on Electrical and Computer Engineering, 2005., 1726-1730, 2005 | 2 | 2005 |
Compact Test Generation for Transition Faults A Kumar 2020/6, International Journal of Advanced Research in Electrical …, 2020 | | 2020 |
Generation of compact test sets and a design for the generation of tests with low switching activity A Kumar The University of Iowa, 2014 | | 2014 |