| Method and system for optimizing operation of a pump PJ Magoon, RA Ramirez, JM Braggin US Patent 8,727,744, 2014 | 27 | 2014 |
| Analysis of the effect of point-of-use filtration on microbridging defectivity J Braggin, R Gronheid, S Cheng, D Van Den Heuvel, S Bernard, ... Advances in Resist Materials and Processing Technology XXVI 7273, 229-238, 2009 | 12 | 2009 |
| Method and system for pump priming JM Braggin, S Inui, W Chow, A Wu US Patent 9,297,374, 2016 | 8 | 2016 |
| Customizable dispense system with smart controller J Cedrone, I Gashgaee, PJ Magoon, JM Braggin, GL Gonnella, JO Vail US Patent App. 13/805,601, 2013 | 6 | 2013 |
| A review of retention efficiency measurement techniques for sub-30 nm liquid filtration S Liu, H Zhang, J Braggin Solid State Technology 55 (8), 27-30, 2012 | 6 | 2012 |
| Defect performance of a 2X node resist with a revolutionary point-of-use filter J Braggin, R Ramirez, A Wu, W Choi, I Funahshi, K Yamamoto Advances in Resist Materials and Processing Technology XXVII 7639, 432-439, 2010 | 5 | 2010 |
| Impact of using filtration on global and local uniformity of spin on glue materials S Bernard, RA Miller, V Pepper, J Braggin, FFC Duval Micromachining and Microfabrication Process Technology XVI 7926, 99-107, 2011 | 4 | 2011 |
| Lithography cost savings through resist reduction and monitoring program T Couteau, S Lindauer, C Stewart, J Braggin, B Bjornberg 2011 IEEE/SEMI Advanced Semiconductor Manufacturing Conference, 1-4, 2011 | 3 | 2011 |
| Point-of-use filtration methods to reduce defectivity J Braggin, W Schoallert, K Hoshiko, X Buch Advances in Resist Materials and Processing Technology XXVII 7639, 388-396, 2010 | 3 | 2010 |
| Preventing Lithography-Induced Maverick Yield Events With A Dispense System Advanced Equipment Control Method J Braggin 2008 IEEE/SEMI Advanced Semiconductor Manufacturing Conference, 31-36, 2008 | 3 | 2008 |
| Strategy for yield improvement with sub-10nm photochemical filtration J Braggin, C Brodsky, M Linnane, P Klymko Advances in Resist Materials and Processing Technology XXX 8682, 551-557, 2013 | 2 | 2013 |
| Characterization of filter performance on contact-hole defectivity J Braggin, N Vitorino, V Monreal, J Zook Advances in Resist Materials and Processing Technology XXVIII 7972, 820-829, 2011 | 2 | 2011 |
| Improving material-specific dispense processes for low-defect coatings N Brakensiek, J Braggin, J Berron, R Ramirez, K Anderson, B Smith Advances in Resist Materials and Processing Technology XXVIII 7972, 830-836, 2011 | 2 | 2011 |
| IMPROVING ADVANCED LITHOGRAPHY PROCESS DEFECTIVITY WITH A HIGHLY RETENTIVE 5 NM ASYMMETRIC UPE FILTER A Wu, J Braggin Application Note Entegris Inc, 2009 | 2 | 2009 |
| Addressing Weak Links in Automotive Reliability Semiconductor Contamination Control, Inspection and Test A Aal, J Braggin, A Amade, M Puttock 2020 IEEE International Integrated Reliability Workshop (IIRW), 1-4, 2020 | 1 | 2020 |
| Expanding the lithographer's toolkit to reduce variability: filtration considerations V Goel, A Wu, J Braggin Advances in Patterning Materials and Processes XXXVI 10960, 133-143, 2019 | 1 | 2019 |
| Characterization of the CIGS Solar Cell System in the FIB-SEM Laboratory F Pérez-Willard, J Braggin, TM Friedlmeier Microscopy and Microanalysis 24 (S1), 848-849, 2018 | 1 | 2018 |
| Further analysis of the effect of point-of-use filtration on microbridging defectivity J Braggin, R Gronheid, S Cheng, D Van den Heuvel, S Bernard, ... Advances in Resist Materials and Processing Technology XXVII 7639, 379-387, 2010 | 1 | 2010 |
| Method and system for optimizing operation of a pump PJ Magoon, RA Ramirez, JM Braggin | | 2019 |
| Guest Editorial Special Section on the 2015 SEMI Advanced Semiconductor Manufacturing Conference P Werbaneth, J Braggin, E Eisenbraun, S Radloff, C Weber IEEE Transactions on Semiconductor Manufacturing 29 (4), 271-274, 2016 | | 2016 |
