| System and method for distributed computer automotive service equipment SW Rogers, GM Gill, J De Belleuille, MJ Kling III, ML Baird US Patent 6,405,111, 2002 | 159 | 2002 |
| Distributed vehicle service method and system SW Rogers, GM Gill, J De Bellefeuille, M Kling, ML Baird US Patent 7,917,259, 2011 | 108* | 2011 |
| Light scanning system for measurement of orientation and physical features of a workpiece EA Downing, SW Rogers, R Titsworth, DJ Christian, ML Baird US Patent 5,054,918, 1991 | 105 | 1991 |
| Network-based method and system for distributing data A Carroll, B McAuliffe, J Gibbs, B O'sullivan, MJ Kling III, GM Gill, ML Baird, ... US Patent 6,859,699, 2005 | 101 | 2005 |
| Computerized automotive service system J De Bellefeuille, SW Rogers, GM Gill, MJ Kling III, ML Baird, AD Casby, ... US Patent 6,285,932, 2001 | 90 | 2001 |
| Sight-1: A computer vision system for automated IC chip manufacture ML Baird IEEE Trans. on SMC 8 (2), 133-139, 1979 | 84 | 1979 |
| System and method for distributed computer automotive service equipment ML Baird, J De Belleuille, GM Gill, MJ Kling III, SW Rogers US Patent 6,564,128, 2003 | 60 | 2003 |
| Method for conducting vehicle diagnostic analyses using distributed structure ML Baird, J De Belleuille, GM Gill, MJ Kling III, SW Rogers US Patent 6,560,516, 2003 | 52 | 2003 |
| An application of computer vision to automated IC chip manufacture ML Baird Proc. 3rd Int. Jt. Conf. on Pattern Recognition, 3-7, 1976 | 32 | 1976 |
| Image Segmentation Technique for Locating Automotive Parts on Belt Conveyors. ML Baird IJCAI, 694-695, 1977 | 30 | 1977 |
| A paradigm for semantic picture recognition ML Baird Proceedings of the ACM annual conference, 430.6-431, 1973 | 26 | 1973 |
| A computer vision data base for the industrial bin of parts problem ML Baird GM Research Publication GMR-2502, GM Research Laboratories 977, 1977 | 21 | 1977 |
| GAGESIGHT: A computer vision system for automatic inspection of instrument gauges ML Baird IEEE Transactions on Pattern Analysis and Machine Intelligence, 618-621, 1983 | 14 | 1983 |
| EYESEE: a machine vision system for inspection of integrated circuit chips M Baird Proceedings. 1985 IEEE International Conference on Robotics and Automation 2 …, 1985 | 10 | 1985 |
| Sequential Image Enhancement Technique for Locating Automotive Parts on Conveyor Belts ML Baird Research Laboratories, General Motors Corporation, 1976 | 9 | 1976 |
| Extending the limits of pattern inspection using machine vision ML Baird, R Brauner, HK Hu, TK Herms Optical Microlithography IV 538, 130-137, 1985 | 7 | 1985 |
| Recognizing objects by rules of inference on sequentially thresholded gray-level pictures ML Baird, MD Kelly Computer Graphics and Image Processing 3 (1), 1-22, 1974 | 7 | 1974 |
| EYESEE tm: A Computer Vision System For Inspection Of Integrated Circuits ML Baird Optical Microlithography III: Technology for the Next Decade 470, 261-267, 1984 | 4 | 1984 |
| GM research labs' machine perception project ML Baird, JT Olsztyn, WA Perkins, L Rossol ACM SIGART Bulletin, 12-13, 1975 | 3 | 1975 |
| Relational models for object location ML Baird ACM SIGART Bulletin, 13-14, 1975 | 1 | 1975 |
