| Why is anatase a better photocatalyst than rutile? - Model studies on epitaxial TiO2 films T Luttrell, S Halpegamage, J Tao, A Kramer, E Sutter, M Batzill Scientific reports 4 (1), 4043, 2014 | 1613 | 2014 |
| Band Alignment of ScxAl1–xN/GaN Heterojunctions EN Jin, MT Hardy, AL Mock, JL Lyons, AR Kramer, MJ Tadjer, N Nepal, ... ACS Applied Materials & Interfaces 12 (46), 52192-52200, 2020 | 28 | 2020 |
| Molecular beam epitaxy of transition metal nitrides for superconducting device applications DS Katzer, N Nepal, MT Hardy, BP Downey, DF Storm, EN Jin, R Yan, ... physica status solidi (a) 217 (3), 1900675, 2020 | 26 | 2020 |
| Comparison of surface structures of corundum Cr2O3 (0 0 0 1) and V2O3 (0 0 0 1) ultrathin films by x-ray photoelectron diffraction A Kramer, L Bignardi, P Lacovig, S Lizzit, M Batzill Journal Of Physics: Condensed Matter 30 (7), 074002, 2018 | 13 | 2018 |
| Epitaxial corundum-VTiO3 thin films grown on c-cut sapphire A Kramer, E Sutter, D Su, M Batzill Thin Solid Films 631, 85-92, 2017 | 7 | 2017 |
| An Ordered Mixed Oxide Monolayer Formed by Iron Segregation on Rutile-TiO2(011): Structural Determination by X-ray Photoelectron Diffraction S Halpegamage, L Bignardi, P Lacovig, A Kramer, ZH Wen, XQ Gong, ... The Journal of Physical Chemistry C 120 (46), 26414-26424, 2016 | 7 | 2016 |
| A first-principles study of stability of surface confined mixed metal oxides with corundum structure (Fe 2 O 3, Cr 2 O 3, V 2 O 3) ASM Jonayat, A Kramer, L Bignardi, P Lacovig, S Lizzit, ACT Van Duin, ... Physical Chemistry Chemical Physics 20 (10), 7073-7081, 2018 | 6 | 2018 |
| Oxidation of palladium on Au (111) and ZnO (0001) supports J Lallo, SA Tenney, A Kramer, P Sutter, M Batzill The Journal of Chemical Physics 141 (15), 2014 | 6 | 2014 |
| Measurement of organic/polymer material by phase modulation ellipsometry Y Ji, E Teboul, AR Kramer Organic Photonic Materials and Devices VI 5351, 69-76, 2004 | 1 | 2004 |
| A self-referenced interferometer for in situ cryogenic wafer curvature measurements MH Samuels, AR Kramer, CJK Richardson Review of Scientific Instruments 95 (4), 2024 | | 2024 |
| Thermo-optic characterization of SU-8 at cryogenic temperature T Chakraborty, OAJ Gordillo, M Barrow, AR Kramer, M Lipson, TE Murphy, ... Optical Materials Express 14 (2), 435-444, 2024 | | 2024 |
| Characterization of PAMBE grown TiN/AlN/TiN Josephson junctions N Grabon, A Thomas, A Kramer, C Richardson APS March Meeting Abstracts 2022, A41. 007, 2022 | | 2022 |
| Growth of PAMBE grown TiN//AlN//TiN Josephson junctions A Thomas, A Kramer, N Grabon, C Richardson APS March Meeting Abstracts 2022, A41. 006, 2022 | | 2022 |
| PAMBE grown NbTiN-AlN-NbTiN Josephson junction heterostructures for superconducting quantum circuits C Richardson, A Thomas, A Alexander, C Weddle, A Kramer, M Olszta, ... Bulletin of the American Physical Society 65, 2020 | | 2020 |
| Surfaces and Epitaxial Films of Corundum-Structured Mixed Metal Oxides AR Kramer University of South Florida, 2017 | | 2017 |
| An Optical Sensor for Real-Time In situ Endpoint Monitoring During Dry Etching of Multi-stack Layers E Teboul, Y Ji, A Kramer, P Amary, R Benherhat, HJ Yvon Society of Vacuum Coaters 48 th Annual Technical Conference Proceedings, 34-38, 2005 | | 2005 |
| Organic Light Emitting Diode Thin Film Structure Characterization by Phase Modulated Spectroscopic Ellipsometry A Kramer, Y Ji, E Teboul, M Stchakovsy, C Marchand, M Gaillet PROCEEDINGS OF THE ANNUAL TECHNICAL CONFERENCE-SOCIETY OF VACUUM COATERS 48, 153, 2005 | | 2005 |
| Coherent Modeling and Measurement of Anisotropic Multilayer Stack using Conventional Ellipsometry Applications H Touir, M Stchakovsky, R Ossikovski, M Warenghem, A Kramer Society of Vacuum Coaters 48 th Annual Technical Conference Proceedings, 345-349, 2005 | | 2005 |
| Characterization of C70 doped poly (styrene)–b-poly (hexyl methacrylate)(PS-PHMA) thin film on c–Si substrate with a Jobin Yvon UVISEL phase-modulated spectroscopic … AR Kramer, N Yao, V Pelletier Advances in Thin Film Coatings for Optical Applications 5527, 116-123, 2004 | | 2004 |
| Characterization of Single Wall Carbon Nanotube (SWCNT) bundles using Jobin Yvon UVISEL Phase modulated Spectroscopic Ellipsometer (PMSE). A Kramer APS March Meeting Abstracts 2004, Y17. 005, 2004 | | 2004 |
