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Andriy Miranskyy
Andriy Miranskyy
Toronto Metropolitan University (formerly Ryerson University)
Verified email at torontomu.ca - Homepage
Title
Cited by
Cited by
Year
Operational-Log Analysis for Big Data Systems: Challenges and Solutions
A Miranskyy, A Hamou-Lhadj, E Cialini, A Larsson
IEEE Software 33 (2), 52-59, 2016
782016
Big picture of big data software engineering: with example research challenges
NH Madhavji, A Miranskyy, K Kontogiannis
2015 IEEE/ACM 1st International Workshop on Big Data Software Engineering, 11-14, 2015
732015
Logchain: Blockchain-assisted Log Storage
W Pourmajidi, A Miranskyy
2018 IEEE 11th International Conference on Cloud Computing (CLOUD), 978-982, 2018
682018
On the use of hidden markov model to predict the time to fix bugs
M Habayeb, SS Murtaza, A Miranskyy, AB Bener
IEEE Transactions on Software Engineering 44 (12), 1224-1244, 2017
542017
On testing quantum programs
A Miranskyy, L Zhang
2019 IEEE/ACM 41st International Conference on Software Engineering: New …, 2019
392019
Using entropy measures for comparison of software traces
AV Miranskyy, M Davison, RM Reesor, SS Murtaza
Information Sciences 203, 59-72, 2012
382012
Is Your Quantum Program Bug-Free?
A Miranskyy, L Zhang, J Doliskani
arXiv preprint arXiv:2001.10870, 2020
352020
Merits of Organizational Metrics in Defect Prediction: An Industrial Replication
B Caglayan, B Turhan, A Bener, M Habayeb, A Miransky, E Cialini
Software Engineering (ICSE), 2015 IEEE/ACM 37th IEEE International …, 2015
342015
On Usefulness of the Deep-Learning-Based Bug Localization Models to Practitioners
S Polisetty, A Miranskyy, A Başar
Proceedings of the Fifteenth International Conference on Predictive Models …, 2019
302019
On Challenges of Cloud Monitoring
W Pourmajidi, J Steinbacher, T Erwin, A Miranskyy
Proceedings of the 27th Annual International Conference on Computer Science …, 2017
302017
Predicting defective modules in different test phases
B Caglayan, AT Misirli, AB Bener, A Miranskyy
Software Quality Journal, 1-23, 2014
282014
Usage of multiple prediction models based on defect categories
B Caglayan, A Tosun, A Miranskyy, A Bener, N Ruffolo
Proceedings of the 6th International Conference on Predictive Models in …, 2010
282010
On automatic detection of performance bugs
S Tsakiltsidis, A Miranskyy, E Mazzawi
2016 IEEE international symposium on software reliability engineering …, 2016
272016
Green software
AB Bener, M Morisio, A Miranskyy
Ieee Software 31 (3), 36-39, 2014
272014
Anomaly detection in a large-scale cloud platform
MS Islam, W Pourmajidi, L Zhang, J Steinbacher, T Erwin, A Miranskyy
2021 IEEE/ACM 43rd International Conference on Software Engineering …, 2021
252021
Different strokes for different folks: A case study on software metrics for different defect categories
AT Mısırlı, B Çağlayan, AV Miranskyy, A Bener, N Ruffolo
Proceedings of the 2nd International Workshop on Emerging Trends in Software …, 2011
252011
Computer software test coverage analysis
M Davison, MS Gittens, DR Godwin, NH Madhavji, AV Miranskyy, ...
US Patent 7,793,267, 2010
252010
Characteristics of multiple-component defects and architectural hotspots: a large system case study
Z Li, NH Madhavji, SS Murtaza, M Gittens, AV Miranskyy, D Godwin, ...
Empirical Software Engineering 16, 667-702, 2011
242011
Emergence of developer teams in the collaboration network
B Caglayan, AB Bener, A Miranskyy
2013 6th International Workshop on Cooperative and Human Aspects of Software …, 2013
232013
On Testing and Debugging Quantum Software
A Miranskyy, L Zhang, J Doliskani
arXiv preprint arXiv:2103.09172, 2021
212021
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