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Rameez Raja Shaik
Rameez Raja Shaik
Penn State University
Verified email at ieee.org - Homepage
Title
Cited by
Cited by
Year
Label free DNA detection techniques using dielectric modulated FET: inversion or tunneling?
R Priyanka, L Chandrasekar, RR Shaik, KP Pradhan
IEEE Sensors Journal 21 (2), 2316-2323, 2020
142020
Back-gate bias effect on the linearity of pocket doped FDSOI MOSFET
RR Shaik, L Chandrasekar, JP Raskin, KP Pradhan
Microelectronics Journal, 105365, 2022
92022
Impact of unpreventable induced interface trapped charges on HZO based FDSOI NCFET
VR Seshu, RR Shaik, KP Pradhan
Microelectronics Reliability 139, 114748, 2022
82022
Investigation on performance degradation due to induced interface trapped charges on HSO based FDSOI NCFET and sustaining it through back-gate bias
RR Shaik, KP Pradhan
Semiconductor Science and Technology, 2022
5*2022
Investigation of temperature variation on a HSO ferroelectric FDSOI NCFET
RR Shaik, KP Pradhan
2021 IEEE 16th Nanotechnology Materials and Devices Conference (NMDC), 1-4, 2021
52021
Is accumulation or inversion mode dielectric modulated FET better for label-free biosensing?: A comparative investigation
A Sariki, KV Rao, L Chandrasekar, RR Shaik, KP Pradhan
AEU-International Journal of Electronics and Communications 137, 153791, 2021
52021
A study of workfunction variation in pocket doped fd-soi technology towards temperature analysis
RR Shaik, G Arun, L Chandrasekar, KP Pradhan
Silicon 12 (12), 3047-3056, 2020
52020
A Robust-Compact Model to Emulate Neuro-Mimetic Dynamics With Doped-HfO2 Ferroelectric-FET Based Neurons
RR Shaik, L Chandrasekar, KP Pradhan
IEEE Transactions on Nanotechnology 22, 178-183, 2023
42023
Impact of HZO and HSO thin film ferroelectric on FDSOI NCFET
RR Shaik, KP Pradhan
2021 IEEE 21st International Conference on Nanotechnology (NANO), 126-129, 2021
42021
Investigation on Impact of Doped HfO Thin Film Ferro-Dielectrics on FDSOI NCFET Under Back-Gate Bias Influence
RR Shaik, KP Pradhan
IEEE Transactions on Nanotechnology 22, 14-19, 2022
32022
An optimized ge pocket soi jlt with efforts to improve the self-heating effect: Doping & materials perspective
VP Ammina, SP Vankudothu, RR Shaik, KP Pradhan
Silicon 12 (9), 2229-2239, 2020
32020
An Analytical Model to Emulate the Biological Synapses Using B or N Substitution Doped Graphene FET With Hysteresis Engineering
L Chandrasekar, RR Shaik, V Rajakumari, KP Pradhan
2022 IEEE International Conference on Emerging Electronics (ICEE), 1-4, 2022
22022
A Robust-Compact Model to Imitate the Neuronal Dynamics with 2T based FeFET-MOSFET Capturing Temperature Effects
RR Shaik, L Chandrasekar, V Rajakumari, KP Pradhan
2022 IEEE International Conference on Emerging Electronics (ICEE), 1-5, 2022
12022
A recurrence model capturing interface traps for non-zero bandgap GFETs towards dynamic mimicking of synaptic plasticity
L Chandrasekar, RR Shaik, V Rajakumari, KP Pradhan
Semiconductor Science and Technology 39 (5), 055011, 2024
2024
Novel Ferro-Oxide-Nitride-Oxide-Semiconductor (FONOS) FDSOI FET Towards Memory and Synaptic Applications
RR Shaik, KP Pradhan
2023 IEEE 23rd International Conference on Nanotechnology (NANO), 476-480, 2023
2023
RF Linearity/Non-Linearity FoMs of FDSOI NCFET in presence of interface trap charges
VR Seshu, RR Shaik, V Rajakumari, KP Pradhan
2022 IEEE 19th India Council International Conference (INDICON), 1-5, 2022
2022
Effect of Temperature on Performance of HZO-Based FD-SOI NCFET
VR Seshu, RR Shaik, KP Pradhan
2021 Joint International EUROSOI Workshop and International Conference on …, 2021
2021
Linearity Behavior of a Pocket Doped p-type Ground Plane FDSOI: Impact of Back Biasing
RR Shaik, KP Pradhan
2020 5th IEEE International Conference on Emerging Electronics (ICEE), 1-4, 2020
2020
Electrically Modified SOI Structure to Reduce the Leakage
RR Shaik, G Arun, KP Pradhan
2018 15th IEEE India Council International Conference (INDICON), 1-4, 2018
2018
Impact of unpreventable interface trap charges on HZO based FDSOI NCFET
VR Seshu, RR Shaik, KP Pradhan
space 14, 17, 0
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