Label free DNA detection techniques using dielectric modulated FET: inversion or tunneling? R Priyanka, L Chandrasekar, RR Shaik, KP Pradhan IEEE Sensors Journal 21 (2), 2316-2323, 2020 | 14 | 2020 |
Back-gate bias effect on the linearity of pocket doped FDSOI MOSFET RR Shaik, L Chandrasekar, JP Raskin, KP Pradhan Microelectronics Journal, 105365, 2022 | 9 | 2022 |
Impact of unpreventable induced interface trapped charges on HZO based FDSOI NCFET VR Seshu, RR Shaik, KP Pradhan Microelectronics Reliability 139, 114748, 2022 | 8 | 2022 |
Investigation on performance degradation due to induced interface trapped charges on HSO based FDSOI NCFET and sustaining it through back-gate bias RR Shaik, KP Pradhan Semiconductor Science and Technology, 2022 | 5* | 2022 |
Investigation of temperature variation on a HSO ferroelectric FDSOI NCFET RR Shaik, KP Pradhan 2021 IEEE 16th Nanotechnology Materials and Devices Conference (NMDC), 1-4, 2021 | 5 | 2021 |
Is accumulation or inversion mode dielectric modulated FET better for label-free biosensing?: A comparative investigation A Sariki, KV Rao, L Chandrasekar, RR Shaik, KP Pradhan AEU-International Journal of Electronics and Communications 137, 153791, 2021 | 5 | 2021 |
A study of workfunction variation in pocket doped fd-soi technology towards temperature analysis RR Shaik, G Arun, L Chandrasekar, KP Pradhan Silicon 12 (12), 3047-3056, 2020 | 5 | 2020 |
A Robust-Compact Model to Emulate Neuro-Mimetic Dynamics With Doped-HfO2 Ferroelectric-FET Based Neurons RR Shaik, L Chandrasekar, KP Pradhan IEEE Transactions on Nanotechnology 22, 178-183, 2023 | 4 | 2023 |
Impact of HZO and HSO thin film ferroelectric on FDSOI NCFET RR Shaik, KP Pradhan 2021 IEEE 21st International Conference on Nanotechnology (NANO), 126-129, 2021 | 4 | 2021 |
Investigation on Impact of Doped HfO Thin Film Ferro-Dielectrics on FDSOI NCFET Under Back-Gate Bias Influence RR Shaik, KP Pradhan IEEE Transactions on Nanotechnology 22, 14-19, 2022 | 3 | 2022 |
An optimized ge pocket soi jlt with efforts to improve the self-heating effect: Doping & materials perspective VP Ammina, SP Vankudothu, RR Shaik, KP Pradhan Silicon 12 (9), 2229-2239, 2020 | 3 | 2020 |
An Analytical Model to Emulate the Biological Synapses Using B or N Substitution Doped Graphene FET With Hysteresis Engineering L Chandrasekar, RR Shaik, V Rajakumari, KP Pradhan 2022 IEEE International Conference on Emerging Electronics (ICEE), 1-4, 2022 | 2 | 2022 |
A Robust-Compact Model to Imitate the Neuronal Dynamics with 2T based FeFET-MOSFET Capturing Temperature Effects RR Shaik, L Chandrasekar, V Rajakumari, KP Pradhan 2022 IEEE International Conference on Emerging Electronics (ICEE), 1-5, 2022 | 1 | 2022 |
A recurrence model capturing interface traps for non-zero bandgap GFETs towards dynamic mimicking of synaptic plasticity L Chandrasekar, RR Shaik, V Rajakumari, KP Pradhan Semiconductor Science and Technology 39 (5), 055011, 2024 | | 2024 |
Novel Ferro-Oxide-Nitride-Oxide-Semiconductor (FONOS) FDSOI FET Towards Memory and Synaptic Applications RR Shaik, KP Pradhan 2023 IEEE 23rd International Conference on Nanotechnology (NANO), 476-480, 2023 | | 2023 |
RF Linearity/Non-Linearity FoMs of FDSOI NCFET in presence of interface trap charges VR Seshu, RR Shaik, V Rajakumari, KP Pradhan 2022 IEEE 19th India Council International Conference (INDICON), 1-5, 2022 | | 2022 |
Effect of Temperature on Performance of HZO-Based FD-SOI NCFET VR Seshu, RR Shaik, KP Pradhan 2021 Joint International EUROSOI Workshop and International Conference on …, 2021 | | 2021 |
Linearity Behavior of a Pocket Doped p-type Ground Plane FDSOI: Impact of Back Biasing RR Shaik, KP Pradhan 2020 5th IEEE International Conference on Emerging Electronics (ICEE), 1-4, 2020 | | 2020 |
Electrically Modified SOI Structure to Reduce the Leakage RR Shaik, G Arun, KP Pradhan 2018 15th IEEE India Council International Conference (INDICON), 1-4, 2018 | | 2018 |
Impact of unpreventable interface trap charges on HZO based FDSOI NCFET VR Seshu, RR Shaik, KP Pradhan space 14, 17, 0 | | |