| Software-based self-testing of embedded processors N Kranitis, A Paschalis, D Gizopoulos, G Xenoulis IEEE Transactions on Computers 54 (4), 461 - 475, 2005 | 268 | 2005 |
| Processor design: system-on-chip computing for ASICs and FPGAs J Nurmi Springer Science & Business Media, 2007 | 115 | 2007 |
| Low power/energy BIST scheme for datapaths D Gizopoulos, N Krantitis, A Paschalis, M Psarakis, Y Zorian Proceedings 18th IEEE VLSI Test Symposium, 23-28, 2000 | 87 | 2000 |
| Hybrid-SBST methodology for efficient testing of processor cores N Kranitis, A Merentitis, G Theodorou, A Paschalis, D Gizopoulos IEEE Design & Test of Computers 25 (1), 64-75, 2008 | 86 | 2008 |
| Instruction-based self-testing of processor cores N Kranitis, A Paschalis, D Gizopoulos, Y Zorian Journal of Electronic Testing 19 (2), 103-112, 2003 | 83 | 2003 |
| Instruction-based self-testing of processor cores N Kranitis, D Gizopoulos, A Paschalis, Y Zorian Proceedings 20th IEEE VLSI Test Symposium (VTS 2002), 223-228, 2002 | 83 | 2002 |
| A concurrent built-in self-test architecture based on a self-testing RAM I Voyiatzis, A Paschalis, D Gizopoulos, N Kranitis, C Halatsis IEEE Transactions on Reliability 54 (1), 69-78, 2005 | 79 | 2005 |
| Deterministic software-based self-testing of embedded processor cores A Paschalis, D Gizopoulos, N Kranitis, M Psarakis, Y Zorian Proceedings Design, Automation and Test in Europe. Conference and Exhibition …, 2001 | 77 | 2001 |
| Effective software self-test methodology for processor cores N Kranitis, A Paschalis, D Gizopoulos, Y Zorian Proceedings 2002 Design, Automation and Test in Europe Conference and …, 2002 | 72 | 2002 |
| Application and analysis of rt-level software-based self-testing for embedded processor cores N Kranitis, G Xenoulis, A Paschalis, D Gizopoulos, Y Zorian International Test Conference, 2003. Proceedings. ITC 2003., 431-431, 2003 | 54 | 2003 |
| Low-cost software-based self-testing of RISC processor cores N Kranitis, G Xenoulis, D Gizopoulos, A Paschalis, Y Zorian IEE Proceedings-Computers and Digital Techniques 150 (5), 355-360, 2003 | 53 | 2003 |
| A 3.3 Gbps CCSDS 123.0-B-1 multispectral & hyperspectral image compression hardware accelerator on a space-grade SRAM FPGA A Tsigkanos, N Kranitis, G Theodorou, A Paschalis IEEE Transactions on Emerging Topics in Computing 9 (1), 90-103, 2018 | 48 | 2018 |
| Design status of ASPIICS, an externally occulted coronagraph for PROBA-3 E Renotte, A Alia, A Bemporad, J Bernier, C Bramanti, S Buckley, ... Solar Physics and Space Weather Instrumentation VI 9604, 71-85, 2015 | 46 | 2015 |
| Optimal periodic testing of intermittent faults in embedded pipelined processor applications N Kranitis, A Merentitis, N Laoutaris, G Theodorou, A Paschalis, ... Proceedings of the Design Automation & Test in Europe Conference 1, 1-6, 2006 | 44 | 2006 |
| A low-cost SEU fault emulation platform for SRAM-based FPGAs P Kenterlis, N Kranitis, A Paschalis, D Gizopoulos, M Psarakis 12th IEEE International On-Line Testing Symposium (IOLTS'06), 7 pp., 2006 | 38 | 2006 |
| Development of ASPIICS: a coronagraph based on Proba-3 formation flying mission D Galano, A Bemporad, S Buckley, I Cernica, V Dániel, F Denis, L de Vos, ... Space Telescopes and Instrumentation 2018: Optical, Infrared, and Millimeter …, 2018 | 37 | 2018 |
| Software-based self-test for small caches in microprocessors G Theodorou, N Kranitis, A Paschalis, D Gizopoulos IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2014 | 36 | 2014 |
| An effective BIST architecture for fast multiplier cores A Paschalis, D Gizopoulos, N Kranitis, M Psarakis, Y Zorian Proceedings of the conference on Design, automation and test in Europe, 28-es, 1999 | 34 | 1999 |
| ASPIICS: an externally occulted coronagraph for PROBA-3: design evolution E Renotte, EC Baston, A Bemporad, G Capobianco, I Cernica, ... Space Telescopes and Instrumentation 2014: Optical, Infrared, and Millimeter …, 2014 | 32 | 2014 |
| An efficient LDPC encoder architecture for space applications D Theodoropoulos, N Kranitis, A Paschalis 2016 IEEE 22nd international symposium on on-line testing and robust system …, 2016 | 31 | 2016 |
