| On-line surface inspection using cylindrical lens–based spectral domain low-coherence interferometry D Tang, F Gao, X Jiang Applied optics 53 (24), 5510-5516, 2014 | 29 | 2014 |
| Application of clustering filter for noise and outlier suppression in optical measurement of structured surfaces S Lou, D Tang, W Zeng, T Zhang, F Gao, H Muhamedsalih, X Jiang, ... IEEE Transactions on Instrumentation and Measurement 69 (9), 6509-6517, 2020 | 19 | 2020 |
| Fringe projection profilometry method with high efficiency, precision, and convenience: theoretical analysis and development S Lv, D Tang, X Zhang, D Yang, W Deng, Q Kemao Optics Express 30 (19), 33515-33537, 2022 | 18 | 2022 |
| A Robust Moving Total Least-Squares Fitting Method for Measurement Data T Gu, Y Tu, D Tang, T Luo IEEE Transactions on Instrumentation and Measurement 69 (10), 7566-7573, 2020 | 15 | 2020 |
| Robust incident angle calibration of angle-resolved ellipsometry for thin film measurement L Peng, D Tang, J Wang, R Chen, F Gao, L Zhou Applied Optics 60 (13), 3971-3976, 2021 | 13 | 2021 |
| High-accuracy simultaneous measurement of surface profile and film thickness using line-field white-light dispersive interferometer T Guo, G Zhao, D Tang, C Sun, F Gao, X Jiang Optics and Lasers in Engineering 137, 106388, 2021 | 13 | 2021 |
| A trimmed moving total least-squares method for curve and surface fitting T Gu, Y Tu, D Tang, S Lin, B Fang Measurement Science and Technology 31 (4), 045003, 2020 | 13 | 2020 |
| Curve and surface reconstruction based on MTLS algorithm combined with k-means clustering T Gu, H Lin, D Tang, S Lin, T Luo Measurement 182, 109737, 2021 | 11 | 2021 |
| Investigation of line-scan dispersive interferometry for in-line surface metrology D Tang University of Huddersfield, 2016 | 8 | 2016 |
| Simultaneous film thickness and refractive index measurement using a constrained fitting method in a white light spectral interferometer L Yuan, T Guo, D Tang, H Liu, X Guo Optics Express 30 (1), 349-363, 2022 | 6 | 2022 |
| In-situ defect detection systems for R2R flexible PV barrier films F Gao, H Muhamedsalih, D Tang, M Elrawemi, L Blunt, X Jiang, S Edge, ... 2015 International Conference on Optical Instruments and Technology …, 2015 | 5 | 2015 |
| Polarized angle-resolved spectral reflectometry for real-time ultra-thin film measurement J Wang, L Peng, F Zhai, D Tang, F Gao, X Zhang, R Chen, L Zhou, ... Optics Express 31 (4), 6552-6565, 2023 | 4 | 2023 |
| An ultra-compact metasurface-based chromatic confocal sensor JHT Chan, D Tang, J Williamson, H Martin, AJ Henning, X Jiang CIRP Annals 72 (1), 465-468, 2023 | 4 | 2023 |
| Analysis of the synchronous phase-shifting method in a white-light spectral interferometer T Guo, L Yuan, D Tang, Z Chen, F Gao, X Jiang Applied optics 59 (10), 2983-2991, 2020 | 4 | 2020 |
| Phase retrieval algorithm for line-scan dispersive interferometry D Tang, P Kumar, F Gao, X Jiang Sixth International Conference on Optical and Photonic Engineering (icOPEN …, 2018 | 4 | 2018 |
| Defocus Effect Correction for Back Focal Plane Ellipsometry for Antivibration Measurement of Thin Films J Wang, J Yang, L Peng, D Tang, F Gao, R Chen, L Zhou Applied Sciences 13 (3), 1738, 2023 | 3 | 2023 |
| Accuracy improvement of a white-light spectral interferometer using a line-by-line spectral calibration method T Guo, G Zhao, D Tang, Q Weng, F Gao, X Jiang Surface Topography: Metrology and Properties 8 (2), 025028, 2020 | 3 | 2020 |
| In-Situ Surface Inspection Using White Light Channelled Spectrum Interferometer X Jiang, D Tang, F Gao 15th International Conference on Metrology and Properties of Engineering …, 2015 | 3 | 2015 |
| Improved description of the signal formation in grating generated-optical coherence tomography D Tang, AJ Henning, F Gao, AP Gribble, X Jiang Optics express 27 (23), 33999-34010, 2019 | 2 | 2019 |
| Design of hybrid refractive/diffractive dual-FOV infrared optical system T Dawei, S Qiang, W Jian Acta Photonica Sinica 39 (11), 2062-2068, 2012 | 2 | 2012 |
Xiangqian (Jane) JiangProfessor of Precision Engineering, University of HuddersfieldVerified email at hud.ac.uk
