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David Plouff
Graduate student,
University of Delaware
Verified email at udel.edu
Altermagnetism
Thin-film X-ray diffraction
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Thermal Expansion and Residual Strain in AlN Thin Film Sensor Materials
R Lad, M Greenslit, D Plouff, M Pereira da Cunha
Bulletin of the American Physical Society 65
, 2020
2020
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