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Versailles project on advanced materials and standards
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Title
Cited by
Cited by
Year
Towards reliable charge-mobility benchmark measurements for organic semiconductors
JSK James C Blakesley, Fernando A Castro, William Kylberg, George FA Dibb ...
Organic Electronics 15 (6), 1263-1272, 2014
3132014
Multilaboratory tribotesting: Results from the Versailles Advanced Materials and Standards programme on wear test methods
H Czichos, S Becker, J Lexow
Wear 114 (1), 109-130, 1987
1921987
XPS reference procedure for the accurate intensity calibration of electron spectrometers—results of a BCR intercomparison co‐sponsored by the VAMAS SCA TWA
MP Seah
Surface and interface analysis 20 (3), 243-266, 1993
1801993
Argon cluster ion beams for organic depth profiling: results from a VAMAS interlaboratory study
AG Shard, R Havelund, MP Seah, SJ Spencer, IS Gilmore, N Winograd, ...
Analytical chemistry 84 (18), 7865-7873, 2012
1602012
Comparison of test configurations for determination of mode II interlaminar fracture toughness results from international collaborative test programme
P Davies, GD Sims, BRK Blackman, AJ Brunner, K Kageyama, M Hojo, ...
Plastics, rubber and composites 28 (9), 432-437, 1999
1411999
International multilaboratory sliding wear tests with ceramics and steel
H Czichos, S Becker, J Lexow
Wear 135 (1), 171-191, 1989
941989
Fracture toughness by the surface crack in flexure (SCF) method: results of the VAMAS round robin
GD Quinn, RJ Gettings, JJ Kübler
Proceedings of the 18th Annual Conference on Composites and Advanced Ceramic …, 1994
931994
Measuring compositions in organic depth profiling: results from a VAMAS interlaboratory study
AG Shard, R Havelund, SJ Spencer, IS Gilmore, MR Alexander, ...
The Journal of Physical Chemistry B 119 (33), 10784-10797, 2015
712015
Sample Cooling or Rotation Improves C60 Organic Depth Profiles of Multilayered Reference Samples: Results from a VAMAS Interlaboratory Study
P Sjovall, D Rading, S Ray, L Yang, AG Shard
The Journal of Physical Chemistry B 114 (2), 769-774, 2010
702010
VAMAS surface chemical analysis standard data transfer format with skeleton decoding programs
WA Dench, LB Hazell, MP Seah
Surface and interface analysis 13 (2‐3), 63-122, 1988
661988
Role of residual stress in engineering applications
GA Webster
Materials science forum 347, 1-11, 2000
612000
VAMAS interlaboratory study for desorption electrospray ionization mass spectrometry (DESI MS) intensity repeatability and constancy
E Gurdak, FM Green, PD Rakowska, MP Seah, TL Salter, IS Gilmore
Analytical chemistry 86 (19), 9603-9611, 2014
502014
Analysis of neutron diffraction strain measurement data from a round robin sample
MR Daymond, MW Johnson, DS Sivia
The Journal of Strain Analysis for Engineering Design 37 (1), 73-85, 2002
432002
Size characterization of airborne SiO2 nanoparticles with on-line and off-line measurement techniques: an interlaboratory comparison study
C Motzkus, T Macé, F Gaie-Levrel, S Ducourtieux, A Delvallee, ...
Journal of nanoparticle research 15 (10), 1-36, 2013
412013
Size and shape distributions of carbon black aggregates by transmission electron microscopy
EA Grulke, SB Rice, JC Xiong, K Yamamoto, TH Yoon, K Thomson, ...
Carbon 130, 822-833, 2018
372018
VAMAS interlaboratory study on organic depth profiling
AG Shard, S Ray, MP Seah, L Yang
Surface and interface analysis 43 (9), 1240-1250, 2011
372011
Versailles project on advanced materials and standards interlaboratory study on measuring the thickness and chemistry of nanoparticle coatings using XPS and LEIS
NA Belsey, DJH Cant, C Minelli, JR Araujo, B Bock, P Brüner, ...
The Journal of Physical Chemistry C 120 (42), 24070-24079, 2016
352016
The fracture toughness round robins in VAMAS: what we have learned
GD Quinn
ASTM SPECIAL TECHNICAL PUBLICATION 1409, 107-128, 2002
312002
The development of standards for surface analysis
CJ Powell
Surface and Interface Analysis 11 (1‐2), 103-109, 1988
291988
VAMAS interlaboratory fracture toughness test at liquid helium temperature
T Ogata, K Nagai, K Ishikawa, K Shibata, E Fukushima
Advances in Cryogenic Engineering: Materials. 36, 1053-1060, 1989
281989
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