A 40nm RRAM compute-in-memory macro with parallelism-preserving ECC for iso-accuracy voltage scaling W Li, J Read, H Jiang, S Yu ESSCIRC 2022-IEEE 48th European Solid State Circuits Conference (ESSCIRC …, 2022 | 5 | 2022 |
MAC-ECC: In-situ error correction and its design methodology for reliable NVM-based compute-in-memory inference engine W Li, J Read, H Jiang, S Yu IEEE Journal on Emerging and Selected Topics in Circuits and Systems 12 (4 …, 2022 | 4 | 2022 |
Pulse-Based Capacitive Memory Window with High Non-Destructive Read Endurance in Fully BEOL Compatible Ferroelectric Capacitors S Mukherjee, J Bizindavyi, YC Luo, S Clima, J Read, MI Popovici, Y Xiang, ... 2023 International Electron Devices Meeting (IEDM), 1-4, 2023 | 2 | 2023 |
H3DAtten: Heterogeneous 3-D Integrated Hybrid Analog and Digital Compute-in-Memory Accelerator for Vision Transformer Self-Attention W Li, M Manley, J Read, A Kaul, MS Bakir, S Yu IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2023 | 2 | 2023 |
Total ionizing dose effect in tri-gate silicon ferroelectric transistor memory KA Aabrar, J Read, SG Kirtania, S Stepanoff, DE Wolfe, S Yu, S Datta 2022 International Electron Devices Meeting (IEDM), 32.7. 1-32.7. 4, 2022 | 2 | 2022 |
Enabling Long-Term Robustness in RRAM-based Compute-In-Memory Edge Devices J Read, W Li, S Yu 2023 IEEE International Symposium on Circuits and Systems (ISCAS), 1-5, 2023 | 1 | 2023 |
A method for reverse engineering neural network parameters from compute-in-memory accelerators J Read, W Li, S Yu 2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 302-307, 2022 | 1 | 2022 |
A Cross-layer Framework for Design Space and Variation Analysis of Non-Volatile Ferroelectric Capacitor-Based Compute-in-Memory Accelerators YC Luo, J Read, A Lu, S Yu 2024 29th Asia and South Pacific Design Automation Conference (ASP-DAC), 159-164, 2024 | | 2024 |
In-Situ Encrypted NAND FeFET Array for Secure Storage and Compute-in-Memory Z Zhao, Y Xu, J Read, PK Hsu, Y Qin, TJ Huang, S Lim, K Kim, K Kim, ... 2023 International Electron Devices Meeting (IEDM), 1-4, 2023 | | 2023 |