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James Read
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A 40nm RRAM compute-in-memory macro with parallelism-preserving ECC for iso-accuracy voltage scaling
W Li, J Read, H Jiang, S Yu
ESSCIRC 2022-IEEE 48th European Solid State Circuits Conference (ESSCIRC …, 2022
52022
MAC-ECC: In-situ error correction and its design methodology for reliable NVM-based compute-in-memory inference engine
W Li, J Read, H Jiang, S Yu
IEEE Journal on Emerging and Selected Topics in Circuits and Systems 12 (4 …, 2022
42022
Pulse-Based Capacitive Memory Window with High Non-Destructive Read Endurance in Fully BEOL Compatible Ferroelectric Capacitors
S Mukherjee, J Bizindavyi, YC Luo, S Clima, J Read, MI Popovici, Y Xiang, ...
2023 International Electron Devices Meeting (IEDM), 1-4, 2023
22023
H3DAtten: Heterogeneous 3-D Integrated Hybrid Analog and Digital Compute-in-Memory Accelerator for Vision Transformer Self-Attention
W Li, M Manley, J Read, A Kaul, MS Bakir, S Yu
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2023
22023
Total ionizing dose effect in tri-gate silicon ferroelectric transistor memory
KA Aabrar, J Read, SG Kirtania, S Stepanoff, DE Wolfe, S Yu, S Datta
2022 International Electron Devices Meeting (IEDM), 32.7. 1-32.7. 4, 2022
22022
Enabling Long-Term Robustness in RRAM-based Compute-In-Memory Edge Devices
J Read, W Li, S Yu
2023 IEEE International Symposium on Circuits and Systems (ISCAS), 1-5, 2023
12023
A method for reverse engineering neural network parameters from compute-in-memory accelerators
J Read, W Li, S Yu
2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 302-307, 2022
12022
A Cross-layer Framework for Design Space and Variation Analysis of Non-Volatile Ferroelectric Capacitor-Based Compute-in-Memory Accelerators
YC Luo, J Read, A Lu, S Yu
2024 29th Asia and South Pacific Design Automation Conference (ASP-DAC), 159-164, 2024
2024
In-Situ Encrypted NAND FeFET Array for Secure Storage and Compute-in-Memory
Z Zhao, Y Xu, J Read, PK Hsu, Y Qin, TJ Huang, S Lim, K Kim, K Kim, ...
2023 International Electron Devices Meeting (IEDM), 1-4, 2023
2023
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