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Juan Manuel Trujillo Sevilla
Juan Manuel Trujillo Sevilla
Verified email at ull.es
Title
Cited by
Cited by
Year
Piston alignment of segmented optical mirrors via convolutional neural networks
D Guerra-Ramos, L Díaz-García, J Trujillo-Sevilla, JM Rodríguez-Ramos
Optics letters 43 (17), 4264-4267, 2018
372018
The optics of the human eye at 8.6 µm resolution
S Bonaque-González, JM Trujillo-Sevilla, M Velasco-Ocaña, ...
Scientific Reports 11 (1), 23334, 2021
212021
Concepts, laboratory, and telescope test results of the plenoptic camera as a wavefront sensor
LF Rodríguez-Ramos, I Montilla, JJ Fernández-Valdivia, JL Trujillo-Sevilla, ...
Adaptive Optics Systems III 8447, 1415-1422, 2012
162012
3D imaging and wavefront sensing with a plenoptic objective
JM Rodríguez-Ramos, JP Lüke, R López, JG Marichal-Hernández, ...
Three-Dimensional Imaging, Visualization, and Display 2011 8043, 223-233, 2011
162011
Influence of angle Kappa on the optimal intraocular orientation of asymmetric multifocal intraocular lenses
S Bonaque-González, MT Jaskulski, D Carmona-Ballester, A Pareja-Ríos, ...
Journal of optometry 14 (1), 78-85, 2021
152021
Towards piston fine tuning of segmented mirrors through reinforcement learning
D Guerra-Ramos, J Trujillo-Sevilla, JM Rodríguez-Ramos
applied sciences 10 (9), 3207, 2020
122020
Wavefront phase measurement of striae in optical glass
JM Trujillo-Sevilla, M Velasco-Ocana, S Bonaque-Gonzalez, ...
Applied Optics 61 (14), 3912-3918, 2022
112022
High-resolution wave front phase sensor for silicon wafer metrology
JM Trujillo-Sevilla, OC Gonzalez, S Bonaque-González, J Gaudestad, ...
Photonic Instrumentation Engineering VI 10925, 108-117, 2019
112019
Atmospherical wavefront phases using the plenoptic sensor (real data)
LF Rodríguez-Ramos, I Montilla, JP Lüke, R López, ...
Three-Dimensional Imaging, Visualization, and Display 2012 8384, 70-78, 2012
112012
High resolution imaging and wavefront aberration correction in plenoptic systems
JM Trujillo-Sevilla, LF Rodríguez-Ramos, I Montilla, JM Rodríguez-Ramos
Optics letters 39 (17), 5030-5033, 2014
92014
Global piston restoration of segmented mirrors with recurrent neural networks
D Guerra-Ramos, J Trujillo-Sevilla, JM Rodríguez-Ramos
OSA Continuum 3 (5), 1355-1363, 2020
82020
New developments at CAFADIS plenoptic camera
JM Rodríguez-Ramos, JG Marichal-Hernández, JP Lüke, J Trujillo-Sevilla, ...
2011 10th Euro-American Workshop on Information Optics, 1-3, 2011
82011
New high repeatability wafer geometry measurement technique for full 200mm and 300mm blank wafers
JM Trujillo-Sevilla, Á Pérez-García, Ó Casanova-González, ...
Photonic Instrumentation Engineering IX 12008, 85-92, 2022
62022
Reconstructing wavefront phase from measurements of its slope, an adaptive neural network based approach
S Ceruso, S Bonaque-Gonzalez, A Pareja-Rios, D Carmona-Ballester, ...
Optics and Lasers in Engineering 126, 105906, 2020
62020
Method for determining the complex amplitude of the electromagnetic field associated with a scene
JMR Ramos, JP Lüke, JMT SEVILLA, JJF VALDIVIA
US Patent 10,230,940, 2019
62019
Circularly symmetric nanopores in 3D femtosecond laser nanolithography with burst control and the role of energy dose
F Paz-Buclatin, M Esquivel-González, A Casasnovas-Melián, ...
Nanophotonics 12 (8), 1511-1525, 2023
52023
Wave front phase imaging for silicon wafer metrology
JM Trujillo-Sevilla, A Roqué-Velasco, MJ Sicilia, Ó Casanova-González, ...
Novel Optical Systems, Methods, and Applications XXV 12216, 18-26, 2022
52022
New metrology technique for measuring wafer geometry on a full 300mm silicon wafer
JM Trujillo-Sevilla, Ó Casanova-González, M Velasco-Ocaña, S Ceruso, ...
International Conference on Extreme Ultraviolet Lithography 2021 11854, 139-146, 2021
52021
New wafer shape measurement technique for 300mm blank vertically held silicon wafer
JM Trujillo-Sevilla, Ó Casanova-González, A Roqué-Velasco, JG Pardo, ...
Photonic Instrumentation Engineering X 12428, 219-225, 2023
42023
Wave front phase imaging of wafer geometry using high pass filtering to reveal nanotopography
JM Trujillo-Sevilla, JM Ramos-Rodríguez, J Gaudestad
Photonic Instrumentation Engineering VII 11287, 190-200, 2020
42020
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