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Preeth Sivakumar
Preeth Sivakumar
Verified email at binghamton.edu
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Cited by
Year
Improved adhesion of polyurethane-based nanocomposite coatings to tin surface through silane coupling agents
P Sivakumar, SM Du, M Selter, J Daye, J Cho
International Journal of Adhesion and Adhesives 110, 102948, 2021
202021
Regulation of the deposition morphology of inkjet-printed crystalline materials via polydopamine functional coatings for highly uniform and electrically conductive patterns
L Liu, S Ma, Y Pei, X Xiong, P Sivakumar, TJ Singler
ACS Applied Materials & Interfaces 8 (33), 21750-21761, 2016
162016
Effects of bismuth and nickel on the microstructure evolution of Sn-Ag-Cu (SAC)-based solders
P Sivakumar, K O’Donnell, J Cho
Materials Today Communications 26, 101787, 2021
142021
Long-term thermal aging of parylene conformal coating under high humidity and its effects on tin whisker mitigation
P Sivakumar, SM Du, M Selter, I Ballard, J Daye, J Cho
Polymer Degradation and Stability 191, 109667, 2021
42021
Supplementary Laboratory Investigations of Modern Plastic-Polymer Fishplates for Rail Joints
A Németh, I Fekete, S Szalai, S Fischer
Nauka ta Progres Transportu 84 (6), 86-102, 2019
12019
Polyurethane-Based Nanocomposite Coatings for Mitigation the Growth of Tin Whiskers
P Sivakumar
State University of New York at Binghamton, 2021
2021
Fire Damage and Repair Techniques for Flash Memory Modules: Implication for Post-Crash Investigations
P Sivakumar, JP Lombardi, SR Cain, M Poliks, J Cash, J Gregor, ...
International Symposium on Microelectronics 2016 (1), 000648-000652, 2016
2016
Effects of x-ray exposure on NOR and NAND flash memories during high-resolution 2D and 3D x-ray inspection
A Sharma, P Sivakumar, A Feigel, IT Bae, LP Lehman, J Gregor, J Cash, ...
International Symposium on Microelectronics 2016 (1), 000660-000665, 2016
2016
Effect of a barrier layer on the liquid state duration of Gold-Tin solder
P Sivakumar
State University of New York at Binghamton, 2016
2016
Transient liquid phase bonding technology of Bi-Ni system for high-temperature packaging applications
H Fallahdoost, P Sivakumar, J Cho
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Articles 1–10