Experimental optimization of power-function-shaped drive pulse for stick-slip piezo actuators J Neuman, Z Nováček, M Pavera, J Zlámal, R Kalousek, J Spousta, ... Precision Engineering 42, 187-194, 2015 | 34 | 2015 |
CdS quantum dots-based immunoassay combined with particle imprinted polymer technology and laser ablation ICP-MS as a versatile tool for protein detection T Vaneckova, J Bezdekova, M Tvrdonova, M Vlcnovska, V Novotna, ... Scientific Reports 9 (1), 11840, 2019 | 18 | 2019 |
AFM-in-SEM as a tool for comprehensive sample surface analysis V Novotna, J Horak, M Konecny, V Hegrova, O Novotny, Z Novacek, ... Microscopy Today 28 (3), 38-46, 2020 | 13 | 2020 |
Correction of AFM data artifacts using a convolutional neural network trained with synthetically generated data V Kocur, V Hegrová, M Patočka, J Neuman, A Herout Ultramicroscopy 246, 113666, 2023 | 6 | 2023 |
Correlative Probe and Electron Microscopy CPEM™–The Novel Technology for 3D Material Surface Analysis J Neuman, Z Novacek, M Pavera, V Novotna Microscopy and Microanalysis 25 (S2), 430-431, 2019 | 6 | 2019 |
Correlative atomic force microscopy and scanning electron microscopy of bacteria-diamond-metal nanocomposites D Rutherford, K Kolářová, J Čech, P Haušild, J Kuliček, E Ukraintsev, ... Ultramicroscopy 258, 113909, 2024 | 3 | 2024 |
Long-term performance of magnetic force microscopy tips grown by focused electron beam induced deposition AT Escalante-Quiceno, O Novotný, J Neuman, C Magén, JM De Teresa Sensors 23 (6), 2879, 2023 | 3 | 2023 |
Fate of Gold Nanoparticles in Laser Desorption/Ionization Mass Spectrometry: Toward the Imaging of Individual Nanoparticles V Prysiazhnyi, A Bednarik, M Žalud, V Hegrová, J Neuman, J Preisler Journal of the American Society for Mass Spectrometry 34 (4), 570-578, 2023 | 2 | 2023 |
In-situ Correlative AFM-SEM Characterization for Failure Analysis J Neuman, R Dao, O Novotný, V Schánilec, V Hegrová, L Strakoš, ... ISTFA 2023, l1-l59, 2023 | | 2023 |
Innovative In-situ Workflow for Battery Sample Analysis using AFM-in-SEM V Hegrová, R Dao, A Kondrakov, U Heinemeyer, L Novák, P Zakopal, ... Microscopy and Microanalysis 29 (Supplement_1), 1320-1321, 2023 | | 2023 |
Correlative Multimodal Microscopy Using AFM-in-SEM in Material Science V Hegrova, R Dao, J Neuman Microscopy and Microanalysis 28 (S1), 2120-2121, 2022 | | 2022 |
The novel approach to correlative microscopy using AFM-in-SEM and CPEM technology V Hegrova, J Horak, Z Novacek, M Pavera, J Neuman Microscopy and Microanalysis 27 (S1), 2026-2027, 2021 | | 2021 |
Multidimensional Sample Surface Analysis by AFM-in-SEM V Novotna, V Hegrova, J Horak, Z Novacek, M Pavera, J Neuman Microscopy and Microanalysis 26 (S2), 1798-1799, 2020 | | 2020 |
The AFM-in-SEM Technique: True correlative sample analysis with the LiteScope. P Komarov, R Dao, V Schánilec, V Hegrová, O Novotny, M Pavera, ... | | |