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Jan Neuman
Jan Neuman
NenoVision s.r.o.
Verified email at brukeroptics.cz - Homepage
Title
Cited by
Cited by
Year
Experimental optimization of power-function-shaped drive pulse for stick-slip piezo actuators
J Neuman, Z Nováček, M Pavera, J Zlámal, R Kalousek, J Spousta, ...
Precision Engineering 42, 187-194, 2015
342015
CdS quantum dots-based immunoassay combined with particle imprinted polymer technology and laser ablation ICP-MS as a versatile tool for protein detection
T Vaneckova, J Bezdekova, M Tvrdonova, M Vlcnovska, V Novotna, ...
Scientific Reports 9 (1), 11840, 2019
182019
AFM-in-SEM as a tool for comprehensive sample surface analysis
V Novotna, J Horak, M Konecny, V Hegrova, O Novotny, Z Novacek, ...
Microscopy Today 28 (3), 38-46, 2020
132020
Correction of AFM data artifacts using a convolutional neural network trained with synthetically generated data
V Kocur, V Hegrová, M Patočka, J Neuman, A Herout
Ultramicroscopy 246, 113666, 2023
62023
Correlative Probe and Electron Microscopy CPEM™–The Novel Technology for 3D Material Surface Analysis
J Neuman, Z Novacek, M Pavera, V Novotna
Microscopy and Microanalysis 25 (S2), 430-431, 2019
62019
Correlative atomic force microscopy and scanning electron microscopy of bacteria-diamond-metal nanocomposites
D Rutherford, K Kolářová, J Čech, P Haušild, J Kuliček, E Ukraintsev, ...
Ultramicroscopy 258, 113909, 2024
32024
Long-term performance of magnetic force microscopy tips grown by focused electron beam induced deposition
AT Escalante-Quiceno, O Novotný, J Neuman, C Magén, JM De Teresa
Sensors 23 (6), 2879, 2023
32023
Fate of Gold Nanoparticles in Laser Desorption/Ionization Mass Spectrometry: Toward the Imaging of Individual Nanoparticles
V Prysiazhnyi, A Bednarik, M Žalud, V Hegrová, J Neuman, J Preisler
Journal of the American Society for Mass Spectrometry 34 (4), 570-578, 2023
22023
In-situ Correlative AFM-SEM Characterization for Failure Analysis
J Neuman, R Dao, O Novotný, V Schánilec, V Hegrová, L Strakoš, ...
ISTFA 2023, l1-l59, 2023
2023
Innovative In-situ Workflow for Battery Sample Analysis using AFM-in-SEM
V Hegrová, R Dao, A Kondrakov, U Heinemeyer, L Novák, P Zakopal, ...
Microscopy and Microanalysis 29 (Supplement_1), 1320-1321, 2023
2023
Correlative Multimodal Microscopy Using AFM-in-SEM in Material Science
V Hegrova, R Dao, J Neuman
Microscopy and Microanalysis 28 (S1), 2120-2121, 2022
2022
The novel approach to correlative microscopy using AFM-in-SEM and CPEM technology
V Hegrova, J Horak, Z Novacek, M Pavera, J Neuman
Microscopy and Microanalysis 27 (S1), 2026-2027, 2021
2021
Multidimensional Sample Surface Analysis by AFM-in-SEM
V Novotna, V Hegrova, J Horak, Z Novacek, M Pavera, J Neuman
Microscopy and Microanalysis 26 (S2), 1798-1799, 2020
2020
The AFM-in-SEM Technique: True correlative sample analysis with the LiteScope.
P Komarov, R Dao, V Schánilec, V Hegrová, O Novotny, M Pavera, ...
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