| A 128× 128 CMOS biosensor array for extracellular recording of neural activity B Eversmann, M Jenkner, F Hofmann, C Paulus, R Brederlow, B Holzapfl, ... IEEE Journal of Solid-State Circuits 38 (12), 2306-2317, 2003 | 650 | 2003 |
| A low-power true random number generator using random telegraph noise of single oxide-traps R Brederlow, R Prakash, C Paulus, R Thewes 2006 IEEE International Solid State Circuits Conference-Digest of Technical …, 2006 | 159 | 2006 |
| Device and technology evolution for Si-based RF integrated circuits HS Bennett, R Brederlow, JC Costa, PE Cottrell, WM Huang, ... IEEE Transactions on Electron Devices 52 (7), 1235-1258, 2005 | 146 | 2005 |
| An ultra low power bandgap operational at supply from 0.75 V V Ivanov, R Brederlow, J Gerber IEEE Journal of Solid-State Circuits 47 (7), 1515-1523, 2012 | 141 | 2012 |
| A mixed-signal design roadmap R Brederlow, W Weber, J Sauerer, S Donnay, P Wambacq, M Vertregt IEEE Design & Test of Computers 18 (6), 34-46, 2001 | 131 | 2001 |
| Measuring cell and measuring field comprising measuring cells of this type, use of a measuring and use of a measuring field R Brederlow, BO Eversmann, I Koren, C Paulus, R Thewes US Patent 7,084,641, 2006 | 128 | 2006 |
| Efficiency of body biasing in 90-nm CMOS for low-power digital circuits K Von Arnim, E Borinski, P Seegebrecht, H Fiedler, R Brederlow, ... IEEE Journal of Solid-State Circuits 40 (7), 1549-1556, 2005 | 99 | 2005 |
| Modeling of statistical low-frequency noise of deep-submicrometer MOSFETs GI Wirth, J Koh, R Da Silva, R Thewes, R Brederlow IEEE Transactions on Electron Devices 52 (7), 1576-1588, 2005 | 95 | 2005 |
| Fluorescence biosensor chip and fluorescence biosensor chip arrangement M Schienle, R Brederlow, F Hofmann, M Jenkner, J Luyken, C Paulus, ... US Patent App. 10/803,175, 2004 | 75 | 2004 |
| Impact of STI-induced stress, inverse narrow width effect, and statistical V/sub TH/variations on leakage currents in 120 nm CMOS C Pacha, B Martin, K Von Arnim, R Brederlow, D Schmitt-Landsiedel, ... Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat …, 2004 | 71 | 2004 |
| Fluctuations of the low frequency noise of MOS transistors and their modeling in analog and RF-circuits R Brederlow, W Weber, D Schmitt-Landsiedel, R Thewes International Electron Devices Meeting 1999. Technical Digest (Cat. No …, 1999 | 63 | 1999 |
| Low-frequency noise of integrated polysilicon resistors R Brederlow, W Weber, C Dahl, D Schmitt-Landsiedel, R Thewes IEEE Transactions on Electron Devices 48 (6), 1180-1187, 2001 | 62 | 2001 |
| Noise-reducing transistor arrangement R Brederlow, J Koh, C Pacha, R Thewes US Patent 7,733,157, 2010 | 54 | 2010 |
| Transistor arrangement, integrated circuit and method for operating field effect transistors R Brederlow, J Koh, R Thewes US Patent 7,733,156, 2010 | 54 | 2010 |
| Effects of inhomogeneous negative bias temperature stress on p-channel MOSFETs of analog and RF circuits C Schlünder, R Brederlow, B Ankele, W Gustin, K Goser, R Thewes Microelectronics Reliability 45 (1), 39-46, 2005 | 51 | 2005 |
| Architectural and circuit design techniques for power management of ultra-low-power MCU systems M Lueders, B Eversmann, J Gerber, K Huber, R Kuhn, M Zwerg, ... IEEE Transactions on Very Large Scale Integration (VLSI) Systems 22 (11 …, 2013 | 49 | 2013 |
| Device reliability in analog CMOS applications R Thewes, R Brederlow, C Schlunder, P Wieczorek, A Hesener, B Ankele, ... International Electron Devices Meeting 1999. Technical Digest (Cat. No …, 1999 | 48 | 1999 |
| A 24x16 CMOS-based chronocoulometric DNA microarray M Augustyniak, C Paulus, R Brederlow, N Persike, G Hartwich, ... 2006 IEEE International Solid State Circuits Conference-Digest of Technical …, 2006 | 46 | 2006 |
| Sensor having organic field effect transistors H Klauk, M Halik, U Zschieschang, G Schmid, G Darlinski, R Waser, ... US Patent App. 10/599,470, 2009 | 44 | 2009 |
| Hot-carrier degradation of the low-frequency noise in MOS transistors under analog and RF operating conditions R Brederlow, W Weber, D Schmitt-Landsiedel, R Thewes IEEE Transactions on Electron Devices 49 (9), 1588-1596, 2002 | 43 | 2002 |
