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I. Castro
I. Castro
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Title
Cited by
Cited by
Year
Use of electronic speckle pattern interferometry in the detection of fatigue failure in high strength steels
R Rodríguez-Martín, I Castro, I Ocaña, JM Martínez-Esnaola
Engineering Failure Analysis 17 (1), 226-235, 2010
162010
Damage Induced In Interconnect Structures Mimicking Stresses During Flip Chip Packaging
I Castro, I Ocaña, MR Elizalde, JM Martínez‐Esnaola, D Pantuso, ...
AIP Conference Proceedings 1300 (1), 238-244, 2010
2010
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Articles 1–2