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E Isern
E Isern
Departamento de Física, Universidad de las Islas Baleares
Verified email at uib.es
Title
Cited by
Cited by
Year
Test generation with high coverages for quiescent current test of bridging faults in combinational circuits
E Isern, J Figueras
Proceedings of IEEE International Test Conference-(ITC), 73-82, 1993
641993
I/sub DDQ/test and diagnosis of CMOS circuits
E Isern, J Figueras
IEEE Design & Test of Computers 12 (4), 60-67, 1995
481995
Floating gate CMOS dosimeter with frequency output
E Garcia-Moreno, E Isern, M Roca, R Picos, J Font, J Cesari, A Pineda
IEEE Transactions on Nuclear Science 59 (2), 373-378, 2012
472012
Oscillation-test technique for CMOS operational amplifiers by monitoring supply current
J Font, J Ginard, E Isern, M Roca, J Segura, E Garcia
Analog Integrated Circuits and Signal Processing 33, 213-224, 2002
402002
Temperature compensated floating gate MOS radiation sensor with current output
E Garcia-Moreno, E Isern, M Roca, R Picos, J Font, J Cesari, A Pineda
IEEE Transactions on Nuclear Science 60 (5), 4026-4030, 2013
342013
Verifying functional specifications by regression techniques on lissajous test signatures
L Balado, E Lupon, J Figueras, M Roca, E Isern, R Picos
IEEE Transactions on Circuits and Systems I: Regular Papers 56 (4), 754-762, 2008
292008
IDDQ testing: state of the art and future trends
A Ferré, E Isern, J Rius, R Rodrı́guez-Montañés, J Figueras
Integration 26 (1-2), 167-196, 1998
241998
Efficient parallel implementation of reservoir computing systems
ML Alomar, ES Skibinsky-Gitlin, CF Frasser, V Canals, E Isern, M Roca, ...
Neural Computing and Applications 32, 2299-2313, 2020
232020
A sub-ns integrated CMOS laser driver with configurable laser pulses for time-of-flight applications
G Blasco, D Dörich, H Reh, R Burkard, E Isern, E Martin
IEEE Sensors Journal 18 (16), 6547-6556, 2018
222018
Analysis of dissipation energy of switching digital CMOS gates with coupled outputs
F Moll, M Roca, E Isern
Microelectronics Journal 34 (9), 833-842, 2003
212003
Application of predictive oscillation-based test to a CMOS opamp
K Suenaga, E Isern, R Picos, S Bota, M Roca, E García-Moreno
IEEE Transactions on Instrumentation and Measurement 59 (8), 2076-2082, 2009
202009
Transient current testing based on current (charge) integration
I De Paul, R Picos, JL Rossello, M Roca, E Isern, J Segura, CF Hawkins
Proceedings 1998 IEEE International Workshop on IDDQ Testing (Cat. No …, 1998
181998
Analysis of I/sub DDQ/detectable bridges in combinational CMOS circuits
E Isern, J Figueras
Proceedings of IEEE VLSI Test Symposium, 368-373, 1994
181994
Radiation sensor compatible with standard CMOS technology
EG Moreno, R Picos, E Isern, M Roca, S Bota, K Suenaga
IEEE Transactions on Nuclear Science 56 (5), 2910-2915, 2009
172009
Experimental analysis of transient current testing based on charge observation
J Segura, I De Paul, M Roca, E Isern, CF Hawkins
Electronics Letters 35 (6), 441-443, 1999
171999
A BICS for CMOS opamps by monitoring the supply current peak
J Font, J Ginard, E Isern, M Roca, J Segura, E Garcia
Proceedings of the Eighth IEEE International On-Line Testing Workshop (IOLTW …, 2002
162002
Experimental results on BIC sensors for transient current testing
R Picos, M Roca, E Isern, J Segura, E García-Moreno
Journal of Electronic Testing 16, 235-241, 2000
152000
Design of a stable pulse generator system based on a Ring-VCO Phase-Locked Loop using 180nm CMOS technology
G Blasco, E Isern, E Martin
2015 Conference on Design of Circuits and Integrated Systems (DCIS), 1-6, 2015
142015
Predictive test strategy for CMOS RF mixers
E Garcia-Moreno, K Suenaga, R Picos, S Bota, M Roca, E Isern
Integration 42 (1), 95-102, 2009
132009
Reservoir computing hardware for time series forecasting
ES Skibinsky-Gitlin, ML Alomar, E Isern, M Roca, V Canals, JL Rossello
2018 28th international symposium on power and timing modeling, optimization …, 2018
102018
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