| Apparatus and method for automatically focusing an interference microscope DK Cohen, JD Ayres, ER Cochran US Patent 5,122,648, 1992 | 55 | 1992 |
| Combining multiple-subaperture and two-wavelength techniques to extend the measurement limits of an optical surface profiler ER Cochran, K Creath Applied optics 27 (10), 1960-1966, 1988 | 23 | 1988 |
| Apparatus and method for automatically focusing an interference microscope DK Cohen, JD Ayres, ER Cochran US Patent 4,931,630, 1990 | 19 | 1990 |
| Interferometric stress birefringence measurement ER Cochran, C Ai Applied optics 31 (31), 6702-6706, 1992 | 18 | 1992 |
| Longscan surface profile measurements using a phase-modulated Mirau interferometer ER Cochran, JC Wyant Surface Characterization and Testing 680, 112-117, 1987 | 11 | 1987 |
| Limitations of phase-measuring interferometry for surface characterization and testing: a review ER Cochran III Interferometry: Surface Characterization and Testing 1776, 151-157, 1992 | 8 | 1992 |
| A method for extending the measurement range of a two-dimensional surface profiling instrument ER Cochran, K Creath Current Developments in Optical Engineering II 818, 353-362, 1987 | 6 | 1987 |
| Development of an automatic focusing mechanism for an interference microscope DK Cohen, ER Cochran, JD Ayres Surface Characterization and Testing II 1164, 128-133, 1989 | 5 | 1989 |
| Methodology of an independent technology-transfer organization ER Cochran The Journal of Technology Transfer 18 (3), 53-58, 1993 | 2 | 1993 |
| In-Vitro Tests of a Rapid, Stable-Temperature Recharging System for Implantable Batteries L Radziemski, A Denison, F Dunn, S Bell, E Cochran | 1 | 2010 |
| Extending the measurement limits of an optical surface profiler: combining subaperture and two-wavelength techniques ER Cochran, K Creath Optical Fabrication and Testing, ThBB3, 1987 | 1 | 1987 |
| Creating value in early-stage, high-technology ventures ER Cochran III Opto-Canada: SPIE Regional Meeting on Optoelectronics, Photonics, and …, 2017 | | 2017 |
| Design and evaluation of laser sources with high-quality wave fronts ER Cochran Applied optics 30 (34), 5037-5048, 1991 | | 1991 |
| Interferometric radius of curvature measurement ER Cochran OSA Annual Meeting, ThMM60, 1991 | | 1991 |
| Testing methods for evaluating the quality of a general purpose collimated laser source ER Cochran OSA Annual Meeting, THF6, 1989 | | 1989 |
| Extending the measurement range of an optical surface profiler ER Cochran III The University of Arizona, 1988 | | 1988 |
Katherine CreathIndependent Consultant / OptineeringVerified email at ieee.org
Katherine CreathIndependent Consultant / OptineeringVerified email at ieee.org