| The CMS experiment at the CERN LHC S Chatrchyan, EA de Wolf, P Van Mechelen Journal of instrumentation.-Bristol, 2006, currens 3, S08004, 2008 | 3081 | 2008 |
| CMS physics technical design report, volume II: physics performance CMS collaboration Journal of Physics G: Nuclear and Particle Physics 34 (6), 995, 2007 | 1865* | 2007 |
| CMS physics: technical design report volume 1: detector performance and software GL Bayatian, A Korablev, A Soha, O Sharif, M Chertok, W Mitaroff, ... CMS-TDR-008-1, 2006 | 461* | 2006 |
| The CMS high level trigger CMS collaboration The European Physical Journal C-Particles and Fields 46 (3), 605-667, 2006 | 256 | 2006 |
| CMS physics technical design report: Addendum on high density QCD with heavy ions D d'Enterria, M Ballintijn, M Bedjidian, D Hofman, O Kodolova, C Loizides, ... Journal of Physics G: Nuclear and Particle Physics 34 (11), 2307, 2007 | 219 | 2007 |
| Low-energy BIST design: Impact of the LFSR TPG parameters on the weighted switching activity P Girard, L Guiller, C Landrault, S Pravossoudovitch, J Figueras, ... 1999 IEEE International Symposium on Circuits and Systems (ISCAS) 1, 110-113, 1999 | 103 | 1999 |
| Low power BIST by filtering non-detecting vectors S Manich, A Gabarro, M Lopez, J Figueras, P Girard, L Guiller, ... Journal of Electronic Testing 16, 193-202, 2000 | 97 | 2000 |
| Reconstruction of the signal amplitude of the CMS electromagnetic calorimeter P Adzic, R Alemany-Fernandez, CB Almeida, NM Almeida, G Anagnostou, ... The European Physical Journal C-Particles and Fields 46, 23-35, 2006 | 92 | 2006 |
| Results of the first performance tests* of the CMS electromagnetic calorimeter CMS Electromagnetic Calorimeter Group, P Adzic, R Alemany-Fernandez, ... The European Physical Journal C-Particles and Fields 44, 1-10, 2006 | 61 | 2006 |
| Adaptive error-prediction flip-flop for performance failure prediction with aging sensors CV Martins, J Semião, JC Vazquez, V Champac, M Santos, IC Teixeira, ... 29th VLSI Test Symposium, 203-208, 2011 | 45 | 2011 |
| Predictive error detection by on-line aging monitoring JC Vazquez, V Champac, AM Ziesemer, R Reis, J Semião, IC Teixeira, ... 2010 IEEE 16th International On-Line Testing Symposium, 9-14, 2010 | 45 | 2010 |
| Built-in aging monitoring for safety-critical applications JC Vazquez, V Champac, AM Ziesemer, R Reis, IC Teixeira, MB Santos, ... 2009 15th IEEE International On-Line Testing Symposium, 9-14, 2009 | 45 | 2009 |
| Low-sensitivity to process variations aging sensor for automotive safety-critical applications JC Vazquez, V Champac, AM Ziesemer, R Reis, IC Teixeira, MB Santos, ... 2010 28th VLSI Test Symposium (VTS), 238-243, 2010 | 43 | 2010 |
| RTL-based functional test generation for high defects coverage in digital SOCs MB Santos, FM Gonçalves, IC Teixeira, JP Teixeira Proceedings IEEE European Test Workshop, 99-104, 2000 | 42 | 2000 |
| A novel approach to FPGA-based hardware fault modeling and simulation A Parreira, JP Teixeira, M Santos Design and Diagnostics of Electronic Circuits and Syst. Workshop, 17-24, 2003 | 40 | 2003 |
| Level shifters and DCVSL for a low-voltage CMOS 4.2-V buck converter JF da Rocha, MB dos Santos, JMD Costa, FA Lima IEEE Transactions on Industrial Electronics 55 (9), 3315-3323, 2008 | 34 | 2008 |
| Programmable aging sensor for automotive safety-critical applications JC Vazquez, V Champac, IC Teixeira, MB Santos, JP Teixeira 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010 …, 2010 | 33 | 2010 |
| Signal integrity enhancement in digital circuits JFLC Semio, MJR Irago, JJ Rodriguez-Andina, LB Piccoli, FL Vargas, ... IEEE Design & Test of Computers 25 (5), 452-461, 2008 | 33 | 2008 |
| High voltage tolerant level shifters and DCVSL in standard low voltage CMOS technologies J Rocha, M Santos, JMD Costa, F Lima 2007 IEEE International Symposium on Industrial Electronics, 775-780, 2007 | 31 | 2007 |
| Defect-oriented mixed-level fault simulation of digital systems-on-a-chip using HDL MB Santos, JP Teixeira Proceedings of the conference on Design, automation and test in Europe, 111-es, 1999 | 31 | 1999 |
Paulo TeixeiraINESC-ID, IST, Univ. Lisboa, PortugalVerified email at ist.utl.pt
