| Evaluation of a COTS 65-nm SRAM Under 15 MeV Protons and 14 MeV Neutrons at Low VDD M Rezaei, P Martín-Holgado, Y Morilla, FJ Franco, JC Fabero, H Mecha, ... IEEE Transactions on Nuclear Science 67 (10), 2188-2195, 2020 | 13 | 2020 |
| Experimental and Analytical Study of the Responses of Nanoscale Devices to Neutrons Impinging at Various Incident Angles G Korkian, JC Fabero, G Hubert, M Rezaei, H Mecha, FJ Franco, ... IEEE Transactions on Nuclear Science 67 (11), 2345-2352, 2020 | 10 | 2020 |
| Masking wrong-successor Control Flow Errors employing data redundancy J Yousefi, Y Sedaghat, M Rezaei 2015 5th International Conference on Computer and Knowledge Engineering …, 2015 | 10 | 2015 |
| A confidence-based software voter for safety-critical systems M Rezaei, Y Sedaghat, M Khosravi Farmad IEEE 12th International Conference on Dependable, Autonomic and Secure …, 2014 | 10 | 2014 |
| Impact of dynamic voltage scaling on SEU sensitivity of COTS bulk SRAMs and A-LPSRAMs against proton radiation M Rezaei, G Hubert, P Martín-Holgado, Y Morilla, JC Fabero, H Mecha, ... IEEE Transactions on Nuclear Science 69 (2), 126-133, 2022 | 6 | 2022 |
| Impact of the Bitcell Topology on the Multiple-Cell Upsets Observed in VLSI Nanoscale SRAMs JA Clemente, G Hubert, M Rezaei, FJ Franco, H Mecha IEEE Transactions on Nuclear Science 68 (9), 2383-2391, 2021 | 6 | 2021 |
| Reliability of Error Correction Codes Against Multiple Events by Accumulation JA Clemente, M Rezaei, FJ Franco IEEE Transactions on Nuclear Science 69 (2), 169-180, 2022 | 4 | 2022 |
| Impact of DVS on Power Consumption and SEE Sensitivity of COTS Volatile SRAMs M Rezaei, FJ Franco, JC Fabero, H Mecha, H Puchner, JA Clemente 2021 IEEE 22nd Latin American Test Symposium (LATS), 1-6, 2021 | 2 | 2021 |
| A performance counter-based control flow checking technique for multi-core processors HA Ahmad, Y Sedaghat, M Rezaei 2017 7th International Conference on Computer and Knowledge Engineering …, 2017 | 2 | 2017 |
| Impact of the data retention threshold voltage on the cell-to-cell SEU sensitivity of COTS SRAMs M Rezaei, AA Panduro, FJ Franco, JC Fabero, H Mecha, M Letiche, ... 2021 21th European Conference on Radiation and Its Effects on Components and …, 2021 | 1 | 2021 |
| A Method to Neutralize the Impact of DVS on the Reliability of COTS SRAMs with ECC by Using Periodic Scrubbing M Rezaei, FJ Franco, G Hubert, JA Clemente IEEE Transactions on Nuclear Science, 2023 | | 2023 |
| Reliability of Error Correction Codes Against Multiple Events by Accumulation JA Clemente Barreira, M Rezaei, FJ Franco Peláez IEEE-Inst Electrical Electronics Engineers Inc, 2023 | | 2023 |
| Impact of High Particle Flux in Radiation Ground Tests with Protons M Rezaei, P Martín-Holgado, Y Morilla, FJ Franco, JC Fabero, H Mecha, ... 2020 20th European Conference on Radiation and Its Effects on Components and …, 2020 | | 2020 |
| طراحی روشی برای افزودن امکان تشخیص خطا در رأیگیرندههای نرمافزاری برای سیستمهای نهفته بحرانی-ایمن رضائی, محمّدرضا, صداقت دومین کنفرانس ملی اویونیک ایران, 2015 | | 2015 |
Juan Antonio ClementeUniversidad Complutense de MadridVerified email at fdi.ucm.es
